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    • 33. 发明授权
    • Methods and systems for evaluating the length of elongated elements
    • 用于评估细长元件长度的方法和系统
    • US07835870B2
    • 2010-11-16
    • US11264452
    • 2005-11-01
    • Sankar NairSoumendu BhattacharyaVishwanath NatarajanAbhijit Chatterjee
    • Sankar NairSoumendu BhattacharyaVishwanath NatarajanAbhijit Chatterjee
    • G01N33/48
    • C12Q1/68C12Q2565/631C12Q2565/125C12Q2525/204
    • Systems and methods are disclosed for evaluating the length of elongated elements in a sample. The disclosed systems and methods may include using a direct current stimulus to determine a direct current base length region corresponding to at least a portion of the sample. Furthermore, the disclosed systems and methods may include using an alternating current stimulus to determine that the direct current base length region corresponds to a first set of elongated elements and a second set of elongated elements. The first set of elongated elements may have a first base length and the second set of elongated elements may have a second base length. The elongated elements may comprise, for example, chain molecules, deoxyribonucleic acid (DNA), ribonucleic acid (RNA), or proteins. Furthermore, the disclosed systems and methods may include measuring an ion current through a nanopore, the ion current produced by the alternating current stimulus.
    • 公开了用于评估样品中细长元件的长度的系统和方法。 所公开的系统和方法可以包括使用直流电刺激来确定对应于样品的至少一部分的直流电流基极长度区域。 此外,所公开的系统和方法可以包括使用交流电刺激来确定直流基极长度区域对应于第一组细长元件和第二组细长元件。 第一组细长元件可以具有第一基底长度,并且第二组细长元件可以具有第二基底长度。 细长元件可以包括例如链分子,脱氧核糖核酸(DNA),核糖核酸(RNA)或蛋白质。 此外,所公开的系统和方法可以包括测量通过纳米孔的离子电流,即由交流电刺激产生的离子电流。
    • 34. 发明申请
    • Methods and systems for evaluating the length of elongated elements
    • 用于评估细长元件长度的方法和系统
    • US20070099191A1
    • 2007-05-03
    • US11264452
    • 2005-11-01
    • Sankar NairSoumendu BhattacharyaVishwanath NatarajanAbhijit Chatterjee
    • Sankar NairSoumendu BhattacharyaVishwanath NatarajanAbhijit Chatterjee
    • C12Q1/68G06F19/00
    • C12Q1/68C12Q2565/631C12Q2565/125C12Q2525/204
    • Systems and methods are disclosed for evaluating the length of elongated elements in a sample. The disclosed systems and methods may include using a direct current stimulus to determine a direct current base length region corresponding to at least a portion of the sample. Furthermore, the disclosed systems and methods may include using an alternating current stimulus to determine that the direct current base length region corresponds to a first set of elongated elements and a second set of elongated elements. The first set of elongated elements may have a first base length and the second set of elongated elements may have a second base length. The elongated elements may comprise, for example, chain molecules, deoxyribonucleic acid (DNA), ribonucleic acid (RNA), or proteins. Furthermore, the disclosed systems and methods may include measuring an ion current through a nanopore, the ion current produced by the alternating current stimulus.
    • 公开了用于评估样品中细长元件的长度的系统和方法。 所公开的系统和方法可以包括使用直流电刺激来确定对应于样品的至少一部分的直流电流基极长度区域。 此外,所公开的系统和方法可以包括使用交流电刺激来确定直流基极长度区域对应于第一组细长元件和第二组细长元件。 第一组细长元件可以具有第一基底长度,并且第二组细长元件可以具有第二基底长度。 细长元件可以包括例如链分子,脱氧核糖核酸(DNA),核糖核酸(RNA)或蛋白质。 此外,所公开的系统和方法可以包括测量通过纳米孔的离子电流,即由交流电刺激产生的离子电流。
    • 35. 发明申请
    • High speed data converter testing devices, methods, & systems
    • 高速数据转换器测试设备,方法和系统
    • US20060290548A1
    • 2006-12-28
    • US11368079
    • 2006-03-03
    • Shalabh GoyalAbhijit Chatterjee
    • Shalabh GoyalAbhijit Chatterjee
    • H03M1/10
    • H03M1/1095H03M1/12
    • Devices and methods to test high speed analog-to-digital and digital-to-analog signal converters are provided. According to one embodiment, a testing device can comprise an output, a mixer, and an input. The output can provide a signal, and the mixer can receive the signal and provide a test signal to a data converter having a sampling frequency. The test signal can be spectrally impure. The input can sample the data converter output at a frequency less the sampling frequency so that the data converter output is under sampled. According to another embodiment, a first set of data converters are tested to obtain a mapping function that relates dynamic specifications to device signatures. Then a second set of data converters can be tested and based on their device signatures mapped with the mapping function, dynamic specifications for the second set of data converters can be obtained. Other embodiments are also claimed and described.
    • 提供了测试高速模数和数模转换器的设备和方法。 根据一个实施例,测试装置可以包括输出,混频器和输入。 输出可以提供信号,并且混频器可以接收信号并向具有采样频率的数据转换器提供测试信号。 测试信号可以是光谱不纯的。 输入可以采样频率较低的数据转换器输出,以便数据转换器输出采样。 根据另一个实施例,测试第一组数据转换器以获得将动态规范与设备签名相关联的映射功能。 然后,可以测试第二组数据转换器,并且基于其与映射函数映射的设备签名,可以获得第二组数据转换器的动态规范。 还要求保护和描述其它实施例。