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    • 11. 发明授权
    • Method for evaluating quality of golf club head, method for conducting quality control of golf club head, method for manufacturing golf club head and golf club, golf club head, and golf club
    • 用于评估高尔夫球杆头质量的方法,用于进行高尔夫球杆头的质量控制的方法,制造高尔夫球杆头和高尔夫球杆的方法,高尔夫球杆头和高尔夫球杆
    • US07281417B2
    • 2007-10-16
    • US10411234
    • 2003-04-10
    • Hiroshi SaegusaKazunori Ono
    • Hiroshi SaegusaKazunori Ono
    • A63C53/00A63B53/00
    • A63B60/42A63B53/04A63B53/0466A63B2060/002
    • Evaluation of the durability or the coefficient of restitution of a golf club head 1 is performed by measuring a response signal of an impact surface 10 of a golf club head 1 when imparting a vibration to the impact surface 10, finding a value of the peak frequency of the first resonance frequency or the like located within a predetermined frequency range of the measured response signal, and finding the ratio of this peak frequency value with respect to a reference value. Further, control of the quality of the restitution characteristics in a initial state, or quality of the golf club head that deteriorates over time, is conducted by utilizing the evaluation results. The golf club head 1 is provided with a label 12 for displaying the peak frequency measured immediately after manufacture as an initial value. Further, in manufacturing a golf club, the quality of the golf club head immediately after manufacture is controlled by the peak frequency.
    • 高尔夫球杆头1的耐久性或恢复系数的评估是通过测量高尔夫球杆头1的冲击表面10的响应信号,当向冲击表面10施加振动时,发现峰值频率 位于所测量的响应信号的预定频率范围内的第一共振频率等,以及找到该峰值频率值相对于参考值的比率。 此外,通过利用评价结果来控制初始状态下的恢复特性的质量或高尔夫球杆头的质量随着时间变差而劣化。 高尔夫球杆头1设置有用于将制造后立即测量的峰值频率显示为初始值的标签12。 此外,在制造高尔夫球杆时,立即制造后的高尔夫球杆头的质量由峰值频率控制。
    • 12. 发明授权
    • Method of evaluating restitution characteristic of golf club, system for evaluating restitution characteristic, and golf club
    • 评估高尔夫球杆的恢复特性的方法,评估恢复特性的系统和高尔夫球杆
    • US07162913B2
    • 2007-01-16
    • US10187891
    • 2002-07-03
    • Hiroshi SaegusaKazunori Ono
    • Hiroshi SaegusaKazunori Ono
    • G01L5/00A63B53/00
    • G01N29/46A63B53/04A63B53/0466A63B60/42A63B2060/002G01N29/045
    • A method of evaluating restitution characteristics of a golf club head, a system for evaluating the restitution characteristics and a golf club, are provided in which a coefficient of restitution of a golf club head is inferred and obtained without disassembling the golf club by removing the golf club head away from a shaft and the coefficient of restitution may extremely easily be obtained for a short period of time. At first, an external force to a striking face of the golf club head is imparted to perform impact vibration. A response signal of the striking face under the impact vibration is acquired to obtain a resonant frequency of the striking face. A coefficient of restitution is calculated from the resonant frequency when the golf ball is struck by the striking face, whereby restitution characteristics of the golf club head are inferred and evaluated.
    • 提供了一种评估高尔夫球杆头的恢复特性的方法,用于评估恢复特性的系统和高尔夫球杆,其中通过移除高尔夫球杆来推断和获得高尔夫球杆头的恢复系数而不拆卸高尔夫球杆 球杆头远离轴,并且在短时间内可以非常容易地获得恢复系数。 首先,赋予高尔夫球杆头的击打面的外力进行冲击振动。 获取冲击振动下的打击面的响应信号,以获得击打面的共振频率。 当高尔夫球被击打面撞击时,从谐振频率计算恢复系数,由此推断和评估高尔夫球杆头的恢复特性。
    • 13. 发明申请
    • METHOD OF MANUFACTURING TRANSFER MASK AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
    • 制造转移掩模的方法和制造半导体器件的方法
    • US20110217635A1
    • 2011-09-08
    • US13122680
    • 2010-10-08
    • Masahiro HashimotoKazuya SakaiToshiyuki SuzukiKazunori Ono
    • Masahiro HashimotoKazuya SakaiToshiyuki SuzukiKazunori Ono
    • G03F1/00
    • G03F1/46G03F1/54G03F1/80G03F1/82
    • The present invention is a method of manufacturing a transfer mask with use of a mask blank in which a thin film for pattern formation and a chromium-based thin film made of a material containing chromium are stacked on a transparent substrate in this order. The thin film for pattern formation is made of material containing silicon and a transition metal other than chromium. The chromium-based thin film is made of a material containing chromium. Exposure light having a wavelength of 200 nm or less is applied to the transfer mask. In the manufacturing method, the transfer mask is produced by performing, in the following order, a process of forming a resist film having a transfer pattern on the chromium-based thin film, a process of forming a transfer pattern in the chromium-based thin film with use of a mask of the resist film having the transfer pattern, a process of forming a transfer pattern in the thin film for pattern formation with use of a mask of the chromium-based thin film having the transfer pattern, and a process of removing the chromium-based thin film by etching. The manufacturing method further includes a cleaning process of at least one of alkali solution cleaning, hot water cleaning, and ozone-containing water cleaning on the produced transfer mask until a width of the transfer pattern of the thin film for pattern formation is reduced by 4 nm or a space width of the thin film for pattern formation is increased by 4 nm.
