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11. 发明申请

US20090224309A1 NONVOLATILE SEMICONDUCTOR STORAGE DEVICE AND MANUFACTURING METHOD THEREOF 有权
标题翻译：非易失性半导体存储器件及其制造方法
公开(公告)号：US20090224309A1
公开(公告)日：2009-09-10
申请号：US12389977
申请日：2009-02-20
申请人： Masaru Kidoh , Masaru Kito , Ryota Katsumata , Yoshiaki Fukuzumi , Hiroyasu Tanaka , Megumi Ishiduki , Yosuke Komori , Hideaki Aochi , Yasuyuki Matsuoka
发明人： Masaru Kidoh , Masaru Kito , Ryota Katsumata , Yoshiaki Fukuzumi , Hiroyasu Tanaka , Megumi Ishiduki , Yosuke Komori , Hideaki Aochi , Yasuyuki Matsuoka
IPC分类号： H01L29/792 , H01L21/20 , H01L21/336
CPC分类号： H01L27/11578 , H01L21/8221 , H01L27/11573 , H01L27/11575 , H01L27/11582
摘要： A method for manufacturing a nonvolatile semiconductor storage device, including: forming a first conductive layer so that it is sandwiched in an up-down direction by first insulating layers; forming a first hole so that it penetrates the first insulating layers and the first conductive layer; forming a first side wall insulating layer on a side wall facing the first hole; forming a sacrificing layer so that the sacrificing layer infills the first hole; forming a second conductive layer on an upper layer of the sacrificing layer so that the second conductive layer is sandwiched by the second insulating layer in an up-down direction; forming a second hole on a position which matches with the first hole so that the second hole penetrates the second insulating layer and the second conductive layer; forming a second side wall insulating layer on a side wall facing the second hole; removing the sacrificing layer after the formation of the second side wall insulating layer; and forming a semiconductor layer so that the semiconductor layer infills the first hole and the second hole after the removal of the sacrificing layer
摘要翻译：一种制造非易失性半导体存储装置的方法，包括：形成第一导电层，使其通过第一绝缘层沿上下方向夹持; 形成第一孔，使其穿透第一绝缘层和第一导电层; 在面向所述第一孔的侧壁上形成第一侧壁绝缘层; 形成牺牲层，使牺牲层填充第一孔; 在牺牲层的上层上形成第二导电层，使得第二导电层在上下方向上被第二绝缘层夹持; 在与所述第一孔匹配的位置上形成第二孔，使得所述第二孔穿过所述第二绝缘层和所述第二导电层; 在面向所述第二孔的侧壁上形成第二侧壁绝缘层; 在形成第二侧壁绝缘层之后去除牺牲层; 以及形成半导体层，使得半导体层在去除牺牲层之后填充第一孔和第二孔

