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    • 11. 发明授权
    • On die termination device and semiconductor memory device including the same
    • 在晶片终端器件和包括其的半导体存储器件中
    • US07825683B2
    • 2010-11-02
    • US12181628
    • 2008-07-29
    • Ki-Ho KimJi-Eun Jang
    • Ki-Ho KimJi-Eun Jang
    • H03K17/16
    • G11C5/063G11C7/1051G11C7/1057G11C2207/2254
    • On die termination (ODT) device that can reduce the number of lines for transferring calibration codes to reduce the size of a chip including the ODT device. The ODT device includes a calibration circuit configured to generate calibration codes for determining a termination resistance, a counting circuit configured to generate counting codes increasing with time. A transferring circuit of the device is configured sequentially to transfer the calibration codes in response to the counting codes. A receiving circuit is configured sequentially to receive the calibration codes from the transferring circuit in response to the counting codes. A termination resistance circuit of the device is configured to perform impedance matching using a resistance determined according to the calibration codes.
    • 在终端(ODT)设备上,可以减少用于传送校准码的行数,以减少包括ODT设备在内的芯片的尺寸。 ODT装置包括:校准电路,被配置为产生用于确定终止电阻的校准码;计数电路,被配置为产生随时间增加的计数码。 依次配置设备的传送电路以响应于计数代码传送校准代码。 接收电路被顺序配置以响应于计数代码从传送电路接收校准码。 该器件的终端电阻电路被配置为使用根据校准码确定的电阻来执行阻抗匹配。
    • 12. 发明授权
    • Semiconductor memory device and method for driving the same
    • 半导体存储器件及其驱动方法
    • US07660171B2
    • 2010-02-09
    • US11823878
    • 2007-06-29
    • Ji-Eun Jang
    • Ji-Eun Jang
    • G11C7/00
    • G11C7/22G11C7/1051G11C7/1066G11C7/20G11C7/222G11C11/4072G11C11/4076G11C11/4093
    • A semiconductor memory device includes: a first count unit for counting a delayed locked loop (DLL) clock in response to a clock enable signal; a first delay unit for delaying the clock enable signal for a delay time which corresponds to a delay amount of a delay model included in a DLL circuit; a second count unit for counting an external clock in response to the delayed clock enable signal; a comparison unit for comparing an output of the first count unit with an output of the second count unit in order to generate a latency signal; and an output enable signal generation unit for generating an output enable signal by using the latency signal.
    • 半导体存储器件包括:第一计数单元,用于响应于时钟使能信号对延迟锁定环(DLL)时钟进行计数; 第一延迟单元,用于将对应于包括在DLL电路中的延迟模型的延迟量的延迟时间延迟所述时钟使能信号; 第二计数单元,用于响应延迟的时钟使能信号对外部时钟进行计数; 比较单元,用于将第一计数单元的输出与第二计数单元的输出进行比较,以产生等待时间信号; 以及输出使能信号生成单元,用于通过使用等待时间信号来产生输出使能信号。
    • 13. 发明申请
    • Semiconductor memory device
    • 半导体存储器件
    • US20090003096A1
    • 2009-01-01
    • US12003680
    • 2007-12-31
    • Kyung-Whan KimJi-Eun Jang
    • Kyung-Whan KimJi-Eun Jang
    • G11C7/22
    • G11C7/22G11C7/1045G11C11/4076G11C11/408G11C2207/2254
    • A semiconductor memory device is provided to improve the tAA characteristics. The semiconductor memory device includes: a discrimination signal generating unit for generating a first discrimination signal denoting a write operation of the semiconductor memory device; a selective delay unit for delaying a command-group signal in response to a second discrimination signal; and a fuse unit for generating the second discrimination signal based on the first discrimination signal, the second discrimination signal determining whether the selective delay unit selectively delays the command-group signal in response to the first discrimination signal.
    • 提供半导体存储器件以改善tAA特性。 半导体存储器件包括:识别信号产生单元,用于产生表示半导体存储器件的写入操作的第一鉴别信号; 选择延迟单元,用于响应于第二鉴别信号延迟命令组信号; 以及熔丝单元,用于基于所述第一判别信号产生所述第二判别信号,所述第二判别信号确定所述选择延迟单元是否响应于所述第一判别信号有选择地延迟所述命令组信号。
    • 15. 发明申请
    • Synchronous semiconductor memory device
    • 同步半导体存储器件
    • US20070070714A1
    • 2007-03-29
    • US11478087
    • 2006-06-30
    • Ji-Eun Jang
    • Ji-Eun Jang
    • G11C7/10
    • G11C11/4087G11C7/22G11C7/225G11C11/4076
    • A synchronous semiconductor memory device can perform an internal operation for an input address with reliability regardless of the frequency of a system clock. The semiconductor memory device includes an internal operation detecting unit for generating a flag signal in response to internal command signals; a delay unit for delaying the flag signal for a programmed time; and an enable signal generating unit for generating an enable signal activated in response to a transition timing of the flag signal and inactivated in response to a transition timing of the delayed flag signal, wherein an internal address derived from an external address is transferred to a core area while the enable signal is activated.
