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11. 发明申请

US20090108923A1 Structure for Precision Integrated Phase Lock Loop Circuit Loop Filter 失效
标题翻译：精密集成锁相环电路环路滤波器结构
公开(公告)号：US20090108923A1
公开(公告)日：2009-04-30
申请号：US12129514
申请日：2008-05-29
申请人： David William Boerstler , Jieming Qi
发明人： David William Boerstler , Jieming Qi
IPC分类号： G05F1/10 , G06F17/50
CPC分类号： H03H11/245
摘要： A design structure for a loop filter in a phase lock loop circuit comprising a reference precision resistor, a first and second FET, wherein the gate of the first FET is tied to the gate of the second FET, and a filter capacitor connected to the first FET for producing a capacitor voltage. The capacitor voltage is applied to the source of the first FET, the source of the second FET, and the bottom of the reference precision resistor acting as a virtual ground. The capacitor voltage generated by the filter capacitor sets the bias point of the second FET such that the second FET comprises characteristics of an integrated precision resistor. A predetermined voltage generated by the second FET is applied to the gate of the first FET to set the bias point of the first FET such that the first FET comprises characteristics of an integrated precision resistor.
摘要翻译：一种锁相环电路中的环路滤波器的设计结构，包括参考精密电阻器，第一和第二FET，其中第一FET的栅极连接到第二FET的栅极，以及连接到第一FET的滤波电容器用于产生电容器电压的FET。电容器电压施加到第一FET的源极，第二FET的源极和参考精密电阻的底部作为虚拟接地。由滤波电容产生的电容器电压设定第二FET的偏置点，使得第二FET包括集成精密电阻器的特性。将由第二FET产生的预定电压施加到第一FET的栅极，以设置第一FET的偏置点，使得第一FET包括集成精密电阻器的特性。

12. 发明授权

US07511554B2 Systems and methods for level shifting using AC coupling 失效
标题翻译：使用交流耦合进行电平转换的系统和方法
公开(公告)号：US07511554B2
公开(公告)日：2009-03-31
申请号：US11764262
申请日：2007-06-18
申请人： Masaaki Kaneko , David W. Boerstler , Eskinder Hailu , Jieming Qi
发明人： Masaaki Kaneko , David W. Boerstler , Eskinder Hailu , Jieming Qi
IPC分类号： H03L5/00
CPC分类号： H03K19/01812 , H03K19/01831
摘要： Systems and methods for conveying signals between integrated circuit (IC) components in domains having different supply voltages. AC coupling is used to increase the speed at which the common mode voltage of a signal is shifted from one level to another. One embodiment comprises a method for level shifting a binary signal in an IC. This method includes receiving an input binary signal and decoupling its AC component from its common mode component. A second common mode component is added to the AC component, providing a binary output signal. The common mode voltage of the input signal may be greater (or smaller) than that of the output signal. In one embodiment of the method, duty cycle compensation (DCC) is performed. The DCC drives the duty cycle toward a desired value.
摘要翻译：在具有不同电源电压的域中的集成电路（IC）组件之间传送信号的系统和方法。 AC耦合用于增加信号的共模电压从一个电平转移到另一个电平的速度。一个实施例包括用于电平移位IC中的二进制信号的方法。该方法包括接收输入二进制信号并将其AC分量与其共模分量去耦。第二共模分量被添加到AC分量，提供二进制输出信号。输入信号的共模电压可以大于（或更小）输出信号的共模电压。在该方法的一个实施例中，执行占空比补偿（DCC）。 DCC将占空比驱动到所需的值。

13. 发明申请

US20090021314A1 Structure for a Phase Locked Loop with Adjustable Voltage Based on Temperature 有权
标题翻译：基于温度的具有可调电压的锁相环结构
公开(公告)号：US20090021314A1
公开(公告)日：2009-01-22
申请号：US12128654
申请日：2008-05-29
申请人： David W. Boerstler , Nathaniel R. Chadwick , Eskinder Hailu , Kirk D. Peterson , Jieming Qi
发明人： David W. Boerstler , Nathaniel R. Chadwick , Eskinder Hailu , Kirk D. Peterson , Jieming Qi
IPC分类号： H03L1/02 , G05F1/567
CPC分类号： H03L1/022 , H03L1/04 , H03L7/0995
摘要： A design structure for an apparatus for utilizing a single set of one or more thermal sensors, e.g., thermal diodes, provided on the integrated circuit device, chip, etc., to control the operation of the integrated circuit device, associated cooling system, and high-frequency PLLs, is provided. By utilizing a single set of thermal sensors to provide multiple functions, e.g., controlling the operation of the integrated circuit device, the cooling system, and the PLLs, silicon real-estate usage is reduced through combining circuitry functionality. Moreover, the integrated circuit device yield is improved by reducing circuitry complexity and increasing PLL robustness to temperature. Furthermore, the PLL circuitry operating range is improved by compensating for temperature.
摘要翻译：一种用于利用设置在集成电路器件，芯片等上的单组一个或多个热传感器（例如热二极管）的设备的设计结构，以控制集成电路器件，相关联的冷却系统和提供高频PLL。通过利用单组热传感器来提供多种功能，例如控制集成电路器件，冷却系统和PLL的操作，通过组合电路功能降低硅的不动产使用。此外，通过降低电路复杂度并增加PLL对于温度的鲁棒性，可以提高集成电路器件的产量。此外，通过补偿温度来提高PLL电路的工作范围。

