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    • 12. 发明授权
    • Piezoelectric element and method for manufacturing
    • 压电元件及其制造方法
    • US07508120B2
    • 2009-03-24
    • US10543119
    • 2004-01-21
    • Morito AkiyamaNaohiro UenoHiroshi TateyamaNoriyuki Kuwano
    • Morito AkiyamaNaohiro UenoHiroshi TateyamaNoriyuki Kuwano
    • H01L41/09
    • H01L41/316
    • A lower electrode is formed on a silica glass substrate or a stainless substrate. Through a sputtering process, a thin film of aluminum nitride and/or zinc oxide is formed on the lower substrate so that the degree of dipole-orientation becomes 55% or more, and thereby a piezoelectric thin film is formed. And an upper electrode is formed on the piezoelectric thin film.A piezoelectric device has a piezoelectric layer made of aluminum nitride and/or zinc oxide. Aluminum nitride and zinc oxide with a crystal structure have inborn piezoelectric characteristics because their crystal structures are not symmetrical, they do not have Curie temperature unlike ferroelectrics, and in aluminum nitride and zinc oxide, magnetic transition does not occur even at high temperature, so that they never lose piezoelectric characteristics until crystal melts or sublimates.
    • 在石英玻璃基板或不锈钢基板上形成下电极。 通过溅射工艺,在下基板上形成氮化铝和/或氧化锌薄膜,使得偶极取向度达到55%以上,从而形成压电薄膜。 并且在压电薄膜上形成上电极。 压电装置具有由氮化铝和/或氧化锌制成的压电层。 具有晶体结构的氮化铝和氧化锌具有先天的压电特性,因为它们的晶体结构不对称,它们不像铁电体那样具有居里温度,并且在氮化铝和氧化锌中,即使在高温下也不会发生磁转变,因此 在晶体熔化或升华之前,它们不会失去压电特性。