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    • 12. 发明授权
    • Ultraviolet irradiation device
    • 紫外线照射装置
    • US08258490B2
    • 2012-09-04
    • US12768645
    • 2010-04-27
    • Masayuki YamamotoMasaru Irie
    • Masayuki YamamotoMasaru Irie
    • G21G5/00
    • H01L21/67132H01L21/67092H01L21/67253
    • Prior to applying of ultraviolet rays to a surface of a wafer with a protective tape joined thereto that is placed and held on a holding table, an illumination sensor moves to a position below an ultraviolet irradiation unit having ultraviolet light emitting diodes arranged in one dimensional array to measure ultraviolet intensity in a position corresponding to a surface of the protective tape, and output voltage of each diode is controlled so as to maintain a uniform accumulated quantity of light in an area of the protective tape where ultraviolet rays are applied that is determined from the result of measurement and a turning velocity of the holding table.
    • 在将放置并保持在保持台上的具有与其接合的保护带施加到晶片的表面之前,照射传感器移动到具有以一维阵列排列的紫外线发光二极管的紫外线照射单元下方的位置 测定与保护带的表面相对应的位置的紫外线强度,控制各二极管的输出电压,使得在施加了紫外线的保护带的区域内保持均匀的积聚光, 测量结果和保持台的转动速度。