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    • 12. 发明授权
    • Peeling method
    • 剥皮方法
    • US07375006B2
    • 2008-05-20
    • US11542216
    • 2006-10-04
    • Toru TakayamaJunya MaruyamaYuugo GotoYumiko OhnoTakuya TsurumeHideaki Kuwabara
    • Toru TakayamaJunya MaruyamaYuugo GotoYumiko OhnoTakuya TsurumeHideaki Kuwabara
    • H01L21/30
    • H01L27/1266H01L21/76251H01L27/1214
    • A peeling method is provided which does not cause damage to a layer to be peeled, and the method enables not only peeling of the layer to be peeled having a small area but also peeling of the entire layer to be peeled having a large area at a high yield. Further, there are provided a semiconductor device, which is reduced in weight through adhesion of the layer to be peeled to various base materials, and a manufacturing method thereof. In particular, there are provided a semiconductor device, which is reduced in weight through adhesion of various elements, typically a TFT, to a flexible film, and a manufacturing method thereof. A metal layer or nitride layer is provided on a substrate; an oxide layer is provided contacting with the metal layer or nitride layer; then, a base insulating film and a layer to be peeled containing hydrogen are formed; and heat treatment for diffusing hydrogen is performed thereto at 410° C. or more. As a result, complete peeling can be attained in the oxide layer or at an interface thereof by using physical means.
    • 提供一种不会对被剥离层造成损害的剥离方法,并且该方法不仅能够剥离具有小面积的被剥离层,而且还可以剥离具有大面积的待剥离的整个层 高产。 此外,提供了一种半导体器件及其制造方法,该半导体器件通过将待剥离的层的粘合而减小重量。 特别地,提供了一种通过将各种元件(通常为TFT)粘附到柔性膜而减小重量的半导体器件及其制造方法。 金属层或氮化物层设置在基板上; 提供与金属层或氮化物层接触的氧化物层; 然后,形成基底绝缘膜和含有氢的被剥离层。 在410℃以上进行用于扩散氢的热处理。 结果,可以通过使用物理手段在氧化物层或其界面处获得完全的剥离。
    • 13. 发明申请
    • Peeling method
    • 剥皮方法
    • US20070032042A1
    • 2007-02-08
    • US11542216
    • 2006-10-04
    • Toru TakayamaJunya MaruyamaYuugo GotoYumiko OhnoTakuya TsurumeHideaki Kuwabara
    • Toru TakayamaJunya MaruyamaYuugo GotoYumiko OhnoTakuya TsurumeHideaki Kuwabara
    • H01L21/30
    • H01L27/1266H01L21/76251H01L27/1214
    • A peeling method is provided which does not cause damage to a layer to be peeled, and the method enables not only peeling of the layer to be peeled having a small area but also peeling of the entire layer to be peeled having a large area at a high yield. Further, there are provided a semiconductor device, which is reduced in weight through adhesion of the layer to be peeled to various base materials, and a manufacturing method thereof. In particular, there are provided a semiconductor device, which is reduced in weight through adhesion of various elements, typically a TFT, to a flexible film, and a manufacturing method thereof. A metal layer or nitride layer is provided on a substrate; an oxide layer is provided contacting with the metal layer or nitride layer; then, a base insulating film and a layer to be peeled containing hydrogen are formed; and heat treatment for diffusing hydrogen is performed thereto at 410° C. or more. As a result, complete peeling can be attained in the oxide layer or at an interface thereof by using physical means.