12. 发明申请

US20090101969A1 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME 失效
标题翻译：半导体器件及其制造方法
公开(公告)号：US20090101969A1
公开(公告)日：2009-04-23
申请号：US12248577
申请日：2008-10-09
申请人： Ryota KATSUMATA , Masaru Kito , Yoshiaki Fukuzumi , Masaru Kidoh , Hiroyasu Tanaka , Hideaki Aochi , Yasuyuki Matsuoka
发明人： Ryota KATSUMATA , Masaru Kito , Yoshiaki Fukuzumi , Masaru Kidoh , Hiroyasu Tanaka , Hideaki Aochi , Yasuyuki Matsuoka
IPC分类号： H01L29/78 , H01L21/336
CPC分类号： H01L29/0847 , H01L29/0657 , H01L29/0692 , H01L29/4238 , H01L29/66666 , H01L29/7827 , H01L2924/0002 , H01L2924/00
摘要： A semiconductor device comprising: a semiconductor substrate; a first conductive layer provided on a surface of the substrate and serving as one of a source and a drain; a first insulating film provided on the first conductive layer; a gate electrode film provided on the first insulating film; a second insulating film provided on the gate electrode film; a gate opening provided so as to penetrate the second insulating film, the gate electrode film and the first insulating film to expose a part of the first conductive layer; a recess provided in the surface of the first conductive layer just below the gate opening; a gate insulator provided on the side surface of the gate opening and having a projecting shape at a portion between the first insulating film and the recess; a second conductive layer buried in the recess and in a bottom of the gate opening so as to be in contact with the gate insulator, and serving as the one of the source and the drain while being in contact with the first conductive layer; a channel which is buried in the gate opening above the second conductive layer so as to face the gate electrode film with the gate insulator therebetween, and which has a channel layer generated therein, the channel layer allowing majority carriers to flow between the source and the drain in response to a voltage applied to the gate; and a third conductive layer buried in the gate opening above the channel so as to be in contact with the gate insulator to serve as the other one of the source and the drain.
摘要翻译：一种半导体器件，包括：半导体衬底; 设置在所述基板的表面上并用作源极和漏极之一的第一导电层; 设置在所述第一导电层上的第一绝缘膜; 设置在所述第一绝缘膜上的栅电极膜; 设置在栅电极膜上的第二绝缘膜; 设置为穿透第二绝缘膜的栅极开口，栅极电极膜和第一绝缘膜，以暴露第一导电层的一部分; 设置在所述第一导电层的位于所述栅极开口正下方的表面中的凹部; 栅极绝缘体，其设置在所述栅极开口的侧表面上，并且在所述第一绝缘膜和所述凹部之间的部分处具有突出形状; 第二导电层，其被埋置在所述凹部中并且位于所述栅极开口的底部以与所述栅极绝缘体接触，并且在与所述第一导电层接触的同时用作所述源极和漏极中的一个; 埋入在第二导电层上方的栅极开口中以与门极绝缘体相对的栅极电极膜并且其中产生沟道层的沟道，该沟道层允许多数载流子在源极和源极之间流动响应于施加到门的电压而漏极; 以及掩埋在沟道上方的栅极开口中的第三导电层，以便与栅极绝缘体接触以用作源极和漏极中的另一个。

13. 发明申请

US20080315291A1 NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND METHOD OF MANUFACTURING THE SAME 有权
标题翻译：非易失性半导体存储器件及其制造方法
公开(公告)号：US20080315291A1
公开(公告)日：2008-12-25
申请号：US12140734
申请日：2008-06-17
申请人： Masaru KITO , Hideaki Aochi , Ryota Katsumata , Masaru Kidoh , Hiroyasu Tanaka , Yoshiaki Fukuzumi , Yasuyuki Matsuoka
发明人： Masaru KITO , Hideaki Aochi , Ryota Katsumata , Masaru Kidoh , Hiroyasu Tanaka , Yoshiaki Fukuzumi , Yasuyuki Matsuoka
IPC分类号： H01L29/00 , H01L21/31
CPC分类号： H01L27/105 , H01L21/02161 , H01L21/02164 , H01L21/0217 , H01L21/31645 , H01L27/11568 , H01L27/11578 , H01L27/11582 , H01L29/66833 , H01L29/792 , H01L29/7926
摘要： A nonvolatile semiconductor memory device has a plurality of memory strings each including a plurality of electrically rewritable memory cells serially connected. The memory string includes a columnar semiconductor portion extending in the vertical direction from a substrate, a first charge storage layer formed adjacent to the columnar semiconductor portion and configured to accumulate charge, a first block insulator formed adjacent to the first charge storage layer, and a first conductor formed adjacent to the first block insulator.
摘要翻译：非易失性半导体存储器件具有多个存储串，每个存储串包括串联连接的多个电可重写存储器单元。存储器串包括从基板沿垂直方向延伸的柱状半导体部分，与柱状半导体部分相邻形成并构成为积蓄电荷的第一电荷存储层，与第一电荷存储层相邻形成的第一块绝缘体，第一导体与第一块绝缘体相邻形成。