14. 发明申请

US20090002038A1 Phase Locked Loop with Stabilized Dynamic Response 审中-公开
标题翻译：具有稳定动态响应的锁相环
公开(公告)号：US20090002038A1
公开(公告)日：2009-01-01
申请号：US11770867
申请日：2007-06-29
申请人： David W. Boerstler , Eskinder Hailu , Jieming Qi
发明人： David W. Boerstler , Eskinder Hailu , Jieming Qi
IPC分类号： H03L7/085 , H03L7/08
CPC分类号： H03L7/18 , H03L7/093 , H03L7/099 , H03L7/10
摘要： A hybrid phase locked loop (PLL) circuit for obtaining stabilized dynamic response and independent adjustment of damping factor and loop bandwidth is provided. The hybrid PLL circuit of the illustrative embodiments includes the resistance/capacitance (RC) filter elements of a conventional RC PLL and the feed-forward path from the output of the phase frequency detector to the voltage controlled oscillator (VCO). The hybrid PLL essentially enhances the performance of the conventional feed-forward PLL by providing the RC filter whose components can be weighted to provide a dynamic response that is significantly less sensitive to parameter variation and which allows loop bandwidth optimization without sacrificing damping.
摘要翻译：提供了用于获得稳定的动态响应和阻尼因子和环路带宽的独立调整的混合锁相环（PLL）电路。说明性实施例的混合PLL电路包括常规RC PLL的电阻/电容（RC）滤波器元件以及从相位频率检测器的输出到压控振荡器（VCO）的前馈路径。混合PLL本质上通过提供RC滤波器来增强常规前馈PLL的性能，RC滤波器的组件可以被加权，以提供对参数变化敏感性较低的动态响应，并且允许环路带宽优化而不牺牲阻尼。

15. 发明申请

US20080246524A1 Duty Cycle Correction Circuit Whose Operation is Largely Independent of Operating Voltage and Process 失效
标题翻译：占空比校正电路，其操作与工作电压和工艺大不相同
公开(公告)号：US20080246524A1
公开(公告)日：2008-10-09
申请号：US12140335
申请日：2008-06-17
申请人： David W. Boerstler , Eskinder Hailu , Jieming Qi
发明人： David W. Boerstler , Eskinder Hailu , Jieming Qi
IPC分类号： H03K3/017
CPC分类号： H03K5/1565
摘要： A Duty Cycle Correction (DCC) circuit is provide in which pairs of field effect transistors (FETs) in known DCC circuit topologies are replaced with linear resistors coupled to switches of the DCC circuit such that when the switch is open, the input signal is routed through the linear resistors. The linear resistors are more tolerant of process, voltage and temperature (PVT) fluctuations than FETs and thus, the resulting DCC circuit provides a relatively smaller change in DCC correction range with PVT fluctuations than the known DCC circuit topology that employs FETs. The linear resistors may be provided in parallel with the switches and in series with a pair of FETs having relatively large resistance values. The linear resistors provide resistance that pulls-up or pulls-down the pulse width of the input signal so as to provide correction to the duty cycle of the input signal.
摘要翻译：提供了一种占空比校正（DCC）电路，其中已知DCC电路拓扑中的成对的场效应晶体管（FET）被连接到DCC电路的开关的线性电阻器代替，使得当开关断开时，输入信号被路由通过线性电阻。线性电阻器比FET更容忍工艺，电压和温度（PVT）波动，因此，所得到的DCC电路与使用FET的已知DCC电路拓扑结构相比，具有PVT波动的DCC校正范围相对较小的变化。线性电阻器可以与开关并联设置并且与具有相对较大电阻值的一对FET串联。线性电阻器提供上拉或下拉输入信号的脉冲宽度的电阻，以便对输入信号的占空比提供校正。

