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    • 13. 发明授权
    • Multi-port register file with an input pipelined architecture with asynchronous reads and localized feedback
    • 具有异步读取和本地化反馈的输入流水线架构的多端口寄存器文件
    • US08862836B2
    • 2014-10-14
    • US13160174
    • 2011-06-14
    • Raguram DamodaranRamakrishnan VenkatasubramanianNaveen Bhoria
    • Raguram DamodaranRamakrishnan VenkatasubramanianNaveen Bhoria
    • G06F12/00G06F13/00G06F13/28G06F5/00
    • G06F5/00G06F9/30141G11C8/12
    • In an embodiment of the invention, a multi-port register file includes write port inputs (e.g. write address, write enable, data input) that are pipelined and synchronous and read port inputs (e.g. read address) that are asynchronous and are not pipelined. Because the write port inputs are pipelined, they are stored in pipelined registers. When data is written to the multi-port register file, data is first written to the pipelined registers during a first clock cycle. On the next clock cycle, data is read from the pipelined registers and written into memory array registers. Which bits of data from a pipelined synchronous data register are written into the multi-port register file is determined by a pipelined synchronous bit-write register. The output of the pipelined synchronous bit-write register selects which inputs of multiplexers contained in registers in the multi-port register file are stored.
    • 在本发明的一个实施例中,多端口寄存器文件包括流水线的写入端口输入(例如写入地址,写入使能,数据输入)以及不是流水线的同步和读出端口输入(例如,读取地址)。 由于写入端口输入是流水线的,所以它们被存储在流水线寄存器中。 当数据写入多端口寄存器文件时,数据将在第一个时钟周期内首先写入流水线寄存器。 在下一个时钟周期,数据从流水线寄存器读取并写入存储器阵列寄存器。 来自流水线同步数据寄存器的哪些数据位被写入多端口寄存器文件由流水线同步位写入寄存器确定。 流水线同步位写入寄存器的输出选择存储多端口寄存器文件中寄存器中包含的多路复用器的哪些输入。
    • 14. 发明申请
    • Multi-Port Register File with an Input Pipelined Architecture with Asynchronous Reads and Localized Feedback
    • 具有异步读取和本地化反馈的输入流水线结构的多端口寄存器文件
    • US20120324175A1
    • 2012-12-20
    • US13160174
    • 2011-06-14
    • Raguram DamodaranRamakrishnan VenkatasubramanianNaveen Bhoria
    • Raguram DamodaranRamakrishnan VenkatasubramanianNaveen Bhoria
    • G06F12/00
    • G06F5/00G06F9/30141G11C8/12
    • In an embodiment of the invention, a multi-port register file includes write port inputs (e.g. write address, write enable, data input) that are pipelined and synchronous and read port inputs (e.g. read address) that are asynchronous and are not pipelined. Because the write port inputs are pipelined, they are stored in pipelined registers. When data is written to the multi-port register file, data is first written to the pipelined registers during a first clock cycle. On the next clock cycle, data is read from the pipelined registers and written into memory array registers. Which bits of data from a pipelined synchronous data register are written into the multi-port register file is determined by a pipelined synchronous bit-write register. The output of the pipelined synchronous bit-write register selects which inputs of multiplexers contained in registers in the multi-port register file are stored.
    • 在本发明的一个实施例中,多端口寄存器文件包括流水线的写入端口输入(例如写入地址,写入使能,数据输入)以及不是流水线的同步和读出端口输入(例如,读取地址)。 由于写入端口输入是流水线的,所以它们被存储在流水线寄存器中。 当数据写入多端口寄存器文件时,数据将在第一个时钟周期内首先写入流水线寄存器。 在下一个时钟周期,数据从流水线寄存器读取并写入存储器阵列寄存器。 来自流水线同步数据寄存器的哪些数据位被写入多端口寄存器文件由流水线同步位写入寄存器确定。 流水线同步位写入寄存器的输出选择存储多端口寄存器文件中寄存器中包含的多路复用器的哪些输入。
    • 18. 发明授权
    • Delay fault testing using distributed clock dividers
    • 使用分布式时钟分频器延迟故障测试
    • US08375265B1
    • 2013-02-12
    • US13231229
    • 2011-09-13
    • Ramakrishnan VenkatasubramanianAlan HalesWilliam Wallace
    • Ramakrishnan VenkatasubramanianAlan HalesWilliam Wallace
    • G01R31/28
    • G01R31/31725G01R31/31858
    • In an embodiment of the invention, an integrated circuit with several clock domains bank is tested by first disabling a PLL clock and scanning test data into scan chains. Next delay fault testing (DFT) code is transmitted to each distributed clock divider on the integrated circuit. The PLL clock is then enabled to the distributed clock dividers. Selected clock dividers generate launch pulses that allow test data to be propagated from the scan chains into circuit blocks in the clock domains. Capture pulses are then generated by selected distributed clock dividers to capture test data coming form the circuit blocks into the scan chains. Next the PLL clock is disabled and the test data is scanned from the scan chains to an on-chip test control circuit.
    • 在本发明的一个实施例中,通过首先禁用PLL时钟并将测试数据扫描到扫描链中来测试具有多个时钟域组的集成电路。 下一个延迟故障测试(DFT)代码被发送到集成电路上的每个分布式时钟分频器。 PLL时钟然后被使能到分布式时钟分频器。 选择的时钟分频器产生启动脉冲,允许测试数据从扫描链传播到时钟域中的电路块。 捕获脉冲然后由选定的分布式时钟分频器产生,以将来自电路块的测试数据捕获到扫描链中。 接下来PLL时钟被禁用,测试数据从扫描链扫描到片上测试控制电路。