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热词
    • 12. 发明授权
    • Analytical method and device for precise analysis with a simple sensor
    • 用简单传感器精确分析的分析方法和装置
    • US5866321A
    • 1999-02-02
    • US738114
    • 1996-10-25
    • Tomokazu MatsueHitoshi ShikuIsamu Uchida
    • Tomokazu MatsueHitoshi ShikuIsamu Uchida
    • C12Q1/00G01N27/00G01N27/30G01N27/327G01N27/416G01N33/543G01N37/00G01Q30/02G01Q30/10G01Q60/60G01Q80/00G01Q90/00C12Q1/70C12Q1/68G01N33/53G01N33/554
    • C12Q1/001C12Q1/004G01N33/54373G01N33/5438
    • An analyte and a reactant 3 that reacts with the analyte either directly or indirectly are allowed to react with each other on the analytical areas A of a substrate 1 and signals originating from the reaction are detected. In at least a signal detection step, either a signal generation-related portion 4x or a detector is provided in a portion that is opposed to the substrate 1 and high and low areas are formed in either the substrate 1 or the opposed portion or both in such a manner that the distance from each analytical area A of the substrate to the opposed portion is shorter than the distance from each of the non-analytical areas B of the substrate to the opposed portion, whereby signals originating from the reaction in the analytical areas A will be detected at higher intensities than signals originating from the reaction in the non-analytical areas B. The analyte can be quantitatively or qualitatively analyzed on the analytical areas of the substrate in high precision with reduced effects from the non-analytical areas of the substrate. Simultaneous analysis of multiple samples or simultaneous analysis for multiple items can also be accomplished with a simple sensor configuration.
    • 可以直接或间接地与分析物反应的分析物和反应物3在基板1的分析区域A上彼此反应,并且检测来自反应的信号。 在至少信号检测步骤中,在与基板1相对的部分中设置信号生成相关部分4x或检测器,并且在基板1或相对部分中形成高低区域, 从衬底的每个分析区域A到相对部分的距离比从衬底的非分析区域B到相对部分的距离短的方式,由此源于分析区域中的反应的信号 将在比非分析区域B中的反应信号更高的强度下检测到A。可以在基板的分析区域上以高精度定量或定性地分析分析物,并且从非分析区域的非分析区域 基质。 同时分析多个样本或同时分析多个项目也可以通过简单的传感器配置来实现。