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21. 发明申请

US20080218098A1 Light Emitting Device with Light Emitting Cells Arrayed 有权
标题翻译：具有发光单元阵列的发光装置
公开(公告)号：US20080218098A1
公开(公告)日：2008-09-11
申请号：US12088906
申请日：2006-12-05
申请人： Jae Ho Lee , Yeo Jin Yoon , Eu Jin Hwang , Lacroix Yves
发明人： Jae Ho Lee , Yeo Jin Yoon , Eu Jin Hwang , Lacroix Yves
IPC分类号： H05B37/02 , H01L33/00
CPC分类号： H05B33/0821 , H01L24/37 , H01L24/40 , H01L27/156 , H01L33/62 , H01L2224/371 , H01L2224/40137 , H01L2924/00014 , H01L2924/12041 , H05B33/0803 , H05B33/0809 , Y02B20/348 , H01L2924/00 , H01L2224/37099 , H01L2224/84
摘要： The present invention relates to a light emitting device. The light emitting device according to the present invention comprises a light emitting cell block having a plurality of light emitting cells; and a bridge rectifying circuit connected to input and output terminals of the light emitting cell block, wherein the bridge rectifying circuit includes a plurality of diodes between nodes. In manufacturing an AC light emitting device with a bridge rectifying circuit built therein, the present invention can provide a light emitting device capable of enhancing the reliability and luminance of the light emitting device by setting the size of diodes of the bridge rectifying circuit to be a certain size and controlling the number thereof.
摘要翻译：本发明涉及一种发光装置。根据本发明的发光器件包括具有多个发光单元的发光单元块; 以及连接到所述发光单元块的输入和输出端子的桥式整流电路，其中所述桥式整流电路在节点之间包括多个二极管。在制造其中内置有桥式整流电路的交流发光装置的情况下，本发明可以提供一种通过将桥式整流电路的二极管的尺寸设定为一个可以提高发光装置的可靠性和亮度的发光装置一定的尺寸并控制其数量。

22. 发明授权

US08673656B2 Method and device for measuring temperature during deposition of semiconductor 有权
标题翻译：用于在半导体沉积期间测量温度的方法和装置
公开(公告)号：US08673656B2
公开(公告)日：2014-03-18
申请号：US13146307
申请日：2008-12-26
申请人： Lacroix Yves
发明人： Lacroix Yves
IPC分类号： G01R31/26 , H01L21/66
CPC分类号： G01K11/125 , C23C14/541 , C23C16/52 , C30B23/002 , C30B25/16 , H01L21/02521 , H01L21/67248 , H01L22/10
摘要： Provided is a method and a device for measuring a temperature which can recognize the temperature of a semiconductor layer directly with high precision when the semiconductor layer is formed by deposition. The quantity of laser light transmitted to a semiconductor layer is monitored by a photodetector by using laser light having a wavelength λs at which the transmittance of light changes abruptly when the temperature of the semiconductor layer reaches Ts during or after deposition. When heat being given to the semiconductor layer is changed, the quantity of laser light monitored by the photodetector changes abruptly when the temperature of the semiconductor layer reaches Ts at a time A, B or C. Consequently, the fact that the temperature of the semiconductor layer reached Ts at a time A, B or C can be recognized exactly, and an error in temperature information observed by a device for measuring temperature variations can be calibrated, for example.
摘要翻译：提供了一种用于测量当半导体层通过沉积形成时可以以高精度直接识别半导体层的温度的温度的方法和装置。通过使用具有波长范围的激光来监测透射到半导体层的激光的数量，当沉积期间或之后半导体层的温度达到Ts时，光的透射率突然变化。当向半导体层施加热量时，当半导体层的温度在时间A，B或C达到Ts时，由光电检测器监测的激光的量急剧变化。因此，半导体的温度可以精确地识别A，B或C上的层达到Ts，并且例如可以校准用于测量温度变化的装置观察到的温度信息的误差。

