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    • 16. 发明申请
    • Method and apparatus for firmware execution and provision
    • 用于固件执行和提供的方法和装置
    • US20070226724A1
    • 2007-09-27
    • US11388691
    • 2006-03-24
    • Chi-Hung Huang
    • Chi-Hung Huang
    • G06F9/44
    • G06F9/30178
    • Methods and apparatuses for firmware execution and provision are provided. A ROM device stores compressed firmware. A decompressor is coupled to the ROM device, extracting the compressed firmware to a first instruction stream comprising at least one absolute address instruction. A post-filter, coupled to the decompressor, filters the first instruction stream to generate a second instruction stream, whereby the absolute address instruction is converted to a relative address instruction. A RAM device, coupled to the post-filter, stores the second instruction stream filtered from the post-filter. A CPU is coupled to the RAM device, executing the second instruction stream stored in the RAM device.
    • 提供了用于固件执行和提供的方法和装置。 ROM设备存储压缩固件。 解压缩器耦合到ROM设备,将压缩的固件提取到包括至少一个绝对地址指令的第一指令流。 耦合到解压缩器的后置滤波器对第一指令流进行滤波以产生第二指令流,由此将绝对地址指令转换为相对地址指令。 耦合到后置滤波器的RAM设备存储从后置滤波器滤波的第二指令流。 CPU耦合到RAM设备,执行存储在RAM设备中的第二指令流。
    • 19. 发明授权
    • Non-visible particle detection based on smart phone
    • 基于智能手机的不可见粒子检测
    • US08735842B2
    • 2014-05-27
    • US13355525
    • 2012-01-21
    • Din Ping TsaiChih-Chieh WuTai-Shan LiaoChi-Hung Huang
    • Din Ping TsaiChih-Chieh WuTai-Shan LiaoChi-Hung Huang
    • G01T1/20
    • G01T1/023G01T7/00
    • A non-visible particle detection device includes an optical module capable of converting an ionizing radiation into visible light. The optical module includes has an attachment unit that is configured to removably attach the optical module to the image capturing module of a mobile device. The image capturing module generates a photon digital image based on the photons converted from the ionizing radiation. The mobile device can be implemented with a radiation dose determining module to execute a radiation dose equivalent calculation method. Based on the pixel brightness analysis of the photon digital image, the radiation equivalent dose can be determined. This method sums up the total brightness of all pixels in the images, determines whether the total brightness is smaller than the minimum effective brightness, and determines the radiation equivalent dose when the total brightness is equal to or larger than the minimum effective brightness.
    • 不可见的粒子检测装置包括能够将电离辐射转换成可见光的光学模块。 光学模块包括具有附接单元,其被配置为将光学模块可移除地附接到移动设备的图像捕获模块。 图像捕获模块基于从电离辐射转换的光子产生光子数字图像。 移动设备可以用辐射剂量确定模块实现,以执行辐射剂量等效的计算方法。 基于光子数字图像的像素亮度分析,可以确定辐射等效剂量。 该方法将图像中所有像素的总亮度相加,确定总亮度是否小于最小有效亮度,并且当总亮度等于或大于最小有效亮度时确定辐射等效剂量。
    • 20. 发明授权
    • Apparatus and method for quantifying residual stress of a birefringent material
    • 用于量化双折射材料的残余应力的装置和方法
    • US08605264B2
    • 2013-12-10
    • US13158434
    • 2011-06-12
    • Wei-Chung WangChi-Hung HuangYu-Cheng TsengPo-Chi Sung
    • Wei-Chung WangChi-Hung HuangYu-Cheng TsengPo-Chi Sung
    • G01B11/16
    • G01L5/0047G01L1/24
    • An apparatus for quantifying residual stress of a birefringent material comprises a light source generating light; a vertical polarizer converting a beam of light into a beam with vertical polarization; a standard material being mounted in front of the vertical polarizer; a horizontal polarizer converting a beam of light into a beam with horizontal polarization; an applied force unit applying different forces to the standard material; a spectrometer being mounted in front of the horizontal polarizer and recording intensity of light passing through the horizontal polarizer and transmittance of the standard material and a processing module being connected to the spectrometer, deriving a stress formula from the applied forces and transmittances of the standard material and obtaining a stress distribution of the birefringent material. A method for quantifying residual stress of a birefringent material is also disclosed.
    • 用于量化双折射材料的残余应力的装置包括产生光的光源; 垂直偏振器将光束转换成具有垂直偏振的光束; 标准材料安装在垂直偏振器的前面; 水平偏振器将光束转换成具有水平偏振的光束; 施加的力单元对标准材料施加不同的力; 安装在水平偏振器前面的光谱仪和记录通过水平偏振器的光的强度和标准材料的透射率以及连接到光谱仪的处理模块,从施加的力和标准材料的透射率得出应力公式 并获得双折射材料的应力分布。 还公开了一种用于量化双折射材料的残余应力的方法。