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11. 发明申请

US20160054470A1 VEHICLE INSPECTION SYSTEM 审中-公开
标题翻译：车辆检验系统
公开(公告)号：US20160054470A1
公开(公告)日：2016-02-25
申请号：US14582097
申请日：2014-12-23
申请人： TSINGHUA UNIVERSITY , NUCTECH COMPANY LIMITED
发明人： Yu HU , Jianmin LI , Hui MENG , Yuan MA , Weifeng YU , Jinning LIANG , Shangmin SUN
IPC分类号： G01V5/00 , B65G15/58 , B65G15/24 , B65G35/00 , F16M13/02
CPC分类号： G01V5/0016 , B65G15/44 , B65G17/08 , B65G47/66 , F16M13/02
摘要： The present invention discloses a vehicle inspection system, comprising: an inspection passage; a vehicle dragging system arranged in the inspection passage, wherein the vehicle dragging system comprises a first dragging means and a second dragging means, which are sequentially arranged along a vehicle dragging direction, and in the vehicle dragging direction, the first dragging means is arranged at the upstream of the second dragging means, and a separating section is arranged between the first dragging means and the second dragging means, so that the first dragging means and the second dragging means are separated by a preset distance in the vehicle dragging direction; and a radiographic inspection system, wherein at least a part of paths of the beams of the radiographic inspection system passes through the separating section between the first dragging means and the second dragging means.
摘要翻译：本发明公开了一种车辆检查系统，包括：检查通道; 布置在所述检查通道中的车辆牵引系统，其中所述车辆牵引系统包括沿着车辆拖动方向依次布置的第一牵引装置和第二牵引装置，并且在所述车辆拖动方向上，所述第一牵引装置布置在第二牵引装置的上游和第一牵引装置和第二牵引装置之间设置分离部分，使得第一牵引装置和第二牵引装置在车辆拖动方向上分开预定的距离; 以及射线照相检查系统，其中所述射线照相检查系统的光束的至少一部分路径通过所述第一拖动装置和所述第二拖动装置之间的分离部分。

12. 发明申请

US20150185166A1 X-RAY FLUOROSCOPIC IMAGING SYSTEM 有权
标题翻译： X射线荧光成像系统
公开(公告)号：US20150185166A1
公开(公告)日：2015-07-02
申请号：US14582069
申请日：2014-12-23
申请人： NUCTECH COMPANY LIMITED , TSINGHUA UNIVERSITY
发明人： Huaping TANG , Zhiqiang CHEN , Chuanxiang TANG , Huaibi CHEN , Yuanjing LI , Ziran ZHAO , Yaohong LIU , Shangmin SUN , Xinshui YAN , Zhanfeng QIN
IPC分类号： G01N23/04 , G21K1/02 , G01T7/08 , G01V5/00
CPC分类号： G01N23/043 , G01T7/08 , G01V5/0033 , G01V5/0041 , G01V5/005 , G21K1/025
摘要： The X-ray fluoroscopic imaging system of the present invention comprises: an inspection passage; an electron accelerator; a shielding collimator apparatus comprising a shielding structure, and a first collimator for extracting a low energy planar sector X-ray beam and a second collimator for extracting a high energy planar sector X-ray beam which are disposed within the shielding structure; a low energy detector array for receiving the X-ray beam from the first collimator; and a high energy detector array for receiving the X-ray beam from the second collimator. The first collimator, the low energy detector array and the target point bombarded by the electron beam are located in a first plane; and the second collimator, the high energy detector array and the target point bombarded by the electron beam are located in a second plane.
摘要翻译：本发明的X射线透视成像系统包括：检查通道; 电子加速器; 包括屏蔽结构的屏蔽准直器装置和用于提取低能平面扇形X射线束的第一准直器和用于提取设置在屏蔽结构内的高能平面扇形X射线束的第二准直器; 低能量检测器阵列，用于接收来自第一准直仪的X射线束; 以及用于从第二准直器接收X射线束的高能量检测器阵列。第一准直器，低能量检测器阵列和由电子束轰击的目标点位于第一平面中; 并且第二准直器，高能量检测器阵列和由电子束轰击的目标点位于第二平面中。

13. 发明申请

US20210364620A1 SMART AUTOMATIC FREQUENCY CONTROL APPARATUS BASED ON DIGITAL CONTROL 有权
公开(公告)号：US20210364620A1
公开(公告)日：2021-11-25
申请号：US17256851
申请日：2019-06-06
申请人： NUCTECH COMPANY LIMITED
发明人： Shangmin SUN , Yu HU , Sheng YAO , Tao WANG , Xibin YIN
IPC分类号： G01S13/38 , G01S7/40 , G01S13/34
摘要： The present disclosure provides a smart automatic frequency control (AFC) apparatus, including: a phase shift module, connected to a first signal input terminal and configured to: receive an incident wave from the first signal input terminal, perform a phase shift on the incident wave according to a phase shift parameter so as to generate a phase-shifted signal, and output the phase-shifted signal to a phase detection module; and the phase detection module, connected to the phase shift module and a second signal input terminal and configured to: receive a reflected wave from the second signal input terminal, perform a phase detection on the phase-shifted signal and the reflected wave so as to generate a phase difference signal, and output the phase difference signal via a control interface.

