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11. 发明申请

US20110250562A1 Medical or Dental Handpiece 有权
标题翻译：医疗或牙科手机
公开(公告)号：US20110250562A1
公开(公告)日：2011-10-13
申请号：US13083336
申请日：2011-04-08
申请人： Hitoshi TANAKA , Shozo Nakayama
发明人： Hitoshi TANAKA , Shozo Nakayama
IPC分类号： A61C1/12 , F16H1/04
CPC分类号： A61C1/185 , A61B17/00 , A61B17/32002 , A61C1/06 , A61C1/12 , Y10T74/19679
摘要： A medical or dental handpiece has a grip 3. The grip 3 includes first to third rotation shafts 101, 201, and 301. The first and second shafts are connected through a first gear mechanism 1000 and the second and third shafts are connected through a second gear mechanism 2000 so that a rotation is transmitted from the first shaft through the first gear mechanism to the second shaft and then from the second shaft through the second gear mechanism to the third shaft. The first or second gear mechanism has an internal gear secured on shaft and an external gear secured on the other shaft, the internal and the external gears being engaged with each other. The external gear is substantially enclosed within a cylindrical plane 1001, 2001 extending along a peripheral edge of the internal gear.
摘要翻译：医用或牙科手柄具有把手3.手柄3包括第一至第三旋转轴101,201和301.第一和第二轴通过第一齿轮机构1000连接，第二和第三轴通过第二轴连接齿轮机构2000，使得旋转从第一轴通过第一齿轮机构传递到第二轴，然后从第二轴通过第二齿轮机构传递到第三轴。第一或第二齿轮机构具有固定在轴上的内齿轮和固定在另一轴上的外齿轮，内齿轮和外齿轮彼此啮合。外齿轮基本上封闭在沿着内齿轮的周缘延伸的圆柱面1001,2001内。

12. 发明申请

US20090115402A1 VOLTAGE DETECTING CIRCUIT AND SEMICONDUCTOR DEVICE INCLUDING THE SAME 有权
标题翻译：电压检测电路和包括其的半导体器件
公开(公告)号：US20090115402A1
公开(公告)日：2009-05-07
申请号：US12259923
申请日：2008-10-28
申请人： Koichiro HAYASHI , Hitoshi TANAKA
发明人： Koichiro HAYASHI , Hitoshi TANAKA
IPC分类号： G01R1/20
CPC分类号： G01R19/0084 , G01R19/16519 , G01R19/16552
摘要： A voltage detecting circuit detects a voltage between first and second wirings, and comprises at least first and second transistors connected in series between the first and second wirings, wherein a first reference voltage is supplied to a gate of the first transistor, a gate and a drain of the second transistor are short-circuited, and a detection signal is output from a connection point between a drain of the first transistor and a source of the second transistor.
摘要翻译：电压检测电路检测第一和第二布线之间的电压，并且包括串联连接在第一和第二布线之间的至少第一和第二晶体管，其中第一参考电压被提供给第一晶体管的栅极，栅极和第二晶体管的漏极短路，并且从第一晶体管的漏极和第二晶体管的源极之间的连接点输出检测信号。

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