14. 发明申请

US20080180994A1 MEMORY SYSTEM, SEMICONDUCTOR MEMORY DEVICE AND METHOD OF DRIVING SAME 有权
标题翻译：存储器系统，半导体存储器件及其驱动方法
公开(公告)号：US20080180994A1
公开(公告)日：2008-07-31
申请号：US11955900
申请日：2007-12-13
申请人： Ryota Katsumata , Masaru Kidoh , Hiroyasu Tanaka , Masaru Kito , Hideaki Aochi , Yoshiaki Fukuzumi , Yasuyuki Matsuoka
发明人： Ryota Katsumata , Masaru Kidoh , Hiroyasu Tanaka , Masaru Kito , Hideaki Aochi , Yoshiaki Fukuzumi , Yasuyuki Matsuoka
IPC分类号： G11C11/34 , H01L29/76 , G11C8/00
CPC分类号： H01L27/115 , G11C7/18 , G11C8/08 , H01L27/11526 , H01L27/11529
摘要： A semiconductor memory device has a semiconductor substrate, first select transistors formed on the surface of said semiconductor substrate, first dummy transistors formed above said first select transistors, a plurality of memory cell transistors formed above said first dummy transistors so as to extend in a direction perpendicular to the surface of said semiconductor substrate, each of said memory cell transistor including an insulating layer having a charge-accumulating function, second dummy transistors formed above said memory cell transistors, and second select transistors formed above said second dummy transistors; wherein a first potential is provided to the gate electrodes of said first select transistors and the gate electrodes of said first dummy transistors and a second potential is provided to the gate electrodes of said second select transistors and the gate electrodes of said second dummy transistors at the time of write operation to write data to said memory cell transistors.
摘要翻译：半导体存储器件具有半导体衬底，形成在所述半导体衬底的表面上的第一选择晶体管，形成在所述第一选择晶体管上方的第一虚拟晶体管，形成在所述第一虚拟晶体管上方的多个存储单元晶体管，垂直于所述半导体衬底的表面，每个所述存储单元晶体管包括具有电荷累积功能的绝缘层，形成在所述存储单元晶体管上方的第二虚拟晶体管以及形成在所述第二虚设晶体管上方的第二选择晶体管; 其中第一电位被提供给所述第一选择晶体管的栅电极和所述第一虚拟晶体管的栅电极，并且第二电位被提供给所述第二选择晶体管的栅极和所述第二虚设晶体管的栅电极写入操作的时间将数据写入到所述存储单元晶体管。

