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    • 24. 发明授权
    • Method for producing silicon nitride series film
    • 氮化硅系列薄膜的制造方法
    • US06413887B1
    • 2002-07-02
    • US09650168
    • 2000-08-29
    • Hideaki FukudaHiroki Arai
    • Hideaki FukudaHiroki Arai
    • H01L2131
    • H01L21/3185C23C16/308C23C16/345Y10S438/909
    • A method for producing a plasma silicon nitride series film with a small heat load having a low hydrogen concentration is provided. The method is for producing a silicon nitride series film on a material to be treated using a plasma CVD apparatus having a reaction chamber evacuated to vacuum. The method comprises the steps of introducing a monosilane gas (SiH4) and a nitrogen gas (N2) as raw material gases into the reaction chamber at prescribed flow rates, and heating the material to be treated to a prescribed temperature. At this time, it is characterized in that the flow rate of the nitrogen gas is at least 100 times the flow rate of the monosilane gas.
    • 提供了具有低氢浓度的小热负荷的等离子体氮化硅系膜的制造方法。 该方法是使用具有抽真空的反应室的等离子体CVD装置在待处理材料上制造氮化硅系膜。 该方法包括以规定的流量将作为原料气体的甲硅烷气体(SiH 4)和氮气(N 2)引入反应室的步骤,将待处理材料加热至规定温度。 此时,其特征在于,氮气的流量为甲硅烷气体的流量的100倍以上。