16. 发明授权

US07330061B2 Method and apparatus for correcting the duty cycle of a digital signal 失效
标题翻译：用于校正数字信号占空比的方法和装置
公开(公告)号：US07330061B2
公开(公告)日：2008-02-12
申请号：US11381050
申请日：2006-05-01
申请人： David William Boerstler , Eskinder Hailu , Jieming Qi
发明人： David William Boerstler , Eskinder Hailu , Jieming Qi
IPC分类号： H03K5/04
CPC分类号： H03K5/1565
摘要： The disclosed methodology and apparatus measure and correct the duty cycle of a reference clock signal that a clock circuit supplies to a duty cycle measurement (DCM) circuit. In one embodiment, the DCM circuit includes a capacitor driven by a charge pump. The reference clock signal drives the charge pump. The clock circuit varies the duty cycle of the reference clock signal among a number of known duty cycle values. The DCM circuit stores resultant capacitor voltage values corresponding to each of the known duty cycle values in a data store. The DCM circuit applies a test clock signal having an unknown duty cycle to the capacitor via the charge pump, thus charging the capacitor to a new voltage value that corresponds to the duty cycle of the test clock signal. Control software accesses the data store to determine the duty cycle to which the test clock signal corresponds, thus providing a measured duty cycle. The apparatus generates an error signal when the measured duty cycle varies from a predetermined duty cycle. The apparatus includes a variable duty cycle clock generator that alters the duty cycle of the test clock signal to reduce the error.
摘要翻译：所公开的方法和装置测量并校正时钟电路提供给占空比测量（DCM）电路的参考时钟信号的占空比。在一个实施例中，DCM电路包括由电荷泵驱动的电容器。参考时钟信号驱动电荷泵。时钟电路在多个已知的占空比值之间改变参考时钟信号的占空比。 DCM电路将对应于每个已知占空比值的合成电容电压值存储在数据存储器中。 DCM电路通过电荷泵向电容器施加具有未知占空比的测试时钟信号，从而将电容器充电到对应于测试时钟信号占空比的新电压值。控制软件访问数据存储器以确定测试时钟信号对应的占空比，从而提供测量的占空比。当测量的占空比从预定的占空比变化时，该装置产生误差信号。该装置包括可变占空比时钟发生器，其改变测试时钟信号的占空比以减少误差。

17. 发明授权

US07322001B2 Apparatus and method for automatically self-calibrating a duty cycle circuit for maximum chip performance 有权
标题翻译：用于自动自校准占空比电路以实现最大芯片性能的装置和方法
公开(公告)号：US07322001B2
公开(公告)日：2008-01-22
申请号：US11242677
申请日：2005-10-04
申请人： David W. Boerstler , Eskinder Hailu , Jieming Qi
发明人： David W. Boerstler , Eskinder Hailu , Jieming Qi
IPC分类号： G01R31/28 , H03K3/017
CPC分类号： H03K5/1565 , G01R31/31727 , G01R31/3187
摘要： An apparatus and method for automatically calibrating a duty cycle circuit for maximum performance. A chip level built-in circuit automatically calibrates the duty cycle correction (DCC) circuit setting for each chip. The chip level built-in circuit includes a clock generation macro unit, a simple duty cycle correction (DCC) circuit, an array slice and built-in self test unit, and a DCC circuit controller. A built-in self-test provides results, i.e. pass or fail, of an array to the DCC circuit controller. If the result of the built-in self test is a pass, then the current DCC circuit controller's DCC control bit setting is set as the setting for the chip. If the result from the built-in self test is a fail, the DCC circuit controller's DCC control bits setting is incremented to a next setting and the self-test is performed again.
摘要翻译：一种用于自动校准占空比电路以实现最大性能的装置和方法。芯片级内置电路自动校准每个芯片的占空比校正（DCC）电路设置。芯片级内置电路包括时钟生成宏单元，简单占空比校正（DCC）电路，阵列片和内置自检单元以及DCC电路控制器。内置的自检向DCC电路控制器提供阵列的结果，即通过或失败。如果内置自检的结果是通过，则将当前DCC电路控制器的DCC控制位设置设置为芯片的设置。如果内置自检的结果为失败，DCC电路控制器的DCC控制位设置将增加到下一个设置，并再次执行自检。

