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11. 发明申请

US20210173076A1 MEASUREMENT SETUP, REFERENCE REFLECTOR AS WELL AS METHOD FOR MEASURING ATTENUATION 有权
公开(公告)号：US20210173076A1
公开(公告)日：2021-06-10
申请号：US17178648
申请日：2021-02-18
申请人： Rohde & Schwarz GmbH & Co. KG
发明人： Sherif Sayed Ahmed , Frank Gumbmann , Tobias Koeppel , Michael Freissl , Christian Evers , Thomas Fischer
IPC分类号： G01S13/89 , G06T7/73
摘要： A measurement setup for measuring attenuation through an irregular surface of a device under test is described. The measurement setup includes a positioning system, a reference reflector, and a three dimensional imaging system. The measurement setup has a reference state and a measurement state, wherein respective images are taken in the different states. The imaging system is configured to compare the images taken in the reference state and the measurement state to determine the attenuation of the device under test. Further, a reference reflector as well as a method for measuring attenuation are described.

12. 发明申请

US20190383935A1 MEASUREMENT SETUP, REFERENCE REFLECTOR AS WELL AS METHOD FOR MEASURING ATTENUATION 审中-公开
公开(公告)号：US20190383935A1
公开(公告)日：2019-12-19
申请号：US16008979
申请日：2018-06-14
申请人： Rohde & Schwarz GmbH & Co. KG
发明人： Sherif Sayed Ahmed , Frank Gumbmann , Tobias Koeppel , Michael Freissl , Christian Evers , Thomas Fischer
IPC分类号： G01S13/89 , G06T7/73
摘要： A measurement setup for measuring attenuation through an irregular surface of a device under test is described. The measurement setup comprises a positioning system, a reference reflector having a collection of diffuse scattering members, and a three dimensional imaging system. The measurement setup has a reference state and a measurement state, wherein respective images are taken in the different states. The imaging system is configured to compare the images taken in the reference state and the measurement state to determine the attenuation of the device under test. Further, a reference reflector as well as a method for measuring attenuation are described.

13. 发明授权

US09568593B2 Method, system and calibration target for the automatic calibration of an imaging antenna array 有权
标题翻译：用于自动校准成像天线阵列的方法，系统和校准目标
公开(公告)号：US09568593B2
公开(公告)日：2017-02-14
申请号：US14353047
申请日：2013-02-20
申请人： Rohde & Schwarz GmbH & Co. KG
发明人： Sherif Sayed Ahmed
IPC分类号： G01S7/40 , H01Q3/26 , H01Q15/14 , G01S13/89 , G01S7/00 , G01S13/00 , H01Q3/00 , H01Q15/00
CPC分类号： G01S7/4026 , G01S13/89 , H01Q3/267
摘要： The system (1) is used for the automatic calibration of an imaging-antenna arrangement (2) using an evaluation unit (4). The antenna arrangement (2) transmits signals (6) and receives the signals (6′) reflected from a calibration object (3) of known shape. The calibration object (3, 31, 32) provides at least one diffuse reflector (8). In the evaluation method, position coordinates of the calibration object (3) are entered, and the following method steps are implemented after the measurement of the reflected signals (6′): i. Calculation of the reflections of the calibration object (3, 31, 32), ii. Calculation of calibration data, iii. Preparation of an image of the calibration object with the use of the calibration data, iv. Determination of corrected position coordinates by evaluating the image of the at least one diffuse reflector, v. Implementation of steps i. to iv. with corrected position coordinates.
摘要翻译：该系统用于使用评估单元自动校准成像阵列。阵列传输信号并接收从已知形状的校准对象反射的信号。校准对象提供至少一个漫反射器。在评估方法中，输入校准对象的位置坐标，并在测量反射信号之后实施以下方法步骤：（i）计算校准对象的反射，（ii）计算校准数据，（iii）通过使用校准数据准备校准对象的图像，（iv）通过评估至少一个漫反射器的图像来确定校正的位置坐标，以及（v）实施具有校正位置的步骤（i）至（iv）坐标

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