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31. 发明授权

US07345800B2 Optical arrangement for deflecting a light beam 有权
标题翻译：用于偏转光束的光学布置
公开(公告)号：US07345800B2
公开(公告)日：2008-03-18
申请号：US11347450
申请日：2006-02-03
申请人： Bernd Widzgowski
发明人： Bernd Widzgowski
IPC分类号： G02B26/08
CPC分类号： G02B21/0048 , G02B26/101
摘要： An optical arrangement for deflecting a light beam includes first and second deflection devices, and a coupling mirror. The first deflection device is rotatable about a first axis using a first rotary drive, and includes two mirrors disposed non-rotatably with respect to each other in an angular position so as to rotate jointly about the first axis. The second deflection device is rotatable about a second axis using a second rotary drive, and includes a third mirror. The coupling mirror deflects the light beam onto the first or second mirror at an angle greater than 45° relative to the surface of the mirror. The first and second axes are perpendicular to each other. The first and a second mirrors rotate jointly about the first axis so that the light beam rotates about a center of rotation located on the second axis.
摘要翻译：用于偏转光束的光学装置包括第一和第二偏转装置和耦合镜。第一偏转装置可以使用第一旋转驱动器围绕第一轴线旋转，并且包括相对于彼此不可旋转地设置在角位置上的两个反射镜，以便围绕第一轴线共同旋转。第二偏转装置可以使用第二旋转驱动器围绕第二轴线旋转，并且包括第三反射镜。耦合镜相对于反射镜的表面以大于45°的角度将光束偏转到第一或第二反射镜上。第一和第二轴线彼此垂直。第一和第二反射镜围绕第一轴线共同旋转，使得光束围绕位于第二轴线上的旋转中心旋转。

32. 发明申请

US20070081234A1 Scanning microscope and scanning method using a scanning microscope 有权
标题翻译：扫描显微镜和扫描方法使用扫描显微镜
公开(公告)号：US20070081234A1
公开(公告)日：2007-04-12
申请号：US11544367
申请日：2006-10-06
申请人： Bernd Widzgowski
发明人： Bernd Widzgowski
IPC分类号： G02B21/06
CPC分类号： G02B21/0048 , G02B21/0032 , G02B21/008 , G02B21/0084
摘要： A scanning microscope (1) and a scanning method are disclosed. The scanning microscope (1) has, arranged in the illuminating light beam path (3), an outcoupling element (60) that couples out at least a fraction of the illuminating light beam (3) and directs it to a detector (61) that detects the pulse frequency of the light source that generates the illuminating light beam; and the pulse frequency serves as a basic clock frequency for the scanner.
摘要翻译：公开了扫描显微镜（1）和扫描方法。扫描显微镜（1）布置在照明光束路径（3）中，外耦合元件（60）将至少一部分照明光束（3）耦合并将其引导到检测器（61），该检测器检测产生照明光束的光源的脉冲频率; 并且脉冲频率用作扫描仪的基本时钟频率。

33. 发明授权

US06859294B2 Method for ascertaining position values, and scanning microscope 有权
标题翻译：确定位置值的方法和扫描显微镜
公开(公告)号：US06859294B2
公开(公告)日：2005-02-22
申请号：US10235256
申请日：2002-09-05
申请人： Bernd Widzgowski
发明人： Bernd Widzgowski
IPC分类号： G02B21/00 , G02B26/08
CPC分类号： G02B21/008 , G02B21/0048
摘要： A scanning microscope is disclosed. The scanning microscope comprises a light source which emits an illuminating light beam for illumination of a specimen, a resonant beam deflection device, for guiding the illuminating light beam over the specimen, which has a resonant frequency and a resonant frequency range, and an independent oscillator with which a drive oscillation, which has a drive frequency within the resonant frequency range can be generated which drives the beam deflection device. Furthermore a method is disclosed for controlling a scanning microscope having a resonant beam deflection.
摘要翻译：公开了一种扫描显微镜。扫描显微镜包括发射用于照射样本的照明光束的光源，用于将具有谐振频率和谐振频率范围的照明光束引导到样本上的谐振光束偏转装置和独立振荡器由此，可以产生驱动频率在共振频率范围内的驱动振荡，驱动光束偏转装置。此外，公开了一种用于控制具有谐振光束偏转的扫描显微镜的方法。

