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11. 发明申请

US20100079758A1 Inspection device, inspection method, and program 有权
标题翻译：检验装置，检验方法和程序
公开(公告)号：US20100079758A1
公开(公告)日：2010-04-01
申请号：US12591744
申请日：2009-11-30
申请人： Toru Yoshikawa
发明人： Toru Yoshikawa
IPC分类号： G01J4/00
CPC分类号： G01N21/9501 , G01N21/21 , G01N21/956
摘要： An illuminating optical system of an inspection device selects an arbitrary wavelength region from the light source, and epi-illuminates the sample via the polarizer and the objective lens. A detecting optical system includes an analyzer having a polarization plane intersected with a polarization direction of the polarizer. Then, the detecting optical system detects light from the sample via the objective lens and the analyzer, and acquires a Fourier image of a sample surface based on this light. An imaging section images the Fourier image. An analyzing section performs computation for processing for determining a notable area to be affected by a state of the pattern more than other areas in the Fourier image.
摘要翻译：检查装置的照明光学系统从光源中选择任意的波长区域，并且经由偏振器和物镜对样品进行外照射。检测光学系统包括具有与偏振器的偏振方向相交的偏振面的分析器。然后，检测光学系统通过物镜和分析器检测来自样品的光，并且基于该光获取样品表面的付里叶图像。成像部分对傅里叶图像进行成像。分析部分执行用于处理的计算，用于确定要受图像状态影响的显着区域超过傅立叶图像中的其他区域。

12. 发明申请

US20090039545A1 SEALING STRUCTURE OF TERMINAL AND SEALING MATERIAL THEREFOR 审中-公开
标题翻译：密封端子的结构和密封材料
公开(公告)号：US20090039545A1
公开(公告)日：2009-02-12
申请号：US12248718
申请日：2008-10-09
申请人： Tetsuo Hayase , Ichizo Sakamoto , Takeshi Nishida , Yuji Watanabe , Toru Yoshikawa
发明人： Tetsuo Hayase , Ichizo Sakamoto , Takeshi Nishida , Yuji Watanabe , Toru Yoshikawa
IPC分类号： B29C65/40
CPC分类号： H01H50/14 , H01H50/023 , H01H2050/025
摘要： The present invention intends to provide a sealing structure of a terminal that is low in a processing temperature for sealing, easy in sealing operation and high in the productivity. In the invention, the thermal expansion coefficient of a sealing material is made equivalent to or more than the linear expansion coefficient of a metallic sealing case block by adding inorganic filler to a liquid thermosetting polymer.
摘要翻译：本发明提供一种端子的密封结构，其密封处理温度低，密封操作容易，生产率高。在本发明中，通过向液态热固性聚合物中添加无机填料，使密封材料的热膨胀系数等于或大于金属密封壳体块的线膨胀系数。

