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    • 11. 发明授权
    • Method for electroplated metal annealing process
    • 电镀金属退火方法
    • US06827835B2
    • 2004-12-07
    • US10105313
    • 2002-03-26
    • Neng-Hui YangKuo Feng HuangTsung-Tang Hsieh
    • Neng-Hui YangKuo Feng HuangTsung-Tang Hsieh
    • C25D548
    • H01L21/76883C25D5/50C25D7/12H01L21/2885
    • A method for electroplated metal annealing process. First, a semiconductor structure is provided, wherein the semiconductor structure has a plurality of semiconductor components, such as a gate electrode, a source region and a drain region, and a field oxide region. Second, a dielectric layer is formed over the semiconductor structure, and a via which exposes a part of the semiconductor structure is formed in the dielectric layer by the use of conventional lithographic and etching processes and an electroplated metal layer is formed over the dielectric layer; meanwhile, the via is filled with the electroplated metal layer. The electroplated metal layer is then annealed by a NH3 plasma process performed by plasma enhanced chemical vapor deposition (PECVD).
    • 一种电镀金属退火工艺的方法。 首先,提供半导体结构,其中半导体结构具有多个半导体元件,例如栅电极,源极区和漏极区以及场氧化物区。 其次,在半导体结构上形成电介质层,并且通过使用常规的光刻和蚀刻工艺在电介质层中形成暴露一部分半导体结构的通孔,并且在电介质层上形成电镀金属层; 同时,通孔填充有电镀金属层。 然后通过等离子体增强化学气相沉积(PECVD)进行的NH 3等离子体处理使电镀金属层退火。
    • 12. 发明授权
    • Nitride layer forming methods
    • 氮化物层形成方法
    • US06589414B2
    • 2003-07-08
    • US09875502
    • 2001-06-04
    • Rita J. Klein
    • Rita J. Klein
    • C25D548
    • H01L21/76849C23C8/02H01L21/2885H01L21/76856H01L23/53238H01L23/53242H01L23/53252H01L2924/0002H01L2924/00
    • Nitride layer formation includes a method wherein a material is electrodeposited on a substrate and converted, at least in part, to a layer comprising nitrogen and the electrodeposited material. The electrodepositing may occur substantially selective on a conductive portion of the substrate. Also, the converting may comprise exposing the electrodeposited material to a nitrogen-comprising plasma. Chromium nitride and chromium oxynitride are examples of nitrogen-comprising materials. Copper or gold wiring of an integrated circuit are examples of a substrate. The processing temperature during the electrodepositing and the converting may be selected not to exceed 500° C. The thickness and composition of the nitride layer may be effective to limit diffusion of the wiring through the nitride layer. A diffusion barrier forming method may include forming a patterned layer of integrated circuit copper wiring over a substrate. The copper wiring may be exposed to a chromium-ion-comprising environment while applying an electric current to the copper wiring to deposit chromium on the copper wiring. The chromium may be converted to a chromium-nitride-comprising diffusion barrier using a nitrogen-comprising plasma.
    • 氮化物层形成包括其中将材料电沉积在基底上并且至少部分地转化成包含氮和电沉积材料的层的方法。 电沉积可以在基底的导电部分上基本上选择性地发生。 此外,转换可以包括将电沉积材料暴露于含氮等离子体。 氮化铬和氮氧化铬是含氮材料的实例。 集成电路的铜或金布线是基板的例子。 电沉积和转换期间的处理温度可以选择为不超过500℃。氮化物层的厚度和组成可以有效地限制布线通过氮化物层的扩散。 扩散阻挡层形成方法可以包括在衬底上形成集成电路铜布线的图案化层。 铜线可能暴露于含铬离子的环境中,同时向铜布线施加电流以在铜布线上沉积铬。 可以使用含氮等离子体将铬转化为含氮化铬的扩散阻挡层。