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    • 11. 发明申请
    • ELECTRONIC DEVICE WITH BIAXIAL PIVOTING MECHANISM
    • 具有双向投放机制的电子设备
    • US20110255225A1
    • 2011-10-20
    • US13088430
    • 2011-04-18
    • Yi-Chuan Chen
    • Yi-Chuan Chen
    • H05K5/02
    • G06F1/1681
    • An electronic device includes a first housing, a first pivoting mechanism disposed on a side of the first housing, a second housing, a second pivoting mechanism disposed on a side of the second housing, and a bridging component. A first end and a second end of the bridging component are respectively pivoted on the first pivoting mechanism and the second pivoting mechanism. The bridging component includes a first contacting portion for contacting against the side of the first housing when the first pivoting mechanism pivots on the first end so that the first housing rotates around the second housing at a first angle, and a second contacting portion for contacting against the side of the second housing when the second end pivots on the second pivoting mechanism so that the first housing rotates around the second housing at a second angle greater than the first angle.
    • 电子设备包括第一壳体,设置在第一壳体一侧的第一枢转机构,第二壳体,设置在第二壳体侧的第二枢转机构和桥接部件。 桥接部件的第一端和第二端分别在第一枢转机构和第二枢转机构上枢转。 桥接部件包括第一接触部分,用于当第一枢转机构在第一端部枢转时接触第一壳体的侧面,使得第一壳体以第一角度围绕第二壳体旋转;以及第二接触部分, 当第二端枢转在第二枢转机构上时,第二壳体的侧面使得第一壳体以大于第一角度的第二角度绕第二壳体旋转。
    • 15. 发明申请
    • COMPENSATING DEVICES AND METHODS FOR DETECTING AND COMPENSATING FOR SAMPLING CLOCK OFFSET
    • 补偿装置和用于检测和补偿采样时钟偏移的方法
    • US20130051504A1
    • 2013-02-28
    • US13220049
    • 2011-08-29
    • Yi-Chuan Chen
    • Yi-Chuan Chen
    • H04L27/06
    • H04L27/2657H04L27/2671H04L27/2672H04L27/2676
    • A compensating device for detecting and compensating for a sampling clock offset in a receiver. An SCO detector includes multiple calculation paths and a controller. Each calculation path receives a time domain signal and a hypothetic offset, calculates correlation coefficients between the time domain signal and a delayed version of the time domain signal according to a predetermined delay and the hypothetic offset, calculates correlation coefficient sums according to the correlation coefficients, and extracts a maximum correlation coefficient sum for the hypothetic offset from the correlation coefficient sums. The controller is coupled to the calculation paths for providing different hypothetic offsets to each calculation path and detects the SCO according to the maximum correlation coefficient sums obtained from the calculation paths. An SCO compensator receives the SCO and compensating for the SCO on a signal generated in a signal processing path of a receiver.
    • 一种用于检测和补偿接收机中的采样时钟偏移的补偿装置。 SCO检测器包括多个计算路径和控制器。 每个计算路径接收时域信号和假设偏移量,根据预定延迟和假设偏移来计算时域信号与时域信号的延迟版本之间的相关系数,根据相关系数计算相关系数和, 并从相关系数和提取假设偏移的最大相关系数和。 控制器耦合到计算路径,用于向每个计算路径提供不同的假设偏移,并根据从计算路径获得的最大相关系数和检测SCO。 SCO补偿器接收SCO并对接收机的信号处理路径中生成的信号补偿SCO。
    • 18. 发明申请
    • INTEGRATED CIRCUIT FOR BEING APPLIED TO ELECTRONIC DEVICE, AND ASSOCIATED TESTING SYSTEM
    • 用于电子设备的集成电路及相关测试系统
    • US20080211529A1
    • 2008-09-04
    • US12099790
    • 2008-04-09
    • Yi-Chuan ChenHong-Ching Chen
    • Yi-Chuan ChenHong-Ching Chen
    • G01R31/02
    • G01R31/31719
    • An integrated circuit (IC) for being applied to an electronic device includes: a control circuit for controlling the electronic device; and a signal generation unit coupled to the control circuit for generating at least one signal inside the IC as an output signal and outputting the output signal to another IC for testing. A testing system includes at least one testing device and a plurality of ICs that are tested by the testing device. The ICs are coupled to the testing device. Each IC of the ICs is for being applied to an electronic device and includes: a control circuit for controlling the electronic device; and a signal generation unit coupled to the control circuit for generating at least one signal inside the IC as an output signal and outputting the output signal to one of the other IC(s) for testing.
    • 一种用于电子设备的集成电路(IC)包括:用于控制电子设备的控制电路; 以及耦合到控制电路的信号生成单元,用于在IC内产生至少一个作为输出信号的信号,并将输出信号输出到另一IC用于测试。 测试系统包括至少一个测试设备和由测试设备测试的多个IC。 IC耦合到测试设备。 IC的每个IC用于应用于电子设备,并且包括:用于控制电子设备的控制电路; 以及耦合到所述控制电路的信号生成单元,用于在所述IC内产生至少一个作为输出信号的信号,并将所述输出信号输出到所述另一个IC中以进行测试。