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11. 发明申请

US20120198293A1 STORAGE DEVICE AND METHOD FOR CONTROLLING STORAGE DEVICE 有权
标题翻译：存储装置和用于控制存储装置的方法
公开(公告)号：US20120198293A1
公开(公告)日：2012-08-02
申请号：US13446034
申请日：2012-04-13
申请人： Minoru Mukai , Kenji Hirohata , Tomoko Monda
发明人： Minoru Mukai , Kenji Hirohata , Tomoko Monda
IPC分类号： G11C29/08 , G06F11/26
CPC分类号： H05K3/341 , H05K3/3436 , H05K2201/10151 , H05K2201/10159 , H05K2203/163 , Y02P70/613
摘要： A storage device includes: a printed circuit board; a semiconductor memory package mounted on the printed circuit board via solder joints, the semiconductor memory package incorporating semiconductor memories; a sensor configured to measure a physical quantity relating to a state of the storage device; a database including a damage estimation model base to be used for estimating damage of the solder joints from the physical quantity measured by the sensor; a damage estimating module configured to calculate a damage estimation value of the solder joints from the physical quantity using the damage estimation model base; and a controller configured to control writing, reading, and erasure of electronic data to or from the semiconductor memories based on the damage estimation values calculated by the damage estimating module.
摘要翻译：存储装置包括：印刷电路板; 半导体存储器封装，其通过焊点安装在所述印刷电路板上，所述半导体存储器封装结合有半导体存储器; 被配置为测量与所述存储装置的状态有关的物理量的传感器; 数据库，包括用于从传感器测量的物理量估计焊点的损坏的损伤估计模型库; 损伤估计模块，被配置为使用所述损伤估计模型基础从所述物理量计算所述焊点的损伤估计值; 以及控制器，其被配置为基于由所述损伤估计模块计算出的损伤估计值来控制对所述半导体存储器的电子数据的写入，读取和擦除。

12. 发明申请

US20100070204A1 DAMAGE INDEX PREDICTING SYSTEM AND METHOD FOR PREDICTING DAMAGE-RELATED INDEX 有权
标题翻译：损伤指标预测系统和预测损害相关指标的方法
公开(公告)号：US20100070204A1
公开(公告)日：2010-03-18
申请号：US12505758
申请日：2009-07-20
申请人： Tomoko Monda , Minoru Mukai , Kenji Hirohata
发明人： Tomoko Monda , Minoru Mukai , Kenji Hirohata
IPC分类号： G06F19/00
CPC分类号： H05K3/3436 , H05K1/0268 , H05K2201/10204 , H05K2201/10522 , H05K2201/10545 , H05K2203/163 , Y02P70/613
摘要： A damage index predicting system is for predicting a damage-related index of solder joints of an electronic device having the solder joints that electrically connect an electronic component to a mounting circuit board and one or more detection solder joints that are designed so as to have a shorter life than the solder joints. The system includes: a database configured to store a fracture relationship between the detection solder joints and the solder joints; a fracture detector configured to detect fracture of the detection solder joints; and a processor configured to calculate a prediction value of the damage-related index of the solder joints based on information relating to the fracture of the detection solder joints obtained by the fracture detector and the fracture relationship stored in the database.
摘要翻译：损伤指数预测系统用于预测具有将电子部件电连接到安装电路板的焊点与一个或多个检测焊点的电子器件的焊点的损伤相关指数，该检测焊点被设计成具有寿命比焊点短。该系统包括：数据库，配置为存储检测焊点和焊点之间的断裂关系; 断裂检测器，被配置为检测所述检测焊点的断裂; 以及处理器，其被配置为基于与通过裂缝检测器获得的检测焊点的断裂有关的信息和存储在数据库中的断裂关系来计算焊点的损伤相关指数的预测值。