14. 发明公开

US20240319114A1 INSPECTION SYSTEM AND METHOD 审中-公开
公开(公告)号：US20240319114A1
公开(公告)日：2024-09-26
申请号：US18574756
申请日：2022-07-01
申请人： NUCTECH COMPANY LIMITED
发明人： Weizhen WANG , Bicheng LIU , Chunguang ZONG , Shangmin SUN
IPC分类号： G01N23/04 , G01N23/083 , G01N23/10
CPC分类号： G01N23/04 , G01N23/083 , G01N23/10 , G01N2223/204 , G01N2223/50
摘要： An inspection system includes: a radiation source; a detector configured to detect a signal when radiation emitted by the radiation source acts on an inspected object; and a processor in communication connection with the radiation source and configured to select a periodic radiation combination corresponding to a type of the object according to the type of the object, and cause the radiation source to emit radiation to the object in the selected periodic radiation combination during the time that the object is scanned, and the periodic radiation combination is a chronological arrangement of radiation pulses output by the radiation source in each scanning period, and radiation pulses have at least two different radiation energies. The system is capable of improving adaptability and simplifying control. An inspection method is also provided.

15. 发明公开

US20240302299A1 INSPECTION SYSTEM AND METHOD 审中-公开
公开(公告)号：US20240302299A1
公开(公告)日：2024-09-12
申请号：US18575301
申请日：2022-07-01
申请人： NUCTECH COMPANY LIMITED
发明人： Weizhen WANG , Bicheng LIU , Chunguang ZONG , Shangmin SUN
IPC分类号： G01N23/083 , G01N23/04 , H01J25/50
CPC分类号： G01N23/083 , G01N23/04 , G01N2223/20 , H01J25/50
摘要： An inspection system comprises: a radiation source; a detector configured to detect a signal when radiation emitted by the radiation source acts on the inspected object; and a processor in communication connection with the radiation source and configured to determine at least one periodic radiation combination corresponding to a type of the object according to the type of the object, select periodic radiation combinations respectively corresponding to at least two different portions of the object in the at least one periodic radiation combination, and cause the radiation source to emit radiation to the at least two corresponding different portions in selected periodic radiation combinations during the time that the object is scanned, wherein a periodic radiation combination is a chronological arrangement of at least one radiation pulse output by the radiation source in each scanning period. An inspection method is also provided.

16. 发明公开

US20240319112A1 INSPECTION SYSTEM AND METHOD 审中-公开
公开(公告)号：US20240319112A1
公开(公告)日：2024-09-26
申请号：US18575288
申请日：2022-07-01
申请人： NUCTECH COMPANY LIMITED
发明人： Bicheng LIU , Weizhen WANG , Chunguang ZONG , Shangmin SUN
IPC分类号： G01N23/02
CPC分类号： G01N23/02 , G01N2223/1006 , G01N2223/206 , G01N2223/64
摘要： The present disclosure relates to an inspection system and method. The inspection system includes: a ray source, configured to generate rays having different energies; a detector, configured to detect a signal when a ray emitted by the ray source acts on at least one cross section of an inspected object; and a processor, in communication connection with the ray source, configured to adjust an energy of the ray emitted by the ray source according to information representing a material parameter of at least one cross section of the inspected object. The embodiments of the present disclosure is capable of being applicable to radiation inspection of multiple types of inspected objects.

17. 发明公开

US20230288350A1 BACKSCATTER IMAGING DEVICE, CONTROL METHOD AND INSPECTION SYSTEM 审中-公开
公开(公告)号：US20230288350A1
公开(公告)日：2023-09-14
申请号：US18013555
申请日：2021-07-02
申请人： NUCTECH COMPANY LIMITED
发明人： Zhiqiang CHEN , Yuanjing LI , Shangmin SUN , Chunguang ZONG , Yu HU , Huaping TANG , Bicheng LIU , Weizhen WANG
IPC分类号： G01N23/203
CPC分类号： G01N23/203 , G01N2223/316 , G01N2223/3301 , G01N2223/501
摘要： The present invention relates to a backscatter imaging device, a control method and an inspection system. The backscatter imaging device includes a ray source assembly configured to emit rays to a scanning area; a backscatter detector array including a plurality of backscattering detectors and configured to receive scattered photons when the rays are backscattered by an object within the scanning area; and a first collimator assembly including a plurality of first collimating channels corresponding to the plurality of backscatter detectors respectively, arranged on one side of the backscatter detector array adjacent to the scanning area, and configured to align the scattered photons when the rays are backscattered by the object, and the plurality of backscatter detectors receive scattered photons corresponding to a plurality of depths in the object respectively; and at least part of the plurality of first collimation channels have an adjustable collimation angle.