    • 同步半导体存储器件可以对输入地址进行内部操作,而与系统时钟的频率无关。 半导体存储器件包括:内部操作检测单元,用于响应于内部命令信号产生标志信号; 延迟单元,用于将所述标志信号延迟编程时间; 以及使能信号生成单元,用于响应于所述标志信号的转换定时而产生使能信号,并响应于所述延迟标志信号的转换定时而被去激活,其中从外部地址导出的内部地址被传送到核心 区域,同时使能信号被激活。
    • 16. 发明授权
    • Apparatus for generating power-up signal
    • 用于产生上电信号的装置
    • US07106112B2
    • 2006-09-12
    • US10875403
    • 2004-06-25
    • Ji-Eun Jang
    • Ji-Eun Jang
    • H03L7/00
    • H03K17/223G11C5/143G11C7/20
    • An apparatus for generating a power-up signal in a semiconductor memory device includes a signal generator for generating the power-up signal from a supply voltage in response to a first control signal, a temperature sensing block for sensing a circumference temperature and enabling one of a plurality of second control signals in response to the circumference temperature, and a selection block for receiving the plurality of divided voltages and outputting one of the plurality of divided voltages to the signal generator as the first control signal in response to a corresponding second control signal, wherein the divided voltages are generated by dividing a supply voltage.
    • 一种用于在半导体存储器件中产生上电信号的装置包括:信号发生器,用于响应于第一控制信号从电源电压产生上电信号;温度检测块,用于感测周围温度, 响应于所述周围温度的多个第二控制信号;以及选择块,用于接收所述多个分压,并响应于相应的第二控制信号,将所述多个分压的所述多个分压中的一个输出到所述信号发生器作为所述第一控制信号 其中,通过分压电源电压来产生分压。
    • 19. 发明申请
    • Reference voltage generating circuit for outputting multi-level reference voltage using fuse trimming
    • 参考电压发生电路,用于使用熔丝修整输出多电平参考电压
    • US20050024129A1
    • 2005-02-03
    • US10746494
    • 2003-12-23
    • Ji-Eun Jang
    • Ji-Eun Jang
    • G11C5/14G05F1/46G05F1/10
    • G05F1/465
    • A reference voltage generating circuit includes voltage outputting means for outputting a reference voltage corresponding to a difference between a band gap reference voltage and an input voltage; a first resistor having one end that is coupled to the output of the voltage outputting unit; first variable resistor unit having a plurality of second resistors that are serially coupled between the first resistor and a ground voltage, for providing the input voltage of the voltage outputting unit with a first trimming voltage that is inputted to one end of selected one of the plurality of the second resistors in response to decoded signals for trimming the reference voltage; second variable resistor having a plurality of third resistors coupled serially between the first resistor and the ground voltage, the third resistors having different resistances from the second resistors, for providing the input voltage of the voltage outputting unit with a second trimming voltage that is inputted to one end of selected one of the plurality of the third resistors in response to the decoded signals for trimming the reference voltage; and selecting unit for selectively providing the first trimming voltage or the second trimming voltage to the input voltage of the voltage outputting unit.
    • 参考电压产生电路包括电压输出装置,用于输出对应于带隙基准电压和输入电压之间的差的参考电压; 第一电阻器,其一端耦合到电压输出单元的输出; 第一可变电阻器单元,具有串联地耦合在第一电阻器和接地电压之间的多个第二电阻器,用于提供电压输出单元的输入电压,该第一微调电压被输入到多个选定的一个的一端 的第二电阻器响应于用于修整参考电压的解码信号; 所述第二可变电阻器具有串联地耦合在所述第一电阻器和所述接地电压之间的多个第三电阻器,所述第三电阻器具有与所述第二电阻器不同的电阻,用于向所述电压输出单元提供输入至所述第二电阻器的第二微调电压 响应于用于修整参考电压的解码信号,多个第三电阻器中的所选择的一个的一端; 以及选择单元,用于选择性地将第一微调电压或第二微调电压提供给电压输出单元的输入电压。