专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

21. 发明授权

US09124755B2 Apparatus and method for compressive imaging and sensing through multiplexed modulation 有权
标题翻译：通过复用调制进行压缩成像和感测的装置和方法
公开(公告)号：US09124755B2
公开(公告)日：2015-09-01
申请号：US13511475
申请日：2010-12-07
申请人： Kevin F. Kelly , Richard G. Baraniuk , Gary Woods , Ting Sun , Matthew Turner
发明人： Kevin F. Kelly , Richard G. Baraniuk , Gary Woods , Ting Sun , Matthew Turner
IPC分类号： H04N5/225 , H04N3/08 , H04N5/335 , H03M7/30 , H04N19/90
CPC分类号： H04N5/2254 , H03M7/3062 , H04N3/08 , H04N5/335 , H04N19/90
摘要： Compressive imaging apparatus employing multiple modulators in various optical schemes to generate the modulation patterns before the signal is recorded at a detector. The compressive imaging apparatus is equally valid when applying compressive imaging to structured light embodiments where the placement is shifted from the acquisition path between the subject and the detector into the illumination path between the source and the subject to be imaged.
摘要翻译：在各种光学方案中采用多个调制器的压缩成像装置在信号被记录在检测器之前产生调制图案。当将压缩成像应用于结构化光实施例时，压缩成像装置同样有效，其中放置从被摄体和检测器之间的采集路径移动到源和待成像对象之间的照明路径。

22. 发明授权

US09032369B2 Systems and/or methods for executing appropriate tests based on code modifications using live, distributed, real-time cache and feedback loop 有权
标题翻译：基于使用实时，分布式，实时缓存和反馈循环的代码修改来执行适当测试的系统和/或方法
公开(公告)号：US09032369B2
公开(公告)日：2015-05-12
申请号：US13429924
申请日：2012-03-26
申请人： Balaji Balakrishnan , Vasudeva Rao Kothamasu , Gary Woods
发明人： Balaji Balakrishnan , Vasudeva Rao Kothamasu , Gary Woods
IPC分类号： G06F9/44 , G06F11/36
CPC分类号： G06F11/3608 , G06F11/3676 , G06F11/3684
摘要： Certain example embodiments relate to systems and/or methods for determining and/or executing an appropriate subset of tests in response to a code change. In certain example embodiments, hash digests or other unique values for code structures (such as, for example, classes, methods, and/or other structural elements) may be created. Tests associated those associated code structures may be identified. New hash digests or other unique values may be generated for the code structures after the source code has been modified. In response to a mismatch as between the existing and new hash digests or other unique values, a list of associated tests for possible subsequent execution may be retrieved. Certain example embodiments additionally or alternatively provide an incremental but consistent way of analyzing performance issues, e.g., in connection with a profiler.
摘要翻译：某些示例实施例涉及用于响应于代码改变来确定和/或执行适当的测试子集的系统和/或方法。在某些示例实施例中，可以创建用于代码结构（例如，类，方法和/或其他结构元素）的散列摘要或其他唯一值。可以识别与这些相关联的代码结构相关联的测试。在修改源代码之后，可能会为代码结构生成新的散列摘要或其他唯一值。响应于现有和新的散列摘要或其他唯一值之间的不匹配，可以检索可能的后续执行的关联测试的列表。某些示例性实施例另外或替代地提供分析性能问题的增量但一致的方式，例如结合分析器。

23. 发明授权

US08417736B2 Method, server extension and database management system for storing non XML documents in a XML database 有权
标题翻译：用于在XML数据库中存储非XML文档的方法，服务器扩展和数据库管理系统
公开(公告)号：US08417736B2
公开(公告)日：2013-04-09
申请号：US12588552
申请日：2009-10-19
申请人： Julius Geppert , Michael Gesmann , Gary Woods
发明人： Julius Geppert , Michael Gesmann , Gary Woods
IPC分类号： G06F17/30
CPC分类号： G06F17/30917
摘要： The present invention relates to a method for storing at least one non-XML document (10) in an XML database (1), the method comprising the steps of: a. transforming the at least one non-XML document (10) into at least one XML document (20) by one or more transformation functions, the at least one XML document (20) conforming to a schema comprising references to the one or more transformation functions; and b. storing the at least one XML document (20) in the XML database (1).
摘要翻译：本发明涉及一种在XML数据库（1）中存储至少一个非XML文档（10）的方法，该方法包括以下步骤：a。通过一个或多个变换函数将所述至少一个非XML文档（10）转换成至少一个XML文档（20），所述至少一个符合模式的XML文档（20）包括引用所述一个或多个变换函数 ; 和b。将所述至少一个XML文档（20）存储在所述XML数据库（1）中。

