会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 21. 发明申请
    • CAPACITIVELY-COUPLED ELECTROSTATIC (CCE) PROBE ARRANGEMENT FOR DETECTING STRIKE STEP IN A PLASMA PROCESSING CHAMBER AND METHODS THEREOF
    • 用于检测等离子体加工室中的冲击步骤的电容耦合静电(CCE)探测器布置及其方法
    • US20100006417A1
    • 2010-01-14
    • US12498936
    • 2009-07-07
    • Jean-Paul BoothDouglas L. Keil
    • Jean-Paul BoothDouglas L. Keil
    • H05H1/24B01J19/08
    • H05H1/0081H05H1/0012
    • A method for identifying a stabilized plasma within a processing chamber of a plasma processing system is provided. The method includes executing a strike step within the processing chamber to generate a plasma. The strike step includes applying a substantially high gas pressure within the processing chamber and maintaining a low radio frequency (RF) power within the processing chamber. The method also includes employing a probe head to collect a set of characteristic parameter measurements during the strike step, the probe head being on a surface of the processing chamber, wherein the surface is within close proximity to a substrate surface. The method further includes comparing the set of characteristic parameter measurements against a pre-defined range. If the set of characteristic parameter measurements is within the pre-defined range, the stabilized plasma exists.
    • 提供了一种在等离子体处理系统的处理室内识别稳定的等离子体的方法。 该方法包括在处理室内执行击打步骤以产生等离子体。 冲击步骤包括在处理室内施加基本上高的气体压力并且在处理室内保持低射频(RF)功率。 该方法还包括采用探针头在罢工步骤期间收集一组特征参数测量值,探针头位于处理室的表面上,其中该表面紧邻衬底表面。 该方法还包括将特征参数测量集合与预定义范围进行比较。 如果一组特征参数测量值在预定范围内,则存在稳定的等离子体。
    • 23. 发明授权
    • Capacitively-coupled electrostatic (CCE) probe arrangement for detecting dechucking in a plasma processing chamber and methods thereof
    • 用于检测等离子体处理室中的脱扣的电容耦合静电(CCE)探针装置及其方法
    • US08780522B2
    • 2014-07-15
    • US12498939
    • 2009-07-07
    • Jean-Paul BoothDouglas L. Keil
    • Jean-Paul BoothDouglas L. Keil
    • H01L21/683
    • H01L21/6833
    • A method for identifying a signal perturbation characteristic of a dechucking event within a processing chamber of a plasma processing system is provided. The method includes executing a dechucking step within the processing chamber to remove a substrate from a lower electrode, wherein the dechucking step includes generating plasma capable of providing a current to neutralize an electrostatic charge on the substrate. The method also includes employing a probe head to collect a set of characteristic parameter measurements during the dechucking step. The probe head is on a surface of the processing chamber, wherein the surface is within close proximity to a substrate surface. The method further includes comparing the set of characteristic parameter measurements against a pre-defined range. If the set of characteristic parameter measurements is within the pre-defined range, the electrostatic charge is removed from the substrate and the signal perturbation characteristic of the dechucking event is detected.
    • 提供了一种用于识别等离子体处理系统的处理室内的消磁事件的信号扰动特性的方法。 该方法包括执行处理室内的脱扣步骤以从下电极去除衬底,其中所述去开关步骤包括产生能够提供电流以中和衬底上的静电电荷的等离子体。 该方法还包括使用探针头在脱胶步骤期间收集一组特征参数测量。 探头位于处理室的表面上,其中表面在基板表面附近。 该方法还包括将特征参数测量集合与预定义范围进行比较。 如果特征参数测量集合在预定范围内,则从衬底去除静电电荷,并且检测到脱扣事件的信号扰动特性。
    • 25. 发明申请
    • CAPACITIVELY-COUPLED ELECTROSTATIC (CCE) PROBE ARRANGEMENT FOR DETECTING DECHUCKING IN A PLASMA PROCESSING CHAMBER AND METHODS THEREOF
    • 用于检测等离子体加工室中的检测的电容耦合静电(CCE)检测装置及其方法
    • US20100008015A1
    • 2010-01-14
    • US12498939
    • 2009-07-07
    • Jean-Paul BoothDouglas L. Keil
    • Jean-Paul BoothDouglas L. Keil
    • H01L21/683
    • H01L21/6833
    • A method for identifying a signal perturbation characteristic of a dechucking event within a processing chamber of a plasma processing system is provided. The method includes executing a dechucking step within the processing chamber to remove a substrate from a lower electrode, wherein the dechucking step includes generating plasma capable of providing a current to neutralize an electrostatic charge on the substrate. The method also includes employing a probe head to collect a set of characteristic parameter measurements during the dechucking step. The probe head is on a surface of the processing chamber, wherein the surface is within close proximity to a substrate surface. The method further includes comparing the set of characteristic parameter measurements against a pre-defined range. If the set of characteristic parameter measurements is within the pre-defined range, the electrostatic charge is removed from the substrate and the signal perturbation characteristic of the dechucking event is detected.
    • 提供了一种用于识别等离子体处理系统的处理室内的消磁事件的信号扰动特性的方法。 该方法包括执行处理室内的脱扣步骤以从下电极去除衬底,其中所述去开关步骤包括产生能够提供电流以中和衬底上的静电电荷的等离子体。 该方法还包括使用探针头在脱胶步骤期间收集一组特征参数测量。 探头位于处理室的表面上,其中表面在基板表面附近。 该方法还包括将特征参数测量集合与预定义范围进行比较。 如果特征参数测量集合在预定范围内,则从衬底去除静电电荷,并且检测到脱扣事件的信号扰动特性。
    • 27. 发明授权
    • Methods and apparatus for normalizing optical emission spectra
    • 用于归一化光发射光谱的方法和装置
    • US08358416B2
    • 2013-01-22
    • US13415763
    • 2012-03-08
    • Vijayakumar C. VenugopalEric PapeJean-Paul Booth
    • Vijayakumar C. VenugopalEric PapeJean-Paul Booth
    • G01N21/00
    • G01N21/274G01J3/02G01J3/0205G01J3/0218G01J3/0294G01J3/443G01N21/68
    • A processing system having a chamber for in-situ optical interrogation of plasma emission to quantitatively measure normalized optical emission spectra is provided. The processing chamber includes a confinement ring assembly, a flash lamp, and a set of quartz windows. The processing chamber also includes a plurality of collimated optical assemblies, the plurality of collimated optical assemblies are optically coupled to the set of quartz windows. The processing chamber also includes a plurality of fiber optic bundles. The processing chamber also includes a multi-channel spectrometer, the multi-channel spectrometer is configured with at least a signal channel and a reference channel, the signal channel is optically coupled to at least the flash lamp, the set of quartz windows, the set of collimated optical assemblies, the illuminated fiber optic bundle, and the collection fiber optic bundle to measure a first signal.
    • 提供一种具有用于等离子体发射的原位光询问室以定量测量归一化光发射光谱的处理系统。 处理室包括限制环组件,闪光灯和一组石英窗。 处理室还包括多个准直光学组件,多个准直光学组件光学耦合到该组石英窗口。 处理室还包括多个光纤束。 处理室还包括多通道光谱仪,多通道光谱仪配置有至少一个信号通道和一个参考通道,信号通道光学耦合到至少闪光灯,该组石英窗,该组 准直光学组件,照明光纤束和收集光纤束以测量第一信号。