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    • 13. 发明授权
    • Liquid crystal display device
    • 液晶显示装置
    • US08134669B2
    • 2012-03-13
    • US11366458
    • 2006-03-03
    • Yuichi InoueTakahiro SasakiTakashi Sasabayashi
    • Yuichi InoueTakahiro SasakiTakashi Sasabayashi
    • G02F1/1337
    • G09G3/3648G02F1/133707G02F2001/133776G09G3/207G09G2320/0252
    • Disclosed is a liquid crystal display device including a TFT substrate on which a picture element electrode is provided for each picture element, a counter substrate having a common electrode provided thereon, and a liquid crystal contained between the TFT and counter substrates, the liquid crystal display device achieving to shorten response time (rise time) by utilizing the following phenomenon that when a voltage applied to the picture element electrode changes from a first voltage (e.g., black display voltage) to a second voltage (e.g., white display voltage), transmittance increases to maximum transmittance with a change in the state of the alignment of liquid crystal molecules and then decreases to transmittance in a stable state corresponding to the second voltage.
    • 公开了一种液晶显示装置,包括:TFT基板,在其上设置有用于每个图像元件的像素电极;对置基板,其上设置有公共电极;以及液晶,包含在TFT和对向基板之间,液晶显示器 通过利用以下现象实现缩短响应时间(上升时间)的装置:当施加到像素电极的电压从第一电压(例如,黑色显示电压)变为第二电压(例如,白色显示电压)时,透射率 随着液晶分子的取向状态的变化而增加到最大透射率,然后在对应于第二电压的稳定状态下降低到透射率。
    • 15. 发明申请
    • AUTOMATIC ANALYZER
    • 自动分析仪
    • US20110058984A1
    • 2011-03-10
    • US12990789
    • 2009-05-01
    • Takahiro SasakiYoichi ArugaHidetsugu Tanoue
    • Takahiro SasakiYoichi ArugaHidetsugu Tanoue
    • G01N21/00
    • G01N21/6428G01J1/32G01J3/02G01J3/027G01J3/4406G01N2021/6419G01N2021/6421G01N2021/6441G01N2035/0491G01N2201/062
    • The automatic analyzer uses a marker that is to be attached to a measurement object. The marker is made of a substance that becomes excited when irradiated. The automatic analyzer has a function of varying irradiation intensity, and controls the intensity of light emitted from an item marker by adjusting the irradiation intensity for each analysis item or for each analysis vessel. Further, the automatic analyzer has a function of controlling the at least one of the position and angle of an analysis vessel during irradiation, and controls the amount of radiation to the measurement object by adjusting at least one of the distance and angle between an irradiation light source and analysis vessel for each analysis item. Furthermore, the automatic analyzer has a function of varying the integration time of photometric means and controls the integration time for each analysis item or for each analysis vessel.
    • 自动分析仪使用要附着在测量对象上的标记。 标记由照射时变得激发的物质制成。 自动分析仪具有改变照射强度的功能,并且通过调整每个分析项目或每个分析容器的照射强度来控制从物品标记物发射的光的强度。 此外,自动分析仪具有控制分析容器在照射期间的位置和角度中的至少一个的功能,并且通过调节照射光线之间的距离和角度中的至少一个来控​​制对测量对象的辐射量 来源和分析船。 此外,自动分析仪具有改变测光装置的积分时间并且控制每个分析项目或每个分析容器的积分时间的功能。