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11. 发明授权

US06425801B1 Polishing process monitoring method and apparatus, its endpoint detection method, and polishing machine using same 有权
标题翻译：抛光过程监控方法和装置，其端点检测方法和使用该抛光机的抛光机
公开(公告)号：US06425801B1
公开(公告)日：2002-07-30
申请号：US09324080
申请日：1999-06-01
申请人： Akira Takeishi , Hideo Mitsuhashi , Katsuhisa Ohkawa , Yoshihiro Hayashi , Takahiro Onodera
发明人： Akira Takeishi , Hideo Mitsuhashi , Katsuhisa Ohkawa , Yoshihiro Hayashi , Takahiro Onodera
IPC分类号： B24B100
CPC分类号： B24B37/013 , B24B37/042 , B24B49/04 , B24B49/12
摘要： A polishing process monitoring apparatus of a semiconductor wafer is provided, which is capable of monitoring correctly the process independent of various factors affecting optical measurement, such as the configuration, material, and size of a layered structure on the wafer, and the geometric shapes of patterns and their arrangement for respective semiconductor chips. This apparatus is comprised of (a) a light irradiating means for irradiating a detection light beam to a semiconductor wafer, (b) a first light receiving means for receiving a specular-reflected light beam generated by reflection of the detection light beam at the wafer and for outputting a first signal according to an amount of the specular-reflected light beam, (c) a second light receiving means for receiving a scattered/diffracted light beam generated by scattering or diffraction of the detection light beam at the wafer and for outputting a second signal according to an amount of the scattered/diffracted light beam, and (d) a monitoring means for monitoring a polishing process of the wafer by using the first and second signals.
摘要翻译：提供了一种半导体晶片的抛光处理监视装置，其能够独立于影响光学测量的各种因素，例如晶片上的分层结构的配置，材料和尺寸，以及几何形状图案及其各自半导体芯片的布置。该装置包括（a）用于将检测光束照射到半导体晶片的光照射装置，（b）第一光接收装置，用于接收由晶片上的检测光束的反射产生的镜面反射光束并且用于根据镜面反射光束的量输出第一信号，（c）第二光接收装置，用于接收由晶片上的检测光束的散射或衍射产生的散射/衍射光束，并输出根据散射/衍射光束的量的第二信号，以及（d）用于通过使用第一和第二信号监视晶片的抛光处理的监视装置。

12. 发明授权

US09958902B2 Input device, input method, and program 有权
公开(公告)号：US09958902B2
公开(公告)日：2018-05-01
申请号：US13635088
申请日：2011-03-14
申请人： Shin Norieda , Hideo Mitsuhashi
发明人： Shin Norieda , Hideo Mitsuhashi
IPC分类号： G08B23/00 , G06F1/16 , G06F3/01
CPC分类号： G06F1/163 , G06F3/011
摘要： An input device comprises: a detection unit that detects a body movement generated by tapping a user body as detection data; and an input information determination unit that refers to the detection data, determines a tap position based on a fact that the detection data varies depending on the tap position, and outputs an operation command associated with the determined tap position.

13. 发明授权

US09109475B2 Control system for an internal combustion engine 有权
标题翻译：内燃机控制系统
公开(公告)号：US09109475B2
公开(公告)日：2015-08-18
申请号：US13405702
申请日：2012-02-27
申请人： Hideo Mitsuhashi
发明人： Hideo Mitsuhashi
IPC分类号： F02D28/00 , F01L1/344 , F01L13/08
CPC分类号： F01L1/3442 , F01L13/08 , F01L2800/01
摘要： An internal combustion engine includes a hydraulically-driven variable valve timing device for adjusting the opening timing and the closing timing of an intake valve and configured to include a start retard position for decompression that is retarded further from the most retarded position during a normal operating state, and a control system configured to start a cranking operation of the internal combustion engine while the variable valve timing device is positioned in the start retard position for decompression, to determine during the cranking operation whether operating oil has drained from the variable valve timing device, when it has been determined that oil has drained from the variable valve timing device, to set a delay time between the cranking operation start and an advance operation of the variable valve timing device longer than the situation in which operating oil is replete.
摘要翻译：内燃机包括用于调节进气门的打开正时和关闭正时的液压驱动的可变气门正时装置，并被构造为包括在正常操作状态期间进一步从最大延迟位置延迟的减压开始延迟位置以及控制系统，其构造成在可变气门正时装置位于用于减压的开始延迟位置的同时开始内燃机的起动操作，以在起动操作期间确定工作油是否已经从可变气门正时装置排出，当确定油已经从可变气门正时装置排出时，设定起动运转开始与可变气门正时装置的提前运转之间的延迟时间比工作油充满的情况更长。

