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    • 13. 发明申请
    • Apparatus and method for data bypass for a bi-directional data bus in a hub-based memory sub-system
    • 用于基于集线器的存储器子系统中的双向数据总线的数据旁路的装置和方法
    • US20050177695A1
    • 2005-08-11
    • US10773583
    • 2004-02-05
    • Douglas LarsonJeffrey Cronin
    • Douglas LarsonJeffrey Cronin
    • G06F12/00G06F13/16
    • G06F13/28G06F12/0888G06F13/161
    • A memory hub includes first and second link interfaces for coupling to respective data busses, a data path coupled to the first and second link interfaces and through which data is transferred between the first and second link interfaces, and further includes a write bypass circuit coupled to the data path to couple write data on the data path and temporarily store the write data to allow read data to be transferred through the data path while the write data is temporarily stored. A method for writing data to a memory location in a memory system is provided which includes accessing read data in the memory system, providing write data to the memory system, and coupling the write data to a register for temporary storage. The write data is recoupled to the memory bus and written to the memory location following provision of the read data.
    • 存储器集线器包括用于耦合到相应的数据总线的第一和第二链路接口,耦合到第一和第二链路接口的数据路径,以及数据在第一和第二链路接口之间传送的数据路径,并且还包括写入旁路电路, 将数据路径耦合到数据路径上的数据路径,并临时存储写入数据,以允许在暂时存储写入数据时通过数据路径传送读取数据。 提供了一种将数据写入存储器系统中的存储器位置的方法,其包括访问存储器系统中的读取数据,向存储器系统提供写入数据,以及将写入数据耦合到寄存器以进行临时存储。 在提供读取的数据之后,将写入数据重新耦合到存储器总线并写入存储器位置。
    • 17. 发明授权
    • Calibration method for system performance validation of automatic test equipment
    • 自动测试设备系统性能验证的校准方法
    • US06804620B1
    • 2004-10-12
    • US10393876
    • 2003-03-21
    • Douglas LarsonAnthony LeCarol Qiao TongRochit Rajsuman
    • Douglas LarsonAnthony LeCarol Qiao TongRochit Rajsuman
    • G06F900
    • G01R31/3191G01R31/31922
    • An ATE calibration method and system that does not require external test equipment to calibrate individual functional pins and provides balanced timing skews among the functional pins and pincards is disclosed. A functional pin in the test system is selected as a reference or “golden” pin and another is selected as a precision measurement unit (PMU). External test equipment and the reference PMU are used to measure the AC and DC characteristics of the reference pin, and any deviation represents a measurement error in the reference PMU. All functional pins in the test system can be measured against the reference pin using the reference PMU, taking into account the measurement error, without the need for external test equipment. To ensure that skews are balanced among all pins, the location of the reference pin is selected to be as close as possible to the midpoint of the functional pin range.
    • 公开了一种不需要外部测试设备来校准各个功能引脚并在功能引脚和引脚卡之间提供平衡的时序偏移的ATE校准方法和系统。 选择测试系统中的功能引脚作为参考或“黄金”引脚,另一个选择为精密测量单元(PMU)。 外部测试设备和参考PMU用于测量参考引脚的交流和直流特性,任何偏差表示参考PMU中的测量误差。 测试系统中的所有功能引脚可以使用参考PMU测量参考引脚,同时考虑到测量误差,无需外部测试设备。 为了确保所有引脚之间的偏差平衡,参考引脚的位置选择为尽可能靠近功能引脚范围的中点。