13. 发明授权

US5825462A Film cartridge storage apparatus 失效
标题翻译：胶片暗盒存储装置
公开(公告)号：US5825462A
公开(公告)日：1998-10-20
申请号：US569790
申请日：1995-12-08
申请人： Takahisa Miyamori , Yoshiyuki Yamaji , Toru Yoshikawa
发明人： Takahisa Miyamori , Yoshiyuki Yamaji , Toru Yoshikawa
IPC分类号： G03B27/62 , G03D13/00 , G03B27/00 , G03D17/00
CPC分类号： G03D13/003 , G03B27/6285
摘要： A film cartridge storage apparatus for storing a plurality of film cartridges 20 stacked one on another. The stored film cartridges 20 are extracted from the apparatus one after another from the lowermost cartridge in association with a pivotal member 83 of an individual feed mechanism 80; 18; 280 having a first arm portion 83a and a second arm portion 83b. The first arm portion 83a of the pivotal member 83 pivots between a first area and a second area to hold the lowermost film cartridge in the first area and also to feed the lowermost film cartridge in the second area. The second arm portion 83b of the pivotal member allows a film cartridge to fall toward the first arm portion in the first area and also prevents a film cartridge from falling toward the first arm portion in the second area. An elastic escape means 90; 190; 290 is provided for avoiding mutual interference between a film cartridge contacting the second arm portion and a pivotal locus of the second arm portion in the course of the pivotal movement of the second arm portion from the first area to the second area.
摘要翻译：一种用于存储多个彼此堆叠的胶片暗盒20的暗盒存储装置。存储的暗盒20从与单个进给机构80的枢转构件83相关联的最下面的盒中一个接一个地从装置中取出; 18; 280具有第一臂部83a和第二臂部83b。枢转构件83的第一臂部83a在第一区域和第二区域之间枢转，以将最下面的暗盒保持在第一区域中，并且还将最下面的暗盒送入第二区域。枢转构件的第二臂部分83b允许暗盒在第一区域中朝向第一臂部分落下，并且还防止暗盒在第二区域中朝向第一臂部落下。弹性逃逸装置90; 190; 290被设置用于在第二臂部分从第一区域到第二区域的枢转运动的过程中避免与第二臂部分接触的胶片暗盒与第二臂部分的枢转轨迹之间的相互干涉。

14. 发明授权

US08040512B2 Inspection device, inspection method, and program 有权
标题翻译：检验装置，检验方法和程序
公开(公告)号：US08040512B2
公开(公告)日：2011-10-18
申请号：US12591744
申请日：2009-11-30
申请人： Toru Yoshikawa
发明人： Toru Yoshikawa
IPC分类号： G01J4/00
CPC分类号： G01N21/9501 , G01N21/21 , G01N21/956
摘要： An illuminating optical system of an inspection device selects an arbitrary wavelength region from the light source, and epi-illuminates the sample via the polarizer and the objective lens. A detecting optical system includes an analyzer having a polarization plane intersected with a polarization direction of the polarizer. Then, the detecting optical system detects light from the sample via the objective lens and the analyzer, and acquires a Fourier image of a sample surface based on this light. An imaging section images the Fourier image. An analyzing section performs computation for processing for determining a notable area to be affected by a state of the pattern more than other areas in the Fourier image.
摘要翻译：检查装置的照明光学系统从光源中选择任意的波长区域，并且经由偏振器和物镜对样品进行外照射。检测光学系统包括具有与偏振器的偏振方向相交的偏振面的分析器。然后，检测光学系统通过物镜和分析器检测来自样品的光，并且基于该光获取样品表面的付里叶图像。成像部分对傅里叶图像进行成像。分析部分执行用于处理的计算，用于确定要受图像状态影响的显着区域超过傅立叶图像中的其他区域。

15. 发明授权

US06801440B2 Mounting structure for module substrates 有权
标题翻译：模块底板的安装结构
公开(公告)号：US06801440B2
公开(公告)日：2004-10-05
申请号：US09995643
申请日：2001-11-29
申请人： Keiji Inoue , Yasuo Ohashi , Toru Yoshikawa
发明人： Keiji Inoue , Yasuo Ohashi , Toru Yoshikawa
IPC分类号： H05K111
CPC分类号： H05K1/144 , H05K1/0269 , H05K1/141 , H05K3/303 , H05K3/3426 , H05K3/368 , H05K2201/09409 , H05K2201/10386 , H05K2203/082 , H05K2203/1572 , H05K2203/161 , H05K2203/168
摘要： A plurality of module substrates have circuit boards, respectively. The circuit boards are stacked with a space therebetween, and are connected to first end portions of connecting members. The second end portions of the connecting members are connected to connecting pads disposed on a motherboard. The module substrates are thus stacked and mounted on the motherboard so as to increase the mounting density. By causing the connecting members for the upper circuit board to project further than the connecting members for the lower circuit board, the connecting members for the upper and lower circuit boards are prevented from touching each other.
摘要翻译：多个模块基板分别具有电路板。电路板在它们之间堆叠起来，并连接到连接件的第一端部。连接构件的第二端部连接到设置在母板上的连接垫。因此，模块基板堆叠并安装在母板上，以增加安装密度。通过使上部电路基板的连接部件比下部电路基板的连接部件进一步突出，能够防止上下电路基板的连接部件相互接触。