14. 发明申请

US20130009870A1 INPUT DEVICE, INPUT METHOD, AND PROGRAM 有权
标题翻译：输入设备，输入法和程序
公开(公告)号：US20130009870A1
公开(公告)日：2013-01-10
申请号：US13635088
申请日：2011-03-14
申请人： Shin Norieda , Hideo Mitsuhashi
发明人： Shin Norieda , Hideo Mitsuhashi
IPC分类号： G06F3/01
CPC分类号： G06F1/163 , G06F3/011
摘要： An input device comprises: a detection unit that detects a body movement generated by tapping a user body as detection data; and an input information determination unit that refers to the detection data, determines a tap position based on a fact that the detection data varies depending on the tap position, and outputs an operation command associated with the determined tap position.
摘要翻译：输入装置包括：检测单元，其检测通过敲击用户身体产生的身体运动作为检测数据; 以及参考检测数据的输入信息确定单元，基于检测数据根据抽头位置而变化的事实来确定抽头位置，并且输出与确定的抽头位置相关联的操作命令。

15. 发明申请

US20110134082A1 INFORMATION INPUT SYSTEM, METHOD FOR INPUTTING INFORMATION AND INFORMATION INPUT PROGRAM 审中-公开
标题翻译：信息输入系统，用于输入信息和信息输入程序的方法
公开(公告)号：US20110134082A1
公开(公告)日：2011-06-09
申请号：US13057369
申请日：2009-06-25
申请人： Hideo Mitsuhashi , Shin Norieda
发明人： Hideo Mitsuhashi , Shin Norieda
IPC分类号： G06F3/043
CPC分类号： G06F3/011 , G06F1/1684 , G06F3/043
摘要： Provided is an information input system, wherein an operator can easily conduct information input actions to a small information device. The information input system is provided with a vibration element that applies a vibration to a forefinger of an operator, a vibration sensor that measures the vibration transmitted through the forefinger and the thumb, and a first input information specifying module that specifies the position on the thumb where another finger of the operator is in contact with the thumb based on a change in transmission property of the transmission system caused by the fact that the finger of the operator, which is in contact with the thumb, is in contact with the vibration transmission system formed by including the forefinger and the thumb. The information input system outputs the detected position of the contact of the finger as positional information.
摘要翻译：提供了一种信息输入系统，其中操作者可以容易地向小信息设备进行信息输入动作。该信息输入系统设置有对操作者的食指施加振动的振动元件，测量通过食指和拇指传递的振动的振动传感器，以及指定拇指位置的第一输入信息指定模块其中操作者的另一个手指基于由与拇指接触的操作者的手指与振动传播系统接触的事实而导致的传输系统的传输特性的变化而与拇指接触通过包括食指和拇指形成。信息输入系统输出检测到的手指的接触位置作为位置信息。