13. 发明授权

US08482998B2 Storage device and method for controlling storage device 有权
标题翻译：用于控制存储设备的存储设备和方法
公开(公告)号：US08482998B2
公开(公告)日：2013-07-09
申请号：US13446034
申请日：2012-04-13
申请人： Minoru Mukai , Kenji Hirohata , Tomoko Monda
发明人： Minoru Mukai , Kenji Hirohata , Tomoko Monda
IPC分类号： G11C7/00
CPC分类号： H05K3/341 , H05K3/3436 , H05K2201/10151 , H05K2201/10159 , H05K2203/163 , Y02P70/613
摘要： A storage device includes: a printed circuit board; a semiconductor memory package mounted on the printed circuit board via solder joints, the semiconductor memory package incorporating semiconductor memories; a sensor configured to measure a physical quantity relating to a state of the storage device; a database including a damage estimation model base to be used for estimating damage of the solder joints from the physical quantity measured by the sensor; a damage estimating module configured to calculate a damage estimation value of the solder joints from the physical quantity using the damage estimation model base; and a controller configured to control writing, reading, and erasure of electronic data to or from the semiconductor memories based on the damage estimation values calculated by the damage estimating module.
摘要翻译：存储装置包括：印刷电路板; 半导体存储器封装，其通过焊点安装在所述印刷电路板上，所述半导体存储器封装结合有半导体存储器; 被配置为测量与所述存储装置的状态有关的物理量的传感器; 数据库，包括用于从传感器测量的物理量估计焊点的损坏的损伤估计模型库; 损伤估计模块，被配置为使用所述损伤估计模型基础从所述物理量计算所述焊点的损伤估计值; 以及控制器，其被配置为基于由所述损伤估计模块计算出的损伤估计值来控制对所述半导体存储器的电子数据的写入，读取和擦除。

14. 发明授权

US08189412B2 Storage device and method for controlling storage device 有权
标题翻译：用于控制存储设备的存储设备和方法
公开(公告)号：US08189412B2
公开(公告)日：2012-05-29
申请号：US12509555
申请日：2009-07-27
申请人： Minoru Mukai , Kenji Hirohata , Tomoko Monda
发明人： Minoru Mukai , Kenji Hirohata , Tomoko Monda
IPC分类号： G11C29/00
CPC分类号： H05K3/341 , H05K3/3436 , H05K2201/10151 , H05K2201/10159 , H05K2203/163 , Y02P70/613
摘要： A storage device includes: a printed circuit board; a semiconductor memory package mounted on the printed circuit board via solder joints, the semiconductor memory package incorporating semiconductor memories; a sensor configured to measure a physical quantity relating to a state of the storage device; a database including a damage estimation model base to be used for estimating damage of the solder joints from the physical quantity measured by the sensor; a damage estimating module configured to calculate a damage estimation value of the solder joints from the physical quantity using the damage estimation model base; and a controller configured to control writing, reading, and erasure of electronic data to or from the semiconductor memories based on the damage estimation values calculated by the damage estimating module.
摘要翻译：存储装置包括：印刷电路板; 半导体存储器封装，其通过焊点安装在所述印刷电路板上，所述半导体存储器封装结合有半导体存储器; 被配置为测量与所述存储装置的状态有关的物理量的传感器; 数据库，包括用于从传感器测量的物理量估计焊点的损坏的损伤估计模型库; 损伤估计模块，被配置为使用所述损伤估计模型基础从所述物理量计算所述焊点的损伤估计值; 以及控制器，其被配置为基于由所述损伤估计模块计算出的损伤估计值来控制对所述半导体存储器的电子数据的写入，读取和擦除。

15. 发明申请

US20100082913A1 STORAGE DEVICE AND METHOD FOR CONTROLLING STORAGE DEVICE 有权
标题翻译：存储装置和用于控制存储装置的方法
公开(公告)号：US20100082913A1
公开(公告)日：2010-04-01
申请号：US12509555
申请日：2009-07-27
申请人： Minoru Mukai , Kenji Hirohata , Tomoko Monda
发明人： Minoru Mukai , Kenji Hirohata , Tomoko Monda
IPC分类号： G06F12/00 , G06F19/00
CPC分类号： H05K3/341 , H05K3/3436 , H05K2201/10151 , H05K2201/10159 , H05K2203/163 , Y02P70/613
摘要： A storage device includes: a printed circuit board; a semiconductor memory package mounted on the printed circuit board via solder joints, the semiconductor memory package incorporating semiconductor memories; a sensor configured to measure a physical quantity relating to a state of the storage device; a database including a damage estimation model base to be used for estimating damage of the solder joints from the physical quantity measured by the sensor; a damage estimating module configured to calculate a damage estimation value of the solder joints from the physical quantity using the damage estimation model base; and a controller configured to control writing, reading, and erasure of electronic data to or from the semiconductor memories based on the damage estimation values calculated by the damage estimating module.
摘要翻译：存储装置包括：印刷电路板; 半导体存储器封装，其通过焊点安装在所述印刷电路板上，所述半导体存储器封装结合有半导体存储器; 被配置为测量与所述存储装置的状态有关的物理量的传感器; 数据库，包括用于从传感器测量的物理量估计焊点的损坏的损伤估计模型库; 损伤估计模块，被配置为使用所述损伤估计模型基础从所述物理量计算所述焊点的损伤估计值; 以及控制器，其被配置为基于由所述损伤估计模块计算出的损伤估计值来控制对所述半导体存储器的电子数据的写入，读取和擦除。