18. 发明申请

US20070236266A1 APPARATUS AND METHOD FOR EXTRACTING A MAXIMUM PULSE WIDTH OF A PULSE WIDTH LIMITER 失效
标题翻译：提取脉冲宽度极限的最大脉冲宽度的装置和方法
公开(公告)号：US20070236266A1
公开(公告)日：2007-10-11
申请号：US11278842
申请日：2006-04-06
申请人： David Boerstler , Eskinder Hailu , Jieming Qi
发明人： David Boerstler , Eskinder Hailu , Jieming Qi
IPC分类号： H03K3/017
CPC分类号： H03K5/1534 , H03K5/156 , H03K2005/00293
摘要： An apparatus and method for extracting a maximum pulse width of a pulse width limiter are provided. The apparatus and method of the illustrative embodiments performs such extraction using a circuit that is configured to eliminate the majority of the delay cells utilized in the circuit arrangement described in commonly assigned and co-pending U.S. patent application Ser. No. 11/109,090 (hereafter referred to as the '090 application). The elimination of these delay cells is made possible in one illustrative embodiment by replacing an OR gate in the circuit configuration of the '090 application with an edge triggered re-settable latch. The replacement of the OR gate with the edge triggered re-settable latch reduces the amount of chip area used in addition to the power consumption of the circuit.
摘要翻译：提供了一种用于提取脉冲宽度限制器的最大脉冲宽度的装置和方法。说明性实施例的装置和方法使用被配置为消除在共同转让和共同未决的美国专利申请Ser中描述的电路装置中使用的大多数延迟单元的电路来执行这种提取。第11 / 109,090号（以下简称“090”）。在一个说明性实施例中，通过用'边缘触发的可重新设定的锁存器'替换'090应用的电路配置中的或门，可以消除这些延迟单元。利用边沿触发的可重新设置的锁存器替换或门可以减少除了电路功耗之外使用的芯片面积。

19. 发明申请

US20070126475A1 Method and Apparatus for Semi-Automatic Extraction and Monitoring of Diode Ideality in a Manufacturing Environment 审中-公开
标题翻译：在制造环境中半自动提取和监控二极管理想的方法和装置
公开(公告)号：US20070126475A1
公开(公告)日：2007-06-07
申请号：US11466542
申请日：2006-08-23
申请人： David Boerstler , Eskinder Hailu , Jieming Qi
发明人： David Boerstler , Eskinder Hailu , Jieming Qi
IPC分类号： H03K19/173
CPC分类号： G01R31/2632
摘要： A method, an apparatus, and a computer program are provided for the semi-automatic extraction of an ideality factor of a diode. Traditionally, current/voltage curves for diodes, which provided a basis for extrapolating the ideality factors, had to be determined by hand. By employing a thermal voltage proportional to absolute temperature (PTAT) generator in conjunction with an extraction mechanism, the ideality factor can be extracted in an semi-automatic manner. Therefore, a reliable, quick, and less expensive device can be employed to improve measurements of ideality factors.
摘要翻译：提供了一种半自动提取二极管理想因子的方法，装置和计算机程序。传统上，二极管的电流/电压曲线为理想因素外推提供了基础，必须用手来确定。通过采用与绝对温度（PTAT）发生器成比例的热电压与提取机制，理想因子可以半自动提取。因此，可以采用可靠，快速和便宜的装置来改善理想因素的测量。

20. 发明申请

US20070079197A1 Apparatus and method for automatically self-calibrating a duty cycle circuit for maximum chip performance 有权
标题翻译：用于自动自校准占空比电路以实现最大芯片性能的装置和方法
公开(公告)号：US20070079197A1
公开(公告)日：2007-04-05
申请号：US11242677
申请日：2005-10-04
申请人： David Boerstler , Eskinder Hailu , Jieming Qi
发明人： David Boerstler , Eskinder Hailu , Jieming Qi
IPC分类号： G01R31/28
CPC分类号： H03K5/1565 , G01R31/31727 , G01R31/3187
摘要： An apparatus and method for automatically calibrating a duty cycle circuit for maximum performance are provided. A chip level built-in circuit that automatically calibrates the duty cycle correction (DCC) circuit setting for each chip is provided. This chip level built-in circuit includes a clock generation macro unit, a simple duty cycle correction (DCC) circuit, an array slice and built-in self test unit, and a DCC circuit controller. Results of a built-in self test, i.e. pass or fail, of an array are provided to the DCC circuit controller. If the result of the built-in self test is a pass, then the current DCC circuit controller's DCC control bit setting is set as the setting for the chip. If the result from the built-in self test is a fail, the DCC circuit controller's DCC control bits setting is incremented to a next setting and the self-test is performed again.
摘要翻译：提供一种用于自动校准占空比电路以实现最大性能的装置和方法。提供了自动校准每个芯片的占空比校正（DCC）电路设置的芯片级内置电路。该芯片级内置电路包括时钟生成宏单元，简单占空比校正（DCC）电路，阵列片和内置自检单元以及DCC电路控制器。向DCC电路控制器提供阵列的内置自检，即通过或失败的结果。如果内置自检的结果是通过，则将当前DCC电路控制器的DCC控制位设置设置为芯片的设置。如果内置自检的结果为失败，DCC电路控制器的DCC控制位设置将增加到下一个设置，并再次执行自检。

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