24. 发明申请

US20070179736A1 SYSTEM AND METHOD FOR DETERMINING PROBING LOCATIONS ON IC 有权
标题翻译：用于确定IC上的探测位置的系统和方法
公开(公告)号：US20070179736A1
公开(公告)日：2007-08-02
申请号：US11345004
申请日：2006-01-31
申请人： Hitesh Suri , Gary Woods
发明人： Hitesh Suri , Gary Woods
IPC分类号： G01C19/00
CPC分类号： G01R31/2846 , G01R31/2891
摘要： A method for identifying an area of a chip to be probed proceeds as follows. A callout list of failures is obtained from a tester, the list including cell name and pin for each failure. A Def file is interrogated to locate a Def entry matching the cell name, and a cell type, cell location, and cell orientation data is obtained for the cell from the Def file. A Lef file is then interrogated to locate a Lef entry matching the cell type, and the coordinates of the pin are obtaining from the Lef file. A GDS file is interrogated to locate a GDS entry matching the cell type, and the coordinates of polygons listed in the GDS entry are obtained. The coordinates of the pin are then crossed with the coordinates of the polygons to identify overlapping area. The overlapping area is defined as the location to be probed. A driving signal is applied to a stage to align a prober with the location to be rprobed.
摘要翻译：用于识别要探测的芯片的区域的方法如下进行。从测试人员获得故障排除列表，该列表包括每个故障的单元名称和引脚。询问Def文件以查找与单元名称匹配的Def条目，并从Def文件获取单元格的单元格类型，单元格位置和单元格方向数据。然后询问Lef文件以找到与单元格类型匹配的Lef条目，并且从Lef文件获取引脚的坐标。询问GDS文件以定位与单元格类型匹配的GDS条目，并获取GDS条目中列出的多边形的坐标。然后将引脚的坐标与多边形的坐标交叉以识别重叠区域。重叠区域被定义为要探测的位置。驾驶信号被施加到舞台，以将探测器与要被翻转的位置对准。

25. 发明授权

US07243039B1 System and method for determining probing locations on IC 有权
标题翻译：确定IC上探测位置的系统和方法
公开(公告)号：US07243039B1
公开(公告)日：2007-07-10
申请号：US11345004
申请日：2006-01-31
申请人： Hitesh Suri , Gary Woods
发明人： Hitesh Suri , Gary Woods
IPC分类号： G06F19/00
CPC分类号： G01R31/2846 , G01R31/2891
摘要： A method for identifying an area of a chip to be probed proceeds as follows. A callout list of failures is obtained from a tester, the list including cell name and pin for each failure. A Def file is interrogated to locate a Def entry matching the cell name, and a cell type, cell location, and cell orientation data is obtained for the cell from the Def file. A Lef file is then interrogated to locate a Lef entry matching the cell type, and the coordinates of the pin are obtaining from the Lef file. A GDS file is interrogated to locate a GDS entry matching the cell type, and the coordinates of polygons listed in the GDS entry are obtained. The coordinates of the pin are then crossed with the coordinates of the polygons to identify overlapping area. The overlapping area is defined as the location to be probed. A driving signal is applied to a stage to align a prober with the location to be probed.
摘要翻译：用于识别要探测的芯片的区域的方法如下进行。从测试人员获得故障排除列表，该列表包括每个故障的单元名称和引脚。询问Def文件以查找与单元名称匹配的Def条目，并从Def文件获取单元格的单元格类型，单元格位置和单元格方向数据。然后询问Lef文件以找到与单元格类型匹配的Lef条目，并且从Lef文件获取引脚的坐标。询问GDS文件以定位与单元格类型匹配的GDS条目，并获取GDS条目中列出的多边形的坐标。然后将引脚的坐标与多边形的坐标交叉以识别重叠区域。重叠区域被定义为要探测的位置。驾驶信号被施加到舞台以将探测器与要探测的位置对准。

26. 发明授权

US07232526B2 Method and apparatus for controlling material removal from semiconductor substrate using induced current endpointing 有权
标题翻译：用于使用感应电流终点来控制从半导体衬底去除材料的方法和装置
公开(公告)号：US07232526B2
公开(公告)日：2007-06-19
申请号：US10868245
申请日：2004-06-15
申请人： Richard H. Livengood , Paul Winer , Gary Woods , Michael DiBattista
发明人： Richard H. Livengood , Paul Winer , Gary Woods , Michael DiBattista
IPC分类号： B44C1/22
CPC分类号： H01L21/67253 , H01L22/12 , H01L22/26
摘要： A method and apparatus for controlling the removal of material from a semiconductor substrate in an integrated circuit fabrication process is disclosed. The method and apparatus utilize a light source or charged particle beam (electron or ion beam) to induce a current in at least one P-N junction formed in the semiconductor substrate. The induced current is monitored during the removal of material and the process is stopped or endpointed in response to the induced current making a predetermined transition.
摘要翻译：公开了一种在集成电路制造工艺中控制从半导体衬底去除材料的方法和装置。该方法和装置利用光源或带电粒子束（电子或离子束）在半导体衬底中形成的至少一个P-N结中感应电流。在去除材料期间监测感应电流，并且响应于感应电流进行预定的转变而停止或终止该过程。

27. 发明授权

US06780658B2 Method and apparatus for controlling material removal from a semiconductor substrate using induced current endpointing 有权
标题翻译：用于使用感应电流终点来控制从半导体衬底去除材料的方法和装置
公开(公告)号：US06780658B2
公开(公告)日：2004-08-24
申请号：US10455143
申请日：2003-06-05
申请人： Richard H. Livengood , Paul Winer , Gary Woods , Michael DiBattista
发明人： Richard H. Livengood , Paul Winer , Gary Woods , Michael DiBattista
IPC分类号： H01L2166
CPC分类号： H01L21/67253 , H01L22/12 , H01L22/26
摘要： A method and apparatus for controlling the removal of material from a semiconductor substrate in an integrated circuit fabrication process is disclosed. The method and apparatus utilize a light source or charged particle beam (electron or ion beam) to induce a current in at least one P-N junction formed in the semiconductor substrate. The induced current is monitored during the removal of material and the process is stopped or endpointed in response to the induced current making a predetermined transition.
摘要翻译：公开了一种在集成电路制造工艺中控制从半导体衬底去除材料的方法和装置。该方法和装置利用光源或带电粒子束（电子或离子束）在半导体衬底中形成的至少一个P-N结中感应电流。在去除材料期间监测感应电流，并且响应于感应电流进行预定的转变而停止或终止该过程。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式