16. 发明申请

US20080249743A1 LOAD CALCULATING DEVICE AND LOAD CALCULATING METHOD 有权
标题翻译：负载计算装置和负载计算方法
公开(公告)号：US20080249743A1
公开(公告)日：2008-10-09
申请号：US12056020
申请日：2008-03-26
申请人： Kenji Hirohata , Minoru Mukai , Katsumi Hisano , Takashi Kawakami
发明人： Kenji Hirohata , Minoru Mukai , Katsumi Hisano , Takashi Kawakami
IPC分类号： G06F17/18 , G06F15/00
CPC分类号： G01R31/2803
摘要： There is provided with a load calculating device including: a variable acquiring unit configured to acquire, as monitoring variables, a detected value by a sensor monitoring a state of a circuit board and a performance characteristic obtained by a tool monitoring performance of the circuit board; a first storage configured to store a first statistical model that is one of a regression model, an occurrence frequency distribution and a probability distribution; a second storage configured to store a second statistical model that is one of a regression model, an occurrence frequency distribution and a probability distribution; and an arithmetic processor configured to calculate the intermediate variable from the monitoring variables acquired by the variable acquiring unit according to the first statistical model and calculate the physical quantity from calculated intermediate variable according to the second statistical model.
摘要翻译：提供了一种负载计算装置，包括：变量获取单元，被配置为通过监视电路板的状态的传感器和通过电路板的工具监视性能获得的性能特性来获取检测值作为监视变量; 第一存储器，被配置为存储作为回归模型，出现频率分布和概率分布之一的第一统计模型; 第二存储器，被配置为存储作为回归模型，发生频率分布和概率分布之一的第二统计模型; 以及运算处理器，被配置为根据第一统计模型从由变量获取单元获取的监视变量中计算中间变量，并根据第二统计模型从计算的中间变量计算物理量。

17. 发明授权

US08055392B2 Electronic device 有权
标题翻译：电子设备
公开(公告)号：US08055392B2
公开(公告)日：2011-11-08
申请号：US12472625
申请日：2009-05-27
申请人： Hideo Kitamura , Kenji Hirohata , Katsumi Hisano , Tomonao Takamatsu
发明人： Hideo Kitamura , Kenji Hirohata , Katsumi Hisano , Tomonao Takamatsu
IPC分类号： G05D23/00 , F28F27/00 , F01P7/14
CPC分类号： G05D23/19 , G05B23/0235 , G05B2219/24077 , H01L2924/0002 , H05K7/20209 , H01L2924/00
摘要： An electronic device includes a deviation value calculation unit which calculates a deviation value from the normal boundary of the relationship between a power index associated with the driving power and the measured rotational speed of the fan, a clogging detection unit which detects, based on the deviation value, clogging in an air duct through which the fan takes in air outside the case and sends it to the radiator, and a deviation value correction unit which corrects the deviation value in accordance with aging of performance of the fan to compensate for deterioration of the clogging detection capability of the clogging detection unit caused by the aging.
摘要翻译：电子装置包括偏差值计算单元，该偏差值计算单元计算与驱动功率相关联的功率指标与风扇的测量转速之间的关系的正常边界的偏差值，阻塞检测单元，其根据偏差价值，堵塞在风扇中的空气管道，风扇通过该风道吸入壳体外部的空气并将其发送到散热器;以及偏差值校正单元，其根据风扇的性能老化来校正偏差值，以补偿风扇的劣化堵塞检测单元由老化引起的堵塞检测能力。

