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    • 25. 发明申请
    • STRUCTURES FOR TESTING CIRCUITS AND METHODS FOR FABRICATING THE STRUCTURES
    • 用于测试电路的结构和用于制作结构的方法
    • US20050237074A1
    • 2005-10-27
    • US11169987
    • 2005-06-28
    • Konstantine KaravakisTom Nguyen
    • Konstantine KaravakisTom Nguyen
    • G01R1/04G01R31/02
    • G01R1/0483
    • One embodiment of the present invention is a structure useful for testing circuits that includes: (a) a flexible substrate having contactors on a first side and pads on a second side; (b) a rigid substrate having vias aligned with the pads on the second side of the flexible substrate; (c) an adhesive layer comprised of a compliant adhesive material having vias aligned with the pads on the second side of the flexible substrate; the adhesive layer being affixed to the flexible substrate and the rigid substrate; (d) a card; (e) electrical connectors that are retained in the vias of the rigid substrate and the adhesive layer, which electrical connectors have first and second retractable ends, wherein the first retractable ends contact pads on the substrate, and the second retractable ends contact pads on the card; and (f) a clamp that is adapted to fit over the substrate and the adhesive layer, the clamp having an opening to provide access to the contactors, wherein the clamp is connected to the card.
    • 本发明的一个实施例是用于测试电路的结构,其包括:(a)柔性基板,其具有在第一侧上的接触器和在第二侧上的焊盘; (b)刚性基板,其具有与柔性基板的第二侧上的焊盘对准的通孔; (c)由柔性粘合剂材料组成的粘合剂层,其具有与柔性基材的第二侧上的焊盘对准的通孔; 所述粘合剂层固定在所述柔性基板和所述刚性基板上; (d)卡; (e)电连接器,其保持在刚性基板和粘合剂层的通孔中,该电连接器具有第一和第二可缩回端,其中第一可缩回端接触基板上的焊盘,而第二可缩回端接触焊盘 卡; 和(f)适于装配在所述基底和所述粘合剂层上的夹具,所述夹具具有开口以提供对所述接触器的通路,其中所述夹具连接到所述卡。