    • 提供一种不会对被剥离层造成损害的剥离方法,并且该方法不仅能够剥离具有小面积的被剥离层,而且还可以剥离具有大面积的待剥离的整个层 高产。 此外,提供了一种半导体器件及其制造方法,该半导体器件通过将待剥离的层的粘合而减小重量。 特别地,提供了一种通过将各种元件(通常为TFT)粘附到柔性膜而减小重量的半导体器件及其制造方法。 金属层或氮化物层设置在基板上; 提供与金属层或氮化物层接触的氧化物层; 然后,形成基底绝缘膜和含有氢的被剥离层。 在410℃以上进行用于扩散氢的热处理。 结果,可以通过使用物理手段在氧化物层或其界面处获得完全的剥离。
    • 14. 发明授权
    • Peeling method
    • 剥皮方法
    • US07666719B2
    • 2010-02-23
    • US12149131
    • 2008-04-28
    • Toru TakayamaJunya MaruyamaYuugo GotoYumiko OhnoTakuya TsurumeHideaki Kuwabara
    • Toru TakayamaJunya MaruyamaYuugo GotoYumiko OhnoTakuya TsurumeHideaki Kuwabara
    • H01L21/00H01L21/84
    • H01L27/1266H01L21/76251H01L27/1214
    • A peeling method is provided which does not cause damage to a layer to be peeled, and the method enables not only peeling of the layer to be peeled having a small area but also peeling of the entire layer to be peeled having a large area at a high yield. Further, there are provided a semiconductor device, which is reduced in weight through adhesion of the layer to be peeled to various base materials, and a manufacturing method thereof. In particular, there are provided a semiconductor device, which is reduced in weight through adhesion of various elements, typically a TFT, to a flexible film, and a manufacturing method thereof. A metal layer or nitride layer is provided on a substrate; an oxide layer is provided contacting with the metal layer or nitride layer; then, a base insulating film and a layer to be peeled containing hydrogen are formed; and heat treatment for diffusing hydrogen is performed thereto at 410° C. or more. As a result, complete peeling can be attained in the oxide layer or at an interface thereof by using physical means.
    • 提供一种不会对被剥离层造成损害的剥离方法,并且该方法不仅能够剥离具有小面积的被剥离层,而且还可以剥离具有大面积的待剥离的整个层 高产。 此外,提供了一种半导体器件及其制造方法,该半导体器件通过将待剥离的层的粘合而减小重量。 特别地,提供了一种通过将各种元件(通常为TFT)粘附到柔性膜而减小重量的半导体器件及其制造方法。 金属层或氮化物层设置在基板上; 提供与金属层或氮化物层接触的氧化物层; 然后,形成基底绝缘膜和含有氢的被剥离层。 在410℃以上进行用于扩散氢的热处理。 结果,可以通过使用物理手段在氧化物层或其界面处获得完全的剥离。
    • 16. 发明授权
    • Peeling method
    • 剥皮方法
    • US07122445B2
    • 2006-10-17
    • US10619074
    • 2003-07-15
    • Toru TakayamaJunya MaruyamaYuugo GotoYumiko OhnoTakuya TsurumeHideaki Kuwabara
    • Toru TakayamaJunya MaruyamaYuugo GotoYumiko OhnoTakuya TsurumeHideaki Kuwabara
    • H01L21/30
    • H01L27/1266H01L21/76251H01L27/1214
    • A peeling method is provided which does not cause damage to a layer to be peeled, and the method enables not only peeling of the layer to be peeled having a small area but also peeling of the entire layer to be peeled having a large area at a high yield. Further, there are provided a semiconductor device, which is reduced in weight through adhesion of the layer to be peeled to various base materials, and a manufacturing method thereof. In particular, there are provided a semiconductor device, which is reduced in weight through adhesion of various elements, typically a TFT, to a flexible film, and a manufacturing method thereof. A metal layer or nitride layer is provided on a substrate; an oxide layer is provided contacting with the metal layer or nitride layer; then, a base insulating film and a layer to be peeled containing hydrogen are formed; and heat treatment for diffusing hydrogen is performed thereto at 410° C. or more. As a result, complete peeling can be attained in the oxide layer or at an interface thereof by using physical means.
    • 提供一种不会对被剥离层造成损害的剥离方法,并且该方法不仅能够剥离具有小面积的被剥离层,而且还可以剥离具有大面积的待剥离的整个层 高产。 此外,提供了一种半导体器件及其制造方法,该半导体器件通过将待剥离的层的粘合而减小重量。 特别地,提供了一种通过将各种元件(通常为TFT)粘附到柔性膜而减小重量的半导体器件及其制造方法。 金属层或氮化物层设置在基板上; 提供与金属层或氮化物层接触的氧化物层; 然后,形成基底绝缘膜和含有氢的被剥离层。 在410℃以上进行用于扩散氢的热处理。 结果,可以通过使用物理手段在氧化物层或其界面处获得完全的剥离。