23. 发明申请

US20110312107A1 METHOD AND DEVICE FOR MEASURING TEMPERATURE DURING DEPOSITION OF SEMICONDUCTOR 有权
标题翻译：用于在半导体沉积期间测量温度的方法和装置
公开(公告)号：US20110312107A1
公开(公告)日：2011-12-22
申请号：US13146307
申请日：2008-12-26
申请人： Lacroix Yves
发明人： Lacroix Yves
IPC分类号： H01L21/66 , G01K13/00
CPC分类号： G01K11/125 , C23C14/541 , C23C16/52 , C30B23/002 , C30B25/16 , H01L21/02521 , H01L21/67248 , H01L22/10
摘要： Provided is a method and a device for measuring a temperature which can recognize the temperature of a semiconductor layer directly with high precision when the semiconductor layer is formed by deposition. The quantity of laser light transmitted a semiconductor layer is monitored by a photodetector by using laser light having a wavelength As at which the transmittance of light changes abruptly when the temperature of the semiconductor layer reaches Ts during or after deposition. When heat being given to the semiconductor layer is changed, the quantity of laser light monitored by the photodetector changes abruptly when the temperature of the semiconductor layer reaches Ts at a time A, B or C. Consequently, the fact that the temperature of the semiconductor layer reached Ts at a time A, B or C can be recognized exactly, and an error in temperature information observed by a device for measuring temperature variations can be calibrated, for example.
摘要翻译：提供了一种用于测量当半导体层通过沉积形成时可以以高精度直接识别半导体层的温度的温度的方法和装置。利用光电检测器，通过使用当沉积期间或之后半导体层的温度达到Ts时，光的透射率突然变化的波长为A的激光来监测透射半导体层的激光的量。当向半导体层施加热量时，当半导体层的温度在时间A，B或C达到Ts时，由光电检测器监测的激光的量急剧变化。因此，半导体的温度可以精确地识别A，B或C上的层达到Ts，并且例如可以校准用于测量温度变化的装置观察到的温度信息的误差。

24. 发明授权

US08054002B2 Light emitting device with light emitting cells arrayed 有权
标题翻译：具有排列发光单元的发光装置
公开(公告)号：US08054002B2
公开(公告)日：2011-11-08
申请号：US12088906
申请日：2006-12-05
申请人： Jae Ho Lee , Yeo Jin Yoon , Eu Jin Hwang , Lacroix Yves
发明人： Jae Ho Lee , Yeo Jin Yoon , Eu Jin Hwang , Lacroix Yves
IPC分类号： H05B37/22
CPC分类号： H05B33/0821 , H01L24/37 , H01L24/40 , H01L27/156 , H01L33/62 , H01L2224/371 , H01L2224/40137 , H01L2924/00014 , H01L2924/12041 , H05B33/0803 , H05B33/0809 , Y02B20/348 , H01L2924/00 , H01L2224/37099 , H01L2224/84
摘要： The present invention relates to a light emitting device. The light emitting device according to the present invention comprises a light emitting cell block having a plurality of light emitting cells; and a bridge rectifying circuit connected to input and output terminals of the light emitting cell block, wherein the bridge rectifying circuit includes a plurality of diodes between nodes. In manufacturing an AC light emitting device with a bridge rectifying circuit built therein, the present invention can provide a light emitting device capable of enhancing the reliability and luminance of the light emitting device by setting the size of diodes of the bridge rectifying circuit to be a certain size and controlling the number thereof.
摘要翻译：本发明涉及一种发光装置。根据本发明的发光器件包括具有多个发光单元的发光单元块; 以及连接到所述发光单元块的输入和输出端子的桥式整流电路，其中所述桥式整流电路在节点之间包括多个二极管。在制造其中内置有桥式整流电路的交流发光装置的情况下，本发明可以提供一种通过将桥式整流电路的二极管的尺寸设定为一个可以提高发光装置的可靠性和亮度的发光装置一定的尺寸并控制其数量。

25. 发明申请

US20080210954A1 Alternating Current Light Emitting Device 有权
公开(公告)号：US20080210954A1
公开(公告)日：2008-09-04
申请号：US11995506
申请日：2006-08-08
申请人： Jae Ho Lee , Lacroix Yves
发明人： Jae Ho Lee , Lacroix Yves
IPC分类号： H01L33/00
CPC分类号： H01L27/153 , H01L33/62 , H01L2224/48091 , H01L2224/48137 , H01L2924/00014
摘要： The present invention relates to a light emitting device in which light emitting cells of a first light emitting cell block are connected in parallel to light emitting cells of a second light emitting cell block corresponding thereto. A light emitting device of the present invention comprises a substrate, and first and second light emitting cell blocks formed on the substrate and having a plurality of light emitting cells electrically connected in series to one another, respectively. Each of the light emitting cells has an N-electrode and a P-electrode. A P-electrode at one end of the first light emitting cell block is connected to an N-electrode at one end of the second light emitting cell block, and an N-electrode at the other end of the first light emitting cell block is connected to a P-electrode at the other end of the second light emitting cell block. The P-electrode of each of the light emitting cells of the first light emitting cell block and the P-electrode of each of the light emitting cells of the second light emitting cell block corresponding thereto, or the N-electrode of each of the light emitting cells of the first light emitting cell block and the N-electrode of each of the light emitting cells of the second light emitting cell block corresponding thereto are electrically connected to each other. In the light emitting device of the present invention, the light emitting cells of the first light emitting cell block and the light emitting cells of the second light emitting cell block corresponding thereto are respectively connected in parallel so that a current can cross the light emitting cells of the first and second light emitting cell blocks. Thus, even though a leakage current occurs in some of light emitting cells, the current is allowed to cross light emitting cells connected in another direction, thereby preventing overload on some of the light emitting cells due to the leakage current and ensuring uniform light emission and prolonged life span in the AC light emitting device.