34. 发明授权

US08735790B2 Method for examining an object using a microscope with delayed control signals and a microscope for examining an object 有权
标题翻译：使用具有延迟控制信号的显微镜检查物体的方法和用于检查物体的显微镜
公开(公告)号：US08735790B2
公开(公告)日：2014-05-27
申请号：US12954629
申请日：2010-11-25
申请人： Ludger Schulte , Bernd Widzgowski
发明人： Ludger Schulte , Bernd Widzgowski
IPC分类号： G02B7/04 , G02B27/40 , G02B27/64
CPC分类号： G02B21/0032
摘要： A microscope for examining an object includes a laser light source generating pulsed light so as to illuminate the object. A measuring system including a detector is adapted to detect detection light coming from the object and the measuring system generates a measurement signal based on the detection light. The microscope includes a programmable integrated circuit including a control element and at least one of a first delay element and a second delay element. The control element is configured to generate a first control signal adapted to control the detector and the measuring system. The control element is further configured to generate a second control signal adapted to control the laser light source. The first and second delay elements are configured to delay the first and second control signals, respectively.
摘要翻译：用于检查物体的显微镜包括产生脉冲光以激发物体的激光光源。包括检测器的测量系统适于检测来自物体的检测光，并且测量系统基于检测光产生测量信号。显微镜包括可编程集成电路，其包括控制元件和第一延迟元件和第二延迟元件中的至少一个。控制元件被配置为产生适于控制检测器和测量系统的第一控制信号。控制元件还被配置为产生适于控制激光光源的第二控制信号。第一和第二延迟元件被配置为分别延迟第一和第二控制信号。

35. 发明申请

US20130032699A1 DEVICE AND METHOD FOR COUNTING PHOTONS 有权
标题翻译：用于计算光子的装置和方法
公开(公告)号：US20130032699A1
公开(公告)日：2013-02-07
申请号：US13562439
申请日：2012-07-31
申请人： Bernd Widzgowski
发明人： Bernd Widzgowski
IPC分类号： H03K17/78
CPC分类号： G01J1/44
摘要： A device for counting photons includes a detector unit that is configured to generate an detected signal. A switching unit is configured to be impinged upon by the detected signal and to trigger a switching state for each detection pulse so as to generate a state signal. A sampling unit is configured to sample the state signal at a predetermined sampling frequency. A serial-parallel converter unit is configured to parallelize the serially generated sampled data by grouping successive sampled data into a sampled data packet. An evaluation unit is configured to evaluate the binary values of sampled data packets so as to identify a partial counter result indicating the number of switching state changes occurring in the switching unit, and to add partial counter results identified in individual clock cycles.
摘要翻译：用于计数光子的装置包括被配置为产生检测信号的检测器单元。开关单元被配置为通过检测到的信号入射并触发每个检测脉冲的开关状态，以便产生状态信号。采样单元被配置为以预定采样频率对状态信号进行采样。串行并行转换器单元被配置为通过将连续的采样数据分组成采样的数据分组来并行化串行产生的采样数据。评估单元被配置为评估采样数据分组的二进制值，以便识别指示在切换单元中发生的切换状态改变的数量的部分计数器结果，并且添加在各个时钟周期中标识的部分计数器结果。

36. 发明授权

US07554722B2 Scanning microscope with scanner frequency derived from pulsed laser 有权
标题翻译：扫描显微镜，扫描仪频率来源于脉冲激光
公开(公告)号：US07554722B2
公开(公告)日：2009-06-30
申请号：US11544367
申请日：2006-10-06
申请人： Bernd Widzgowski
发明人： Bernd Widzgowski
IPC分类号： G02B21/00
CPC分类号： G02B21/0048 , G02B21/0032 , G02B21/008 , G02B21/0084
摘要： A scanning microscope (1) and a scanning method are disclosed. The scanning microscope (1) has, arranged in the illuminating light beam path (3), an outcoupling element (60) that couples out at least a fraction of the illuminating light beam (3) and directs it to a detector (61) that detects the pulse frequency of the light source that generates the illuminating light beam; and the pulse frequency serves as a basic clock frequency for the scanner.
摘要翻译：公开了扫描显微镜（1）和扫描方法。扫描显微镜（1）布置在照明光束路径（3）中，外耦合元件（60）将至少一部分照明光束（3）耦合并将其引导到检测器（61），该检测器检测产生照明光束的光源的脉冲频率; 并且脉冲频率用作扫描仪的基本时钟频率。

37. 发明授权

US06914238B2 Method and apparatus for point-by-point scanning of a specimen 有权
标题翻译：样本点对点扫描的方法和装置
公开(公告)号：US06914238B2
公开(公告)日：2005-07-05
申请号：US10157561
申请日：2002-05-29
申请人： Johann Engelhardt , Bernd Widzgowski
发明人： Johann Engelhardt , Bernd Widzgowski
IPC分类号： G02B21/00 , G02B21/16 , H01J3/14
CPC分类号： G02B21/16 , G02B21/004 , G02B21/0048 , G02B21/008 , G02B21/0084
摘要： A method and an apparatus for point-by-point scanning of a specimen (15) are disclosed. The method is characterized by the steps of generation (45) of a nominal signal (10) for each scan point and transfer (47) of the nominal signal to a scanning device (7). In further steps, determination (49) of an actual signal (25) for each scan point from the setting of the scanning device (7), detection (51) of at least one detection signal (21) for each scan point, calculation (53) of a display signal (27) and an image point position (29) from the actual signal (25) and/or the nominal signal (10) and the detection signal (21), and assignment (55) of the display signal (27) to the image point position (29), are performed.
摘要翻译：公开了一种用于样本（15）的逐点扫描的方法和装置。该方法的特征在于为每个扫描点产生（45）标称信号（10）并将标称信号（47）传送（47）到扫描装置（7）的步骤。在其他步骤中，根据扫描装置（7）的设定对每个扫描点的实际信号（25）的确定（49），对于每个扫描点的至少一个检测信号（21）的检测（51），计算（ 53）和来自实际信号（25）和/或标称信号（10）和检测信号（21）的显示信号（27）和图像点位置（29）以及显示信号的分配（55）（27）到图像点位置（29）。