15. 发明申请

US20070252201A1 Nonvolatile semiconductor memory device and manufacturing method thereof 有权
标题翻译：非易失性半导体存储器件及其制造方法
公开(公告)号：US20070252201A1
公开(公告)日：2007-11-01
申请号：US11654551
申请日：2007-01-18
申请人： Masaru Kito , Hideaki Aochi , Ryota Katsumata , Akihiro Nitayama , Masaru Kidoh , Hiroyasu Tanaka , Yoshiaki Fukuzumi , Yasuyuki Matsuoka , Mitsuru Sato
发明人： Masaru Kito , Hideaki Aochi , Ryota Katsumata , Akihiro Nitayama , Masaru Kidoh , Hiroyasu Tanaka , Yoshiaki Fukuzumi , Yasuyuki Matsuoka , Mitsuru Sato
IPC分类号： H01L29/76
CPC分类号： H01L27/11582 , G11C16/0483 , H01L21/8221 , H01L27/0688 , H01L27/105 , H01L27/115 , H01L27/11556 , H01L27/11573 , H01L27/11578
摘要： A nonvolatile semiconductor memory device that have a new structure are provided, in which memory cells are laminated in a three dimensional state so that the chip area may be reduced. The nonvolatile semiconductor memory device of the present invention is a nonvolatile semiconductor memory device that has a plurality of the memory strings, in which a plurality of electrically programmable memory cells is connected in series. The memory strings comprise a pillar shaped semiconductor; a first insulation film formed around the pillar shaped semiconductor; a charge storage layer formed around the first insulation film; the second insulation film formed around the charge storage layer; and first or nth electrodes formed around the second insulation film (n is natural number more than 1). The first or nth electrodes of the memory strings and the other first or nth electrodes of the memory strings are respectively the first or nth conductor layers that are spread in a two dimensional state.
摘要翻译：提供了具有新结构的非易失性半导体存储器件，其中以三维状态层叠存储单元，从而可以减小芯片面积。本发明的非易失性半导体存储装置是具有串联连接有多个电可编程存储单元的多个存储串的非易失性半导体存储装置。存储器串包括柱形半导体; 形成在柱状半导体周围的第一绝缘膜; 形成在所述第一绝缘膜周围的电荷存储层; 形成在电荷存储层周围的第二绝缘膜; 并且形成在第二绝缘膜周围的第一或第n电极（n是大于1的自然数）。存储器串的第一或第n电极和存储器串的其它第一或第n电极分别是以二维状态扩展的第一或第n导体层。

16. 发明授权

US08193571B2 Stacked type nonvolatile semiconductor memory device and method of manufacturing same 有权
标题翻译：堆叠型非易失性半导体存储器件及其制造方法
公开(公告)号：US08193571B2
公开(公告)日：2012-06-05
申请号：US12542276
申请日：2009-08-17
申请人： Ryota Katsumata , Masaru Kito , Yoshiaki Fukuzumi , Masaru Kidoh , Hiroyasu Tanaka , Megumi Ishiduki , Yosuke Komori , Hideaki Aochi , Yasuyuki Matsuoka
发明人： Ryota Katsumata , Masaru Kito , Yoshiaki Fukuzumi , Masaru Kidoh , Hiroyasu Tanaka , Megumi Ishiduki , Yosuke Komori , Hideaki Aochi , Yasuyuki Matsuoka
IPC分类号： H01L29/10 , H01L21/336
CPC分类号： H01L27/11578 , H01L27/11565 , H01L27/11575 , H01L27/11582 , H01L29/66833 , H01L29/792 , H01L29/7926
摘要： A stacked body is formed on a silicon substrate by stacking a plurality of insulating films and a plurality of electrode films alternately and through-holes are formed to extend in the stacking direction. Next, gaps are formed between the electrode films using etching the insulating films via the through-holes. Charge storage layers are formed along side faces of the through-holes and inner faces of the gaps, and silicon pillars are filled into the through-holes. Thereby, a nonvolatile semiconductor memory device is manufactured.
摘要翻译：通过交替堆叠多个绝缘膜和多个电极膜，在硅基板上形成层叠体，并且形成贯通孔，以在层叠方向上延伸。接下来，通过通孔蚀刻绝缘膜，在电极膜之间形成间隙。电荷存储层沿着通孔的侧面和间隙的内表面形成，硅柱填充到通孔中。由此，制造非易失性半导体存储器件。

