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    • 27. 发明授权
    • Error addition apparatus
    • 错误添加装置
    • US08352836B2
    • 2013-01-08
    • US12683072
    • 2010-01-06
    • Takashi Furuya
    • Takashi Furuya
    • H03M13/33H03M13/53
    • H04L1/0079
    • An error addition apparatus receives a data signal D having a frame format having a specific signal inserted into its front, adds errors to the data signal D, and outputs a resulting signal. The apparatus has an error addition regulation unit for receiving a frame synchronization signal F, indicative of a timing at which the front of the frame of the data signal has been inputted, and regulating the errors such that the errors are added to positions other than a region of the specific signal. Accordingly, errors are not added to a specific signal.
    • 错误添加装置接收具有插入其前端的特定信号的帧格式的数据信号D,将错误加到数据信号D上,并输出结果信号。 该装置具有误差附加调节单元,用于接收表示数据信号的帧的前部已被输入的定时的帧同步信号F,并且调整误差使得误差被添加到除 区域的具体信号。 因此,不向特定信号添加错误。
    • 28. 发明授权
    • Evaluation method of random error distribution and evaluation apparatus thereof
    • 随机误差分布的评价方法及评价装置
    • US07987395B2
    • 2011-07-26
    • US12501647
    • 2009-07-13
    • Masahiro KurodaTakashi FuruyaKazuhiko Ishibe
    • Masahiro KurodaTakashi FuruyaKazuhiko Ishibe
    • G06F11/00
    • H04L1/0084H04L1/20
    • A degree of conformity of error distribution of a digital signal to the Poisson distribution is quantitatively determined. The digital signal including error data, which is randomly generated at a predetermined error rate, is divided into data number of measurement units, wherein the data number is determined on the basis of the error rate. A sample number of the measurement units are acquired from the measurement units, and the number of errors contained in each measurement unit is measured as a measurement value. Further, the number of times of occurrence of each measurement value is calculated, a Poisson distribution function is calculated, and a degree of a bond between the Poisson distribution and the distribution of the number of times of occurrence is determined by using the chi-square goodness-of-fit test method.
    • 定量地确定数字信号的误差分布与泊松分布的一致性程度。 包括以预定错误率随机产生的误差数据的数字信号被划分为测量单位的数据数,其中基于错误率确定数据编号。 从测量单元获取测量单元的样本数,并且测量每个测量单元中包含的误差的数量作为测量值。 此外,计算每个测量值的出现次数,计算泊松分布函数,并且通过使用卡方确定泊松分布与发生次数分布之间的键的程度 适合度测试方法。
    • 29. 发明申请
    • MANUFACTURING METHOD OF SEMICONDUCTOR PHOTONIC DEVICE SUBSTRATE
    • 半导体光电器件基板的制造方法
    • US20110003413A1
    • 2011-01-06
    • US12766684
    • 2010-04-23
    • Toshihiro MorisawaTakehiko TaniHisataka NagaiTakashi Furuya
    • Toshihiro MorisawaTakehiko TaniHisataka NagaiTakashi Furuya
    • H01L21/20
    • C23C16/56H01L21/02395H01L21/02543H01L33/007H01L33/46
    • In a manufacturing method of a semiconductor photonic device substrate, before multi-layer films different in material composition are successively and gradually crystal-grown in one chamber, an inter-layer growth rate model showing a relation in growth rate between each layer is defined, a growth rate of a film corresponding to at least one or more layers is obtained by actual crystal growth using an individual substrate, a growth rate of a film corresponding to other layers is estimated from the obtained growth rate by the inter-layer growth rate model, and a growth time is determined in accordance with a film thickness of each layer of the semiconductor photonic device substrate based on the actually obtained growth rate and the estimated growth rate. These steps are carried out by using a computer system connected to an MOCVD equipment, and then, a crystal growth of the semiconductor photonic device substrate is performed.
    • 在半导体光子器件衬底的制造方法中,在不同材料组成的多层膜在一个室中连续逐渐晶体生长的情况下,定义表示各层之间的生长速度关系的层间生长速率模型, 通过使用单个基板的实际晶体生长获得对应于至少一个或多个层的膜的生长速率,通过层间生长速率模型从获得的生长速率估计与其它层相对应的膜的生长速率 根据实际获得的生长速度和估计的生长速度,根据半导体光子器件基板的各层的膜厚确定生长时间。 这些步骤通过使用连接到MOCVD设备的计算机系统进行,然后执行半导体光子器件衬底的晶体生长。