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    • 11. 发明申请
    • Method for Observing Organisms and Associated System
    • 观察生物和相关系统的方法
    • US20160103064A1
    • 2016-04-14
    • US14891820
    • 2014-05-19
    • COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVESbIOMerieux
    • Pierre MARCOUXMathieu DUPOY
    • G01N21/47C12Q1/02
    • G01N21/4788C12Q1/02C12Q1/18
    • The invention relates to a method for observing a sample (12), the sample (12) comprising a set of organisms (14), a solid substrate (16) supporting the set of organisms (14). The method being characterized in that the method includes steps for illuminating at least one portion of the sample (12) with a light beam, for acquiring a first diffraction pattern corresponding to an image of waves from the diffraction of the light beam by at least one portion of the set of organisms (14), for acquiring a second diffraction pattern corresponding to an image of waves from the diffraction of the light beam by at least one portion of the sample (12), for comparing the second diffraction pattern with the first diffraction pattern, for determining at least one characteristic relating to the set of organisms (14) from the result of the comparison step.
    • 本发明涉及一种用于观察样品(12)的方法,所述样品(12)包括一组生物体(14),固体基质(16),其支撑所述一组生物体(14)。 该方法的特征在于,该方法包括用光束照射样品(12)的至少一部分的步骤,用于从光束的衍射获得与波束的图像相对应的第一衍射图案至少一个 用于从所述样品(12)的至少一部分的所述光束的衍射获得对应于波的图像的第二衍射图案,用于将所述第二衍射图案与所述第一衍射图案进行比较 衍射图案,用于根据比较步骤的结果来确定与生物体集合(14)有关的至少一个特性。
    • 14. 发明申请
    • DEVICE AND METHOD FOR DETECTING PARTICLES AND METHOD FOR MANUFACTURING SAME
    • US20210181083A1
    • 2021-06-17
    • US17247352
    • 2020-12-08
    • COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES
    • Mathieu DUPOYLaurent FREYSerge GIDON
    • G01N15/14
    • A device for detecting (D) at least one predetermined particle (P) includes an interferometric element (EI) arranged so as to be illuminated by an incident radiation (Lin) and comprising at least one so-called thin layer (CM) disposed on top of a so-called substrate layer (Sub), the particle being attached to a surface (Sm) of the thin layer, the interferometric element (EI) forming a Fabry-Pérot cavity with or without attached particle P; a matrix sensor (Det) adapted to detect an image comprising a first portion (P1) deriving from the detection of the incident radiation transmitted (LTBG) by the interferometric element alone and a second portion (P2) deriving from the detection of the incident radiation transmitted (LTP) by the interferometric element and any particle (O, P) attached to a surface (Sm) of the thin layer; a processor (UT) linked to the sensor and configured: to calculate, as a function of wavelengths of the incident radiation λi i∈[1,m], the variation of intensity of at least one first pixel of the first portion, called first variation (FBG) and of at least one second pixel of the second portion, called second variation (FP), to determine a trend, as a function of the wavelengths of the incident radiation λi i∈[1,m], of a phase shift ϕi between the first variation and the second variation; to detect the attached particle when the phase shift ϕi is not constant as a function of the wavelengths of the incident radiation λi i∈[1,m].