17. 发明授权

US08178917B2 Non-volatile semiconductor storage device having memory cells disposed three-dimensionally, and method of manufacturing the same 有权
标题翻译：具有三维配置存储单元的非易失性半导体存储装置及其制造方法
公开(公告)号：US08178917B2
公开(公告)日：2012-05-15
申请号：US12408249
申请日：2009-03-20
申请人： Hiroyasu Tanaka , Ryota Katsumata , Masaru Kito , Yoshiaki Fukuzumi , Masaru Kidoh , Yosuke Komori , Hideaki Aochi , Megumi Ishiduki , Yasuyuki Matsuoka
发明人： Hiroyasu Tanaka , Ryota Katsumata , Masaru Kito , Yoshiaki Fukuzumi , Masaru Kidoh , Yosuke Komori , Hideaki Aochi , Megumi Ishiduki , Yasuyuki Matsuoka
IPC分类号： H01L29/792
CPC分类号： H01L27/11578 , H01L27/105 , H01L27/115 , H01L27/11573 , H01L27/11582
摘要： A non-volatile semiconductor storage device includes a first layer and a second layer. The first layer includes: a plurality of first conductive layers extending in parallel to a substrate and laminated in a direction perpendicular to the substrate; a first insulation layer formed on an upper layer of the plurality of first conductive layers; a first semiconductor layer formed to penetrate the plurality of first conductive layers; and a charge accumulation layer formed between the first conductive layers and the first semiconductor layer. Respective ends of the first conductive layers are formed in a stepwise manner in relation to each other in a first direction. The second layer includes: a plurality of second conductive layers extending in parallel to the substrate and laminated in a direction perpendicular to the substrate, the second conductive layers being formed in the same layer as the plurality of first conductive layers; and a second insulation layer formed on an upper layer of the plurality of second conductive layers. Respective ends of the second conductive layers are formed to align along a straight line extending in a direction substantially perpendicular to the substrate at a predetermined area.
摘要翻译：非易失性半导体存储装置包括第一层和第二层。第一层包括：多个第一导电层，其平行于衬底延伸并且在垂直于衬底的方向上层压; 形成在所述多个第一导电层的上层上的第一绝缘层; 形成为穿透所述多个第一导电层的第一半导体层; 以及形成在第一导电层和第一半导体层之间的电荷累积层。第一导电层的相应端部在第一方向上相对于彼此以逐步的方式形成。第二层包括：多个第二导电层，其平行于衬底延伸并且在垂直于衬底的方向上层叠，第二导电层形成在与多个第一导电层相同的层中; 以及形成在所述多个第二导电层的上层上的第二绝缘层。形成第二导电层的相应端，沿着在预定区域上基本上垂直于衬底的方向延伸的直线对齐。

18. 发明授权

US08154103B2 Semiconductor device 有权
标题翻译：半导体器件
公开(公告)号：US08154103B2
公开(公告)日：2012-04-10
申请号：US12972243
申请日：2010-12-17
申请人： Hiroyasu Tanaka , Hideaki Aochi , Ryota Katsumata , Masaru Kidoh , Yoshiaki Fukuzumi , Masaru Kito , Yasuyuki Matsuoka
发明人： Hiroyasu Tanaka , Hideaki Aochi , Ryota Katsumata , Masaru Kidoh , Yoshiaki Fukuzumi , Masaru Kito , Yasuyuki Matsuoka
IPC分类号： H01L29/00 , H01L21/76
CPC分类号： H01L29/792 , H01L21/28282 , H01L27/11578 , H01L27/11582 , H01L29/0649 , H01L29/7923 , H01L29/7926
摘要： A semiconductor device has a substrate, a source region formed on the surface portion of the substrate, a first insulating layer formed on the substrate, a gate electrode formed on the first insulating layer, a second insulating layer formed on the gate electrode, a body section connected with the source region, penetrating through the first insulating layer, the gate electrode and the second insulating layer, and containing a void, a gate insulating film surrounding the body section, and formed between the body section and the gate electrode, and a drain region connected with the body section.
摘要翻译：半导体器件具有衬底，形成在衬底的表面部分上的源极区域，形成在衬底上的第一绝缘层，形成在第一绝缘层上的栅电极，形成在栅电极上的第二绝缘层，主体与源极区域连接，穿过第一绝缘层，栅电极和第二绝缘层，并且包含空隙，围绕主体部分的栅极绝缘膜，并且形成在主体部分和栅电极之间，并且漏极区域与主体部分连接。

