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    • 14. 发明授权
    • Method for manufacturing perpendicular magnetic recording head
    • 制造垂直磁记录头的方法
    • US08137571B2
    • 2012-03-20
    • US12381972
    • 2009-03-17
    • Tomohiro OkadaHisashi KimuraTaku ShintaniTadashi Umezawa
    • Tomohiro OkadaHisashi KimuraTaku ShintaniTadashi Umezawa
    • B44C1/22
    • G11B5/1278G11B5/3116G11B5/3163
    • Embodiments of the present invention help to provide a method for manufacturing a perpendicular magnetic recording head including a main magnetic pole having a width that does not generally vary. According to one embodiment, a magnetic film, a first inorganic mask film, an organic film, a second inorganic mask film, and a resist pattern are formed in this order. Reactive ion etching (RIE) is performed using the resist pattern as a mask to etch the second inorganic mask film and the organic film and form a mask for the subsequent step. A flow rate of an Ar gas is then controlled, and ion milling is performed, to correct a difference between the width of the mask located at the central portion of the wafer and the width of the mask located at the outer peripheral portion of the wafer. The magnetic film is processed to have a uniform track width. Ion milling is then performed to form the main magnetic pole having an inverted trapezoidal shape.
    • 本发明的实施例有助于提供一种用于制造垂直磁记录头的方法,所述垂直磁记录头包括具有通常不变化的宽度的主磁极。 根据一个实施例,依次形成磁性膜,第一无机掩模膜,有机膜,第二无机掩模膜和抗蚀剂图案。 使用抗蚀剂图案作为掩模进行反应离子蚀刻(RIE),以蚀刻第二无机掩模膜和有机膜并形成用于后续步骤的掩模。 然后控制Ar气体的流量,进行离子铣削,以校正位于晶片中心部分的掩模的宽度与位于晶片外周部分的掩模的宽度之间的差异 。 磁膜被处理成具有均匀的轨迹宽度。 然后进行离子铣削以形成具有倒梯形形状的主磁极。
    • 15. 发明申请
    • Method for manufacturing perpendicular magnetic recording head
    • 制造垂直磁记录头的方法
    • US20090236307A1
    • 2009-09-24
    • US12381972
    • 2009-03-17
    • Tomohiro OkadaHisashi KimuraTaku ShintaniTadashi Umezawa
    • Tomohiro OkadaHisashi KimuraTaku ShintaniTadashi Umezawa
    • B44C1/22
    • G11B5/1278G11B5/3116G11B5/3163
    • Embodiments of the present invention help to provide a method for manufacturing a perpendicular magnetic recording head including a main magnetic pole having a width that does not generally vary. According to one embodiment, a magnetic film, a first inorganic mask film, an organic film, a second inorganic mask film, and a resist pattern are formed in this order. Reactive ion etching (RIE) is performed using the resist pattern as a mask to etch the second inorganic mask film and the organic film and form a mask for the subsequent step. A flow rate of an Ar gas is then controlled, and ion milling is performed, to correct a difference between the width of the mask located at the central portion of the wafer and the width of the mask located at the outer peripheral portion of the wafer. The magnetic film is processed to have a uniform track width. Ion milling is then performed to form the main magnetic pole having an inverted trapezoidal shape.
    • 本发明的实施例有助于提供一种用于制造垂直磁记录头的方法,所述垂直磁记录头包括具有通常不变化的宽度的主磁极。 根据一个实施例,依次形成磁性膜,第一无机掩模膜,有机膜,第二无机掩模膜和抗蚀剂图案。 使用抗蚀剂图案作为掩模进行反应离子蚀刻(RIE),以蚀刻第二无机掩模膜和有机膜并形成用于后续步骤的掩模。 然后控制Ar气体的流量,进行离子铣削,以校正位于晶片中心部分的掩模的宽度与位于晶片外周部分的掩模的宽度之间的差异 。 磁膜被处理成具有均匀的轨迹宽度。 然后进行离子铣削以形成具有倒梯形形状的主磁极。