16. 发明授权

US5138294A Electromagnetic induction device 失效
标题翻译：电磁感应装置
公开(公告)号：US5138294A
公开(公告)日：1992-08-11
申请号：US714945
申请日：1991-06-13
申请人： Toru Yoshikawa
发明人： Toru Yoshikawa
IPC分类号： H01F27/10 , H01F27/08
CPC分类号： H01F27/085
摘要： An electromagnetic induction device has coils of a plurality of phases and a duct through which a cooling medium is introduced into the coils to cool them. Guides are provided in the duct so asd to realize a substantially uniform distribution of the cooling medium to all coils. The flow rates of the cooling medium through the coils is substantially uniformallized so that the coils exhibit substantially the same temperature rise. As a consequence, any difference in the life between the coils is substantially eliminated.

17. 发明授权

US5130497A Insulating spacer disposed between two members differing in electrical potential 失效
标题翻译：设置在电位不同的两个构件之间的绝缘间隔物
公开(公告)号：US5130497A
公开(公告)日：1992-07-14
申请号：US710258
申请日：1991-06-04
申请人： Toru Yoshikawa
发明人： Toru Yoshikawa
IPC分类号： H01B17/34 , H01B17/36
CPC分类号： H01B17/34 , H01B17/36
摘要： An insulating spacer comprises a plurality of unit spacers each of which has a hollow portion. The unit spacers are disposed between two members, such as electrodes, so that side walls of peripheral portions of the unit spacers are not aligned on a plane between the two members. There is no possibility that the space between the two members may be filled, for the most part, with insulating solid material; and a narrow gap may be present at the remaining minor part of the space. Therefore, there is no possibility of a local concentration of electric field between the two members.
摘要翻译：绝缘间隔件包括多个单元间隔件，每个间隔件具有中空部分。单元间隔件设置在诸如电极的两个构件之间，使得单元间隔件的周边部分的侧壁在两个构件之间的平面上不对准。两个部件之间的空间绝大部分都不可能用绝缘固体材料填充; 并且狭窄的间隙可能存在于空间的剩余小部分。因此，两个部件之间不存在电场局部集中的可能性。

18. 发明授权

US07852550B2 Optical amplifying apparatus 有权
标题翻译：光放大装置
公开(公告)号：US07852550B2
公开(公告)日：2010-12-14
申请号：US12014514
申请日：2008-01-15
申请人： Takeo Okaniwa , Jie Wu , Nobuyuki Kagi , Toru Yoshikawa
发明人： Takeo Okaniwa , Jie Wu , Nobuyuki Kagi , Toru Yoshikawa
IPC分类号： H01S3/00
CPC分类号： H04B10/294 , H01S3/06754 , H01S3/09415 , H01S3/10015 , H01S3/10069 , H01S3/1301 , H01S3/1305 , H04B10/2931
摘要： The present invention provides an optical amplifying apparatus having: a CPU 11 for processing various signals; a plurality of circuits 17, 18 for controlling respective devices 4, 9 required for optical amplification; a first storing unit 14 for storing a program supplied from a user a gate array 12 for storing various parameters for controlling the devices 4, 9, the gate array being updated based on the program which is stored in the first storing unit 14 and sent via the CPU 11; a latch unit 13, provided between the gate array 12 and the circuits 17, 18, for interrupting a signal path from the gate array 12 to the circuits 17, 18 after receiving a starting signal of an update from the CPU 11 until the update being finished and for controlling the circuits 17, 18 based on the parameters stored in the gate array 12 before the signal path is interrupted; and a second storing unit 16 for, at least during the update, storing the various parameters which are stored in the gate array 12 before the update.
摘要翻译：本发明提供一种具有：用于处理各种信号的CPU 11的光放大装置; 用于控制光放大所需的各个装置4,9的多个电路17,18; 第一存储单元14，用于存储从用户提供的程序，用于存储用于控制设备4,9的各种参数的门阵列12，基于存储在第一存储单元14中的程序更新门阵列，并经由 CPU 11; 锁存单元13，设置在门阵列12和电路17,18之间，用于在接收到来自CPU 11的更新的起始信号直到更新为止之后中断从门阵列12到电路17,18的信号路径在信号路径被中断之前基于存储在门阵列12中的参数来完成并控制电路17,18; 以及第二存储单元16，用于至少在更新期间，存储在更新之前存储在门阵列12中的各种参数。

