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    • 11. 发明授权
    • Method of optimizing and analyzing selected portions of a digital integrated circuit
    • 优化和分析数字集成电路的选定部分的方法
    • US07010763B2
    • 2006-03-07
    • US10436213
    • 2003-05-12
    • David J. HathawayLawrence Kenneth LangeChandramouli VisweswariahPatrick M. Williams
    • David J. HathawayLawrence Kenneth LangeChandramouli VisweswariahPatrick M. Williams
    • G06F17/50
    • G06F17/505
    • Disclosed is a method for achieving timing closure in the design of a digital integrated circuit or system by selecting portions of the circuit or system to be optimized and portions of the circuit or system in which the effects of such optimization are to be analyzed during the optimization process. Optimized portions will include gates whose design parameters are to be changed, a first analyzed portion includes gates whose delays and edge slews are to be recomputed, and a second analyzed portion includes gates whose ATs and RATs are to be recomputed during optimization. Constraints are imposed at selected boundaries between these portions to prevent unwanted propagation of timing information and to ensure the validity of timing values used during optimization. Through this selection, the size of the problem posed to the underlying optimization method will be reduced, allowing larger circuits or systems to be optimized and allowing optimization to be performed more quickly.
    • 公开了一种在数字集成电路或系统的设计中实现定时闭合的方法,通过选择要优化的电路或系统的部分以及在优化期间分析这种优化的影响的电路或系统的部分 处理。 优化部分将包括其设计参数将被改变的门,第一分析部分包括要重新计算其延迟和边缘电压的门,并且第二分析部分包括在优化期间重新计算其AT和RAT的门。 在这些部分之间的选定边界施加约束,以防止定时信息的不期望的传播,并确保优化期间使用的定时值的有效性。 通过这种选择,将降低对基础优化方法造成的问题的大小,从而允许更大的电路或系统被优化,并允许更快地执行优化。