16. 发明授权

US07493150B2 Folding electric device having perpendicular and horizontal shafts 有权
标题翻译：具有垂直和水平轴的折叠电气装置
公开(公告)号：US07493150B2
公开(公告)日：2009-02-17
申请号：US10801575
申请日：2004-03-17
申请人： Yosuke Watanabe , Shuichi Ono , Hideo Mitsuhashi , Tomoji Minowa , Masatomo Mizuta
发明人： Yosuke Watanabe , Shuichi Ono , Hideo Mitsuhashi , Tomoji Minowa , Masatomo Mizuta
IPC分类号： H04M1/00
CPC分类号： H04M1/0212 , E05D3/10 , E05D11/00 , E05Y2900/606 , G06F1/162 , G06F1/1679 , G06F1/169
摘要： A folding electric has an upper unit and lower unit. A hinge connects the upper unit to the lower unit. The hinge includes at least a perpendicular opening and closing shaft to open and close the upper unit with respect to the lower unit and a horizontal rotation shaft, fixed vertically to the surface of the lower unit, to rotate the upper unit with respect to the lower unit coming in contact with each other.
摘要翻译：折叠式电动机具有上部单元和下部单元。铰链将上部单元连接到下部单元。铰链包括至少一个垂直的开闭轴，以相对于下部单元打开和关闭上部单元;垂直于下部单元的表面固定的水平旋转轴，以相对于下部单元旋转上部单元单位相互接触。

17. 发明授权

US06428202B1 Method for inspecting connection state of electronic part and a substrate, and apparatus for the same 失效
标题翻译：用于检查电子部件和基板的连接状态的方法及其装置
公开(公告)号：US06428202B1
公开(公告)日：2002-08-06
申请号：US09523000
申请日：2000-03-09
申请人： Hideo Mitsuhashi , Katsuhisa Ookawa
发明人： Hideo Mitsuhashi , Katsuhisa Ookawa
IPC分类号： G01N2572
CPC分类号： G01N25/72
摘要： A method for inspecting a connection state of an electronic part and an apparatus for the same which permits judgement of the quality of the connection state at high accuracy without needing structural addition of through holes and pads for use in connection state inspection are provided. The has the steps of: heating a first specific position on the electronic part, measuring a temperature rise of a second specific position thermally coupled to the first specific position, and judging the quality of the connection state of the solder connecting portion by comparing the measured temperature rise and a reference temperature rise.
摘要翻译：提供一种用于检查电子部件的连接状态的方法及其装置，其允许以高精度判断连接状态的质量，而不需要在连接状态检查中使用的通孔和焊盘的结构添加。具有以下步骤：加热电子部件上的第一特定位置，测量与第一特定位置热耦合的第二特定位置的温度上升，以及通过比较测量的焊接连接部分的连接状态的质量来判断焊接连接部分的连接状态的质量温度升高和参考温度升高。

18. 发明授权

US06168684A Wafer polishing apparatus and polishing method 失效
标题翻译：晶圆抛光装置和抛光方法
公开(公告)号：US06168684A
公开(公告)日：2001-01-02
申请号：US09205695
申请日：1998-12-04
申请人： Hideo Mitsuhashi , Satoshi Ohi , Atsushi Yamamori , Shoichi Inaba
发明人： Hideo Mitsuhashi , Satoshi Ohi , Atsushi Yamamori , Shoichi Inaba
IPC分类号： C23F102
CPC分类号： B24B37/32 , B24B47/10
摘要： A wafer polishing apparatus has a rotary polishing bed, an abrasive cloth provided on the polishing bed, an abrasive supply supplying abrasives to a surface of the abrasive cloth, a wafer depressor depressing the wafer onto the abrasive cloth at a predetermined pressure, a ring shaped retainer arranged surrounding the wafer and provided with a plurality of grooves extending between an inner peripheral edge and an outer peripheral edge on a surface contacting with the abrasive cloth, a rotary driver driving the wafer and the retainer on the abrasive cloth, and a rotation speed difference generator providing a difference of rotation speeds between the wafer and the retainer.
摘要翻译：晶片抛光装置具有旋转抛光床，设置在研磨床上的研磨布，向磨料表面供给研磨剂的研磨剂，以预定压力将晶片压在研磨布上的晶片压片，环形保持器围绕晶片设置并且在与磨料接触的表面上的内周边缘和外周边缘之间延伸的多个槽，在研磨布上驱动晶片和保持器的旋转驱动器以及旋转速度差分发生器提供晶片和保持器之间的旋转速度差。

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