18. 发明授权

US07653510B2 Load calculating device and load calculating method 有权
标题翻译：负荷计算装置和负荷计算方法
公开(公告)号：US07653510B2
公开(公告)日：2010-01-26
申请号：US12056020
申请日：2008-03-26
申请人： Kenji Hirohata , Minoru Mukai , Katsumi Hisano , Takashi Kawakami
发明人： Kenji Hirohata , Minoru Mukai , Katsumi Hisano , Takashi Kawakami
IPC分类号： G06F17/18
CPC分类号： G01R31/2803
摘要： A device and method for providing a load calculating device is presented. In one embodiment, a load calculating device can include a variable acquiring unit configured to acquire monitoring variables. The monitoring variables can include in a detected value by a sensor monitoring a state of a circuit board and a performance characteristic obtained by a tool monitoring performance of the circuit board. The device can also store a first statistical model that is one of a regression model, an occurrence frequency distribution and a probability distribution; a second storage configured to store a second statistical model that is one of a regression model, an occurrence frequency distribution and a probability distribution. An arithmetic processor can then be used to calculate the intermediate variable from the monitoring variables according to the first statistical model and calculate the physical quantity from calculated intermediate variable according to the second statistical model.
摘要翻译：提出了一种用于提供负载计算装置的装置和方法。在一个实施例中，负载计算装置可以包括被配置为获取监视变量的变量获取单元。监视变量可以通过监视电路板的状态的传感器和通过电路板的工具监视性能获得的性能特性包括在检测值中。该装置还可以存储作为回归模型，出现频率分布和概率分布之一的第一统计模型; 第二存储器，被配置为存储作为回归模型，出现频率分布和概率分布之一的第二统计模型。然后可以使用算术处理器根据第一统计模型从监测变量计算中间变量，并根据第二统计模型从计算的中间变量计算物理量。

19. 发明授权

US08321157B2 Monitoring device and monitoring method 失效
标题翻译：监控装置及监控方法
公开(公告)号：US08321157B2
公开(公告)日：2012-11-27
申请号：US12729306
申请日：2010-03-23
申请人： Takahiro Omori , Kenji Hirohata , Minoru Mukai
发明人： Takahiro Omori , Kenji Hirohata , Minoru Mukai
IPC分类号： G01B7/16 , G01B21/32
CPC分类号： G01R31/2849
摘要： A dummy junction which will break earlier than a target junction is arranged on a board. A history of load applied to the dummy junction until the dummy junction actually breaks is recorded, and an estimated lifetime of the target junction is calibrated when a lifetime of the dummy junction estimated by the history of the load is largely different from an actual lifetime of the dummy junction. The calibration is performed by subtracting a value of an unmeasurable load from the estimated lifetime of the target junction based on load ever applied to the target junction, and the unmeasurable load is calculated based on the difference of the actual lifetime and estimated lifetime of the dummy junction.
摘要翻译：在一个电路板上布置一个比目标结点更早断裂的虚拟连接点。记录施加到虚拟结直到虚连接实际断开的负载的历史，并且当由负载历史估计的虚拟结的寿命与实际寿命的实际寿命大不相同时，校准目标结的估计寿命虚拟连接点。基于目标结点的负荷从目标结的估计寿命中减去不可测量的负载的值进行校准，并且基于虚拟的实际寿命和估计寿命的差异来计算不可测量的负载交界处

20. 发明申请

US20100250149A1 MONITORING DEVICE AND MONITORING METHOD 失效
标题翻译：监控设备和监控方法
公开(公告)号：US20100250149A1
公开(公告)日：2010-09-30
申请号：US12729306
申请日：2010-03-23
申请人： Takahiro Omori , Kenji Hirohata , Minoru Mukai
发明人： Takahiro Omori , Kenji Hirohata , Minoru Mukai
IPC分类号： G06F19/00 , G01N25/00 , G01L1/00
CPC分类号： G01R31/2849
摘要： A dummy junction which will break earlier than a target junction is arranged on a board. A history of load applied to the dummy junction until the dummy junction actually breaks is recorded, and an estimated lifetime of the target junction is calibrated when a lifetime of the dummy junction estimated by the history of the load is largely different from an actual lifetime of the dummy junction. The calibration is performed by subtracting a value of an unmeasurable load from the estimated lifetime of the target junction based on load ever applied to the target junction, and the unmeasurable load is calculated based on the difference of the actual lifetime and estimated lifetime of the dummy junction.
摘要翻译：在一个电路板上布置一个比目标结点更早断裂的虚拟连接点。记录施加到虚拟结直到虚连接实际断开的负载的历史，并且当由负载历史估计的虚拟结的寿命与实际寿命的实际寿命大不相同时，校准目标结的估计寿命虚拟连接点。基于目标结点的负荷从目标结的估计寿命中减去不可测量的负载的值进行校准，并且基于虚拟的实际寿命和估计寿命的差异来计算不可测量的负载交界处

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