26. 发明申请

US20130140431A1 APPARATUS AND METHOD FOR MEASURING A LUMINESCENT DECAY 有权
标题翻译：用于测量发光衰减的装置和方法
公开(公告)号：US20130140431A1
公开(公告)日：2013-06-06
申请号：US13817062
申请日：2011-02-15
申请人： Lacroix Yves
发明人： Lacroix Yves
IPC分类号： G01N21/64 , G01N21/66
CPC分类号： G01N21/6408 , G01N21/6489 , G01N21/66 , G01N2021/1719 , G01R31/2656 , H01L22/12 , H01L2924/0002 , H01L2924/00
摘要： [Problem] An apparatus and method for measuring luminescence decay due to the lifetime of energy carriers inside a material such as a semiconductor is presented.[Solution] The intensity of a laser is modulated by a light modulating device resulting in a square wave excitation 14, and applied to a semiconducting material. The energy carriers inside the semiconductor are excited, and recombine after a certain time to give rise in part to some light emission 24, which decays in intensity from the time at which the excitation periods end. The decaying light is separated from the light emitted during excitation by another light modulator resulting in 26. This light intensity 26 contains the information related to the carrier lifetime. Because the amount of this light 26 is small and has a very short emission time, a CCD detector is used to be integrated several cycles of the decay periods in order to obtain a reasonable signal. This integrated intensity signal can be used to determine the carrier lifetime.
摘要翻译： [问题]提出了一种用于测量由诸如半导体的材料内的能量载体的寿命引起的发光衰减的装置和方法。 [解决方案]激光的强度由光调制装置调制，导致方波激励14，并施加到半导体材料。半导体内的能量载体被激发，并且在一定时间之后复合以部分地产生一些发光24，其从激发周期结束的时间开始强度衰减。衰减的光与由激发期间由另一个光调制器产生的光发射的光分离，导致26。该光强度26包含与载流子寿命有关的信息。由于该光26的量很小并且发射时间非常短，所以使用CCD检测器来集成几个衰减周期的周期，以获得合理的信号。该积分强度信号可用于确定载体寿命。

27. 发明授权

US08350276B2 Alternating current light emitting device 有权
标题翻译：交流发光装置
公开(公告)号：US08350276B2
公开(公告)日：2013-01-08
申请号：US11995506
申请日：2006-08-08
申请人： Jae Ho Lee , Lacroix Yves
发明人： Jae Ho Lee , Lacroix Yves
IPC分类号： H01L29/18 , H01L33/00 , H01L23/48 , H01L23/52 , H01L29/40
CPC分类号： H01L27/153 , H01L33/62 , H01L2224/48091 , H01L2224/48137 , H01L2924/00014
摘要： The present invention relates to a light emitting device. In the light emitting device of the present invention, light emitting cells of a first light emitting cell block and light emitting cells of a second light emitting cell block corresponding thereto are connected in parallel so that a current can cross the light emitting cells of the first and second light emitting cell blocks. Thus, even though a leakage current occurs in some of light emitting cells, the current is allowed to cross light emitting cells connected in another direction, thereby preventing overload on some of the light emitting cells due to the leakage current and ensuring uniform light emission and prolonged life span in the AC light emitting device.
摘要翻译：本发明涉及一种发光装置。在本发明的发光装置中，第一发光单元块的发光单元和与其对应的第二发光单元块的发光单元并联连接，使得电流可以跨越第一发光单元的发光单元和第二发光单元块。因此，即使在一些发光单元中发生泄漏电流，允许电流跨越在另一个方向上连接的发光单元，从而防止由于泄漏电流而导致的一些发光单元的过载并且确保均匀的发光和 AC发光装置的使用寿命延长。

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