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    • 24. 发明授权
    • Transport subsystem for an MBIST chain architecture
    • 用于MBIST链架构的传输子系统
    • US08046643B2
    • 2011-10-25
    • US12183512
    • 2008-07-31
    • Alexandre AndreevAnatoli BolotovMikhail Grinchuk
    • Alexandre AndreevAnatoli BolotovMikhail Grinchuk
    • G11C29/00G01R31/28
    • G11C29/48G11C29/1201G11C29/26G11C29/32G11C2029/2602G11C2029/5602
    • An apparatus including a controller configured to present one or more commands and receive one or more responses, a plurality of transport circuits configured to receive one of the commands, present the responses, and generate one or more control signals, and a plurality of memory-controlling circuits, each coupled to a respective one of the plurality of transport circuits and configured to generate one or more memory access signals in response to the one or more control signals, receive one or more memory output signals from a respective memory in response to the one or more memory access signals, and generate the responses in response to the one or more memory output signals. Each respective memory may be independently sized. The controller generally provides a common testing routine for each respective memory that may be adjusted for the size of each respective memory by the memory-controlling circuits.
    • 一种装置,包括:控制器,被配置为呈现一个或多个命令并接收一个或多个响应;多个传输电路,被配置为接收命令中的一个,呈现响应,并产生一个或多个控制信号;以及多个存储器 - 控制电路,每个耦合到所述多个传输电路中的相应一个,并被配置为响应于所述一个或多个控制信号而产生一个或多个存储器访问信号,响应于所述控制电路响应于所述控制电路接收来自相应存储器的一个或多个存储器输出信号 一个或多个存储器访问信号,并且响应于一个或多个存储器输出信号而产生响应。 各个存储器可以独立地定尺寸。 控制器通常为每个相应的存储器提供通用的测试程序,这些存储器可以通过存储器控制电路为每个相应的存储器的大小进行调整。