38. 发明授权

US06444971B1 Method and system for compensating intensity fluctuations of an illumination system in a confocal microscope 有权
标题翻译：用于补偿共焦显微镜照明系统强度波动的方法和系统
公开(公告)号：US06444971B1
公开(公告)日：2002-09-03
申请号：US09476649
申请日：1999-12-31
申请人： Johann Engelhardt , Bernd Widzgowski
发明人： Johann Engelhardt , Bernd Widzgowski
IPC分类号： G01N2100
CPC分类号： G02B21/0084 , G02B21/008 , G02B21/06
摘要： A method and system for compensating intensity fluctuations of an illumination system in a confocal microscope comprise a first and a second analog-to-digital converters for digitizing a first electrical signal corresponding to the light reflected from a specimen, and for digitizing a second electrical signal corresponding to an illumination reference, respectively. The digitized signals are sent to a first and a second look up tables carrying out a log conversion of the first and second electrical signals, respectively. Also provided is a calculator for correcting the first electrical signal for intensity fluctuations of the second electrical signal. The corrected electrical signal is sent to a third look up table for converting the corrected electric signal. The conversion is done by exponentiation of the corrected electrical signal.
摘要翻译：一种用于补偿共焦显微镜中的照明系统的强度波动的方法和系统，包括第一和第二模拟数字转换器，用于数字化对应于从样本反射的光的第一电信号，以及用于数字化第二电信号分别对应于照明参考。数字化信号被发送到分别执行第一和第二电信号的对数转换的第一和第二查询表。还提供了一种用于校正第一电信号以用于第二电信号的强度波动的计算器。校正后的电信号被发送到第三查询表，用于转换校正的电信号。通过校正电信号的取幂来进行转换。

39. 发明授权

US09772481B2 Arrangement for use in the illumination of a specimen in SPIM microscopy 有权
公开(公告)号：US09772481B2
公开(公告)日：2017-09-26
申请号：US14354601
申请日：2012-10-22
申请人： Werner Knebel , Frank Sieckmann , Bernd Widzgowski , Wernher Fouquet
发明人： Werner Knebel , Frank Sieckmann , Bernd Widzgowski , Wernher Fouquet
IPC分类号： G02B21/06 , G02B21/00 , G02B21/08 , G02B21/10 , G02B21/16 , G02B21/36
CPC分类号： G02B21/0032 , G02B21/0036 , G02B21/0076 , G02B21/084 , G02B21/10 , G02B21/16 , G02B21/367
摘要： An arrangement for use in illuminating a sample in SPIM microscopy includes an illumination objective configured to receive and focus a light strip or a quasi-light strip. The quasi-light strip is made up of a light bundle continuously moved back and forth in a light-strip plane. A deflection apparatus is configured to deflect the light strip or the quasi-light strip, after the light strip or the quasi-light strip has passed through the illumination objective, in such a way that the light strip or the quasi-light strip propagates at an angle different from zero degrees with respect to an optical axis of the illumination objective. The illumination objective and the deflection apparatus are arranged movably relative to one another.

40. 发明授权

US09250429B2 Phase filters for a scanning microscope 有权
标题翻译：扫描显微镜的相位滤波器
公开(公告)号：US09250429B2
公开(公告)日：2016-02-02
申请号：US13486652
申请日：2012-06-01
申请人： Hilmar Gugel , Arnold Giske , Marcus Dyba , Roland Seifert , Bernd Widzgowski
发明人： Hilmar Gugel , Arnold Giske , Marcus Dyba , Roland Seifert , Bernd Widzgowski
IPC分类号： G02B21/00 , G02B5/22 , G02B21/24
CPC分类号： G02B21/0076 , G02B21/0032 , G02B21/248
摘要： An optical device includes: a focusing optic that focuses a light beam in a focal plane; at least two phase filters for selectively focusing the light beam and effecting a phase shift of the light beam; and a filter wheel supporting the at least two phase filters which are individually introducible along an optical axis of the light beam, where the filter wheel is rotationally adjusted in relation to the optical axis by a stepper motor and linearly adjusted in an r-direction along a plane of the filter wheel by a linear adjustment mechanism.
摘要翻译：光学装置包括：聚焦光学元件，其将光束聚焦在焦平面中; 至少两个相位滤波器，用于选择性地聚焦光束并实现光束的相移; 以及支撑沿着光束的光轴可分别引入的至少两个相位滤波器的滤光轮，其中滤光轮通过步进电机相对于光轴被旋转地调节并沿着r方向线性调节通过线性调节机构的滤光轮的平面。

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