    • 本发明是一种使用掩模坯料制造转印掩模的方法,其中用于图案形成的薄膜和由含铬材料制成的铬基薄膜依次层叠在透明基板上。 用于图案形成的薄膜由含有硅和除铬以外的过渡金属的材料制成。 铬基薄膜由含铬的材料制成。 将具有200nm以下波长的曝光光施加到转印掩模。 在制造方法中,通过以下顺序,通过在铬系薄膜上形成具有转印图案的抗蚀剂膜的工序来制造转印掩模,在铬系薄膜中形成转印图案的工序 使用具有转印图案的抗蚀剂膜的掩模的膜,使用具有转印图案的铬基薄膜的掩模在图案形成用薄膜中形成转印图案的工序,以及 通过蚀刻去除铬基薄膜。 该制造方法还包括在制造的转印掩模上进行碱溶液清洗,热水清洗和含臭氧水清洗中的至少一种的清洗处理,直到图案形成用薄膜的转印图案的宽度减少4 nm或用于图案形成的薄膜的空间宽度增加4nm。
    • 18. 发明授权
    • Method of manufacturing transfer mask and method of manufacturing semiconductor device
    • 传输掩模的制造方法和制造半导体器件的方法
    • US08197993B2
    • 2012-06-12
    • US13122680
    • 2010-10-08
    • Masahiro HashimotoKazuya SakaiToshiyuki SuzukiKazunori Ono
    • Masahiro HashimotoKazuya SakaiToshiyuki SuzukiKazunori Ono
    • G03F1/00B08B3/00
    • G03F1/46G03F1/54G03F1/80G03F1/82
    • The present invention is a method of manufacturing a transfer mask with use of a mask blank in which a thin film for pattern formation and a chromium-based thin film made of a material containing chromium are stacked on a transparent substrate in this order. The thin film for pattern formation is made of material containing silicon and a transition metal other than chromium. The chromium-based thin film is made of a material containing chromium. Exposure light having a wavelength of 200 nm or less is applied to the transfer mask. In the manufacturing method, the transfer mask is produced by performing, in the following order, a process of forming a resist film having a transfer pattern on the chromium-based thin film, a process of forming a transfer pattern in the chromium-based thin film with use of a mask of the resist film having the transfer pattern, a process of forming a transfer pattern in the thin film for pattern formation with use of a mask of the chromium-based thin film having the transfer pattern, and a process of removing the chromium-based thin film by etching. The manufacturing method further includes a cleaning process of at least one of alkali solution cleaning, hot water cleaning, and ozone-containing water cleaning on the produced transfer mask until a width of the transfer pattern of the thin film for pattern formation is reduced by 4 nm or a space width of the thin film for pattern formation is increased by 4 nm.
    • 本发明是一种使用掩模坯料制造转印掩模的方法,其中用于图案形成的薄膜和由含铬材料制成的铬基薄膜依次层叠在透明基板上。 用于图案形成的薄膜由含有硅和除铬以外的过渡金属的材料制成。 铬基薄膜由含铬的材料制成。 将具有200nm以下波长的曝光光施加到转印掩模。 在制造方法中,通过以下顺序,通过在铬系薄膜上形成具有转印图案的抗蚀剂膜的工序来制造转印掩模,在铬系薄膜中形成转印图案的工序 使用具有转印图案的抗蚀剂膜的掩模的膜,使用具有转印图案的铬基薄膜的掩模在图案形成用薄膜中形成转印图案的工序,以及 通过蚀刻去除铬基薄膜。 该制造方法还包括在制造的转印掩模上进行碱溶液清洗,热水清洗和含臭氧水清洗中的至少一种的清洗处理,直到图案形成用薄膜的转印图案的宽度减少4 nm或用于图案形成的薄膜的空间宽度增加4nm。