19. 发明申请

US20110111579A1 NON-VOLATILE SEMICONDUCTOR STORAGE DEVICE AND METHOD OF MANUFACTURING THE SAME 有权
标题翻译：非挥发性半导体存储器件及其制造方法
公开(公告)号：US20110111579A1
公开(公告)日：2011-05-12
申请号：US13010466
申请日：2011-01-20
申请人： Masaru Kito , Ryota Katsumata , Yoshiaki Fukuzumi , Masaru Kidoh , Hiroyasu Tanaka , Hideaki Aochi , Yasuyuki Matsuoka
发明人： Masaru Kito , Ryota Katsumata , Yoshiaki Fukuzumi , Masaru Kidoh , Hiroyasu Tanaka , Hideaki Aochi , Yasuyuki Matsuoka
IPC分类号： H01L21/20
CPC分类号： H01L27/11578 , H01L21/8221 , H01L27/0688 , H01L27/11573 , H01L27/11582 , H01L29/66833 , H01L29/7923 , H01L29/7926
摘要： A non-volatile semiconductor storage device has a plurality of memory strings with a plurality of electrically rewritable memory cells connected in series. Each of the memory strings includes: a memory columnar semiconductor extending in a direction perpendicular to a substrate; a tunnel insulation layer contacting the memory columnar semiconductor; a charge accumulation layer contacting the tunnel insulation layer and accumulating charges; a block insulation layer contacting the charge accumulation layer; and a plurality of memory conductive layers contacting the block insulation layer. The lower portion of the charge accumulation layer is covered by the tunnel insulation layer and the block insulation layer.
摘要翻译：非易失性半导体存储装置具有多个具有串联连接的多个电可重写存储单元的存储器串。每个存储器串包括：在垂直于衬底的方向上延伸的存储器柱状半导体; 与记录柱状半导体接触的隧道绝缘层; 与隧道绝缘层接触并积累电荷的电荷累积层; 与电荷累积层接触的块绝缘层; 以及与块绝缘层接触的多个存储器导电层。电荷累积层的下部被隧道绝缘层和块绝缘层覆盖。

20. 发明授权

US07927926B2 Non-volatile semiconductor storage device and method of manufacturing the same 有权
标题翻译：非易失性半导体存储装置及其制造方法
公开(公告)号：US07927926B2
公开(公告)日：2011-04-19
申请号：US12908546
申请日：2010-10-20
申请人： Ryota Katsumata , Masaru Kito , Hiroyasu Tanaka , Masaru Kidoh , Yoshiaki Fukuzumi , Hideaki Aochi , Yasuyuki Matsuoka
发明人： Ryota Katsumata , Masaru Kito , Hiroyasu Tanaka , Masaru Kidoh , Yoshiaki Fukuzumi , Hideaki Aochi , Yasuyuki Matsuoka
IPC分类号： H01L21/82
CPC分类号： H01L21/764 , H01L27/11551 , H01L27/11556 , H01L27/11575 , H01L27/11578
摘要： A non-volatile semiconductor storage device has a plurality of memory strings with a plurality of electrically rewritable memory cells connected in series. Each of the memory strings comprises: a first columnar semiconductor layer extending in a vertical direction to a substrate; a charge accumulation layer formed around the first columnar semiconductor layer via a first insulation layer; and a first conductive layer formed around the charge accumulation layer via a second insulation layer. Each of the first conductive layers is formed to expand in a two-dimensional manner, and air gaps are formed between the first conductive layers located there above and there below.
摘要翻译：非易失性半导体存储装置具有多个具有串联连接的多个电可重写存储单元的存储器串。每个存储器串包括：沿垂直方向延伸到衬底的第一柱状半导体层; 电荷累积层，经由第一绝缘层形成在第一柱状半导体层周围; 以及经由第二绝缘层形成在电荷累积层周围的第一导电层。每个第一导电层被形成为以二维方式膨胀，并且在位于其上方和下方的第一导电层之间形成气隙。

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