19. 发明申请

US20090046922A1 Surface Inspecting Apparatus 审中-公开
标题翻译：表面检测仪
公开(公告)号：US20090046922A1
公开(公告)日：2009-02-19
申请号：US11988119
申请日：2006-06-29
申请人： Toru Yoshikawa
发明人： Toru Yoshikawa
IPC分类号： G06K9/00
CPC分类号： G06T7/001 , G01N21/9501 , G01R31/311 , G06T2207/30148
摘要： A wafer to be inspected W is placed on an XY stage 1, and is positioned so that the location to be inspected is under an objective lens 2, after which an inspection image (RBG signals) is captured by a camera 3. Then, the incorporated reference image and inspection image are converted to hue by a computer 4. The two images that have been converted to hue are then compared, and defects are detected on the basis of this result. In this case, there is a table of combinations of RGB values with a high probability that pseudo-defects will occur in defect detection, and any pixels in the reference image having RGB values present in this table are not considered defects even if a defect is detected.
摘要翻译：要检查的晶片W放置在XY平台1上，并且被定位成使得被检查的位置在物镜2下方，之后由照相机3捕获检查图像（RBG信号）。然后，通过计算机4将合并的参考图像和检查图像转换为色调。然后比较已经转换为色调的两个图像，并且基于该结果检测缺陷。在这种情况下，存在RGB值的组合的表，在缺陷检测中会发生伪缺陷的高概率，并且在该表中存在的具有RGB值的参考图像中的任何像素都不被认为是缺陷，即使缺陷是检测到。

20. 发明授权

US07190238B2 Surface mounting crystal oscillator 有权
标题翻译：表面贴装晶体振荡器
公开(公告)号：US07190238B2
公开(公告)日：2007-03-13
申请号：US11156416
申请日：2005-06-20
申请人： Yasunori Hosokawa , Toru Yoshikawa , Heiji Takado
发明人： Yasunori Hosokawa , Toru Yoshikawa , Heiji Takado
IPC分类号： H03B5/32
CPC分类号： H03H9/0514 , H03H9/0547
摘要： The present invention relates to a surface mounting crystal oscillator in which an IC chip, a crystal element, and a circuit component are connected together by wire bonding and are housed within a main container having a concave section. The main container has a pair of opposing inner wall step portions along both sides in the longitudinal direction, and this pair of inner wall step portions are also each divided into an upper step portion and a lower-step portion of different heights along the longitudinal direction. At least one of the upper step portions of the pair of inner wall step portions supports one end portion in the lengthwise direction of the crystal element so that the lengthwise direction of the crystal element is aligned in the widthwise direction of the main container. The circuit component is disposed on an inner base surface of the main container below the crystal element.
摘要翻译：本发明涉及一种表面安装晶体振荡器，其中IC芯片，晶体元件和电路元件通过引线接合连接在一起，并且容纳在具有凹形部分的主容器内。主容器沿纵向方向具有一对相对的内壁台阶部分，并且这对内壁台阶部分也分别被分成上下台阶部分和沿纵向的不同高度的下台阶部分。所述一对内壁台阶部的上部台阶部中的至少一个支撑在所述结晶体的长度方向上的一个端部，使得所述结晶体的长度方向在所述主容器的宽度方向上排列。该电路部件设置在该主容器的内底面下方的晶体元件的下方。

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