18. 发明申请

US20210354738A1 TRAIN IDENTIFICATION SYSTEM AND METHOD, AND TRAIN SAFETY INSPECTION SYSTEM AND METHOD 有权
公开(公告)号：US20210354738A1
公开(公告)日：2021-11-18
申请号：US17287116
申请日：2019-10-08
申请人： NUCTECH COMPANY LIMITED
发明人： Yanwei XU , Weifeng YU , Yu HU , Shangmin SUN
IPC分类号： B61L27/00
摘要： The present disclosure relates to a train identification system and method, and a train safety inspection system and method. The train identification system includes: a remote detection component, configured to acquire overall feature information of an inspected train through remote monitoring; and an identification device, configured to determine at least one of a type and a traveling situation of the inspected train according to the acquired overall feature information.

19. 发明申请

US20160135278A1 Standing Wave Electron Linear Accelerator and Container/Vehicle Inspection System 审中-公开
标题翻译：驻波电子线性加速器和集装箱/车辆检测系统
公开(公告)号：US20160135278A1
公开(公告)日：2016-05-12
申请号：US14900601
申请日：2013-11-19
申请人： NUCTECH COMPANY LIMITED
发明人： Shangmin SUN , Zhanfeng QIN , Sheng YAO , Weifeng YU , Liwei SONG , Chunguang ZONG , Jinning LIANG
IPC分类号： H05H7/02 , G01V5/00 , H05H9/04
CPC分类号： H05H7/02 , G01V5/0016 , H05H9/048 , H05H2007/027
摘要： The present invention provides a standing wave electron linear accelerator comprising a modulator and a magnetron for producing radio frequency microwaves; a plurality of accelerating tubes for accelerating electrons; a microwave transmission system for feeding the microwaves into the plurality of accelerating tubes; a plurality of electron guns for emitting electron beams into the plurality of accelerating tubes; a plurality of targets impinged by the electrons from a plurality of accelerating tubes to form continuous spectrums of X-rays; a plurality of shielding devices for shielding the continuous spectrums of X-rays generated by the targets; and a microwave distributor disposed adjacent to the end of the microwave transmission system, wherein the microwave distributor has a microwave inlet and a plurality of microwave outlets for distributing the microwaves in the microwave transmission system into the accelerating tubes.
摘要翻译：本发明提供了一种驻波电子线性加速器，其包括用于产生射频微波的调制器和磁控管; 用于加速电子的多个加速管; 微波传输系统，用于将微波馈送到多个加速管中; 多个电子枪，用于将电子束发射到多个加速管中; 由多个加速管撞击的电子的多个靶，以形成X射线的连续光谱; 多个屏蔽装置，用于屏蔽目标产生的X射线的连续光谱; 以及布置在所述微波传输系统的端部附近的微波分配器，其中所述微波分配器具有微波入口和用于将所述微波传输系统中的微波分配到所述加速管中的多个微波出口。

20. 发明申请

US20150204999A1 INSPECTION SYSTEM FOR CONTAINER 有权
标题翻译：集装箱检验系统
公开(公告)号：US20150204999A1
公开(公告)日：2015-07-23
申请号：US14576715
申请日：2014-12-19
申请人： Nuctech Company Limited
发明人： Shangmin SUN , Weifeng YU , Liwei SONG
IPC分类号： G01V5/00
CPC分类号： G01V5/0016
摘要： The present invention provides an inspection system for a container. It comprises: a radiation source, configured to provide X-rays for scanning the container; a detector, configured to receive the X-rays emitted from the radiation source; a body of the inspection system, on which the radiation source and the detector are provided; wherein a size of the body of the inspection system is set to facilitate the inspection of the container. The inspection system of the present invention can inspect in batches the container in the wharf or goods yard.
摘要翻译：本发明提供了一种用于容器的检查系统。它包括：辐射源，被配置为提供用于扫描容器的X射线; 检测器，被配置为接收从所述辐射源发射的X射线; 检测系统的主体，其上设有辐射源和检测器; 其中，所述检查系统的主体的尺寸被设定为便于检查所述容器。本发明的检查系统可以分批检查码头或货场的集装箱。

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