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    • 12. 发明授权
    • Simple inspection device for analyzer for ionic activity measurement
    • 用于离子活性测量的分析仪的简单检查装置
    • US4832817A
    • 1989-05-23
    • US106467
    • 1987-10-09
    • Tadashi UekusaTakashi KoizumiNobuhiko Amano
    • Tadashi UekusaTakashi KoizumiNobuhiko Amano
    • G01N27/30
    • G01N27/307
    • A simple inspection device is constituted for inspection of an analyzer for measuring ionic activity by using an ionic activity measuring device provided with at least one ion selective electrode pair for generating an electrical potential corresponding to ionic activity of a predetermined ion, and a porous bridge for associating the electrodes of the ion selective electrode pair with each other, and by contacting potential difference measuring probes respectively with the electrodes of the ion selective electrode pair, to thereby measure a difference in potential between the electrodes. The simple inspection device employs a supporting member having outer dimensions approximately equal to the outer dimensions of the ionic activity measuring device, and an electrically conductive member supported on the supporting member for short-circuiting across the potential difference measuring probes when the potential difference measuring probes are contacted with the electrically conductive member.
    • 构成一个简单的检查装置,用于通过使用设置有至少一个离子选择电极对的离子活性测量装置来检测用于测量离子活性的分析器,用于产生对应于预定离子的离子活性的电位,以及用于 将离子选择电极对的电极彼此相关联,并且通过将电位差测量探针分别与离子选择电极对的电极接触,从而测量电极之间的电位差。 简单的检查装置使用具有大致等于离子活性测量装置的外部尺寸的外形尺寸的支撑构件,以及当电位差测量探针在电位差测量探针之间跨越电位差测量探针短路时支撑在支撑构件上的导电构件 与导电构件接触。