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11. 发明授权

US07804593B2 Echelle spectometer with improved use of the detector by means of two spectrometer arrangements 有权
标题翻译： Echelle光谱仪通过两种光谱仪布置改进了检测器的使用
公开(公告)号：US07804593B2
公开(公告)日：2010-09-28
申请号：US11629143
申请日：2005-06-02
申请人： Helmut Becker-Roβ , Stefan Florek , Günter Wesemann , Michael Okruss
发明人： Helmut Becker-Roβ , Stefan Florek , Günter Wesemann , Michael Okruss
IPC分类号： G01J3/28
CPC分类号： G01J3/1809 , G01J3/02 , G01J3/0202 , G01J3/0208 , G01J3/021 , G01J3/0232 , G01J3/0237 , G01J3/0286 , G01J3/0294 , G01J3/08 , G01J3/12 , G01J3/2803
摘要： The invention relates to a spectrometer arrangement (10) comprising a spectrometer (14) for producing a spectrum of a first wavelength range of radiation from a radiation source on a detector (42). Said arrangement also comprises: an Echelle grating (36) for the spectral decomposition of the radiation penetrating the spectrometer arrangement (10) in a main dispersion direction (46); a dispersing element (34) for separating the degrees by means of spectral decomposition of the radiation in a transversal dispersion direction (48) which forms an angle with the main dispersion direction of the Echelle grating (36), in such a way that a two-dimensional spectrum (50) can be produced with a plurality of separated degrees (52); an imaging optical element (24, 38) for imaging the radiation penetrating through an inlet gap (20) into the spectrometer arrangement (10), in an image plane (40); and a surface detector (42) comprising a two dimensional arrangement of a plurality of detector elements in the image plane (40). The inventive arrangement is characterized in that another spectrometer (12) comprising at least one other dispersing element (64) and another imaging optical element (60,66) is provided in order to produce a spectrum (68) of a second wavelength range of radiation, which is different from the first wavelength range, from a radiation source on the same detector (42). The spectra can be spatially or temporally separated on the detector.
摘要翻译：本发明涉及一种分光计装置（10），其包括用于产生来自检测器（42）上的辐射源的第一波长范围的光谱仪（14）。所述布置还包括：用于在主色散方向（46）上穿透光谱仪装置（10）的辐射的光谱分解的梯形光栅（36）; 分散元件（34），用于通过在与梯形光栅（36）的主色散方向形成角度的横向色散方向（48）上的辐射的光谱分解来分离度数，使得两个可以用多个分离的度数（52）产生维度谱（50）; 用于在图像平面（40）中将穿过入口间隙（20）的辐射成像到成像光学装置（10）中的成像光学元件（24,38）; 以及包括所述图像平面（40）中的多个检测器元件的二维排列的表面检测器（42）。本发明的装置的特征在于，提供包括至少一个其它分散元件（64）和另一成像光学元件（60,66）的另一个光谱仪（12），以产生第二波长范围的辐射（68），其与第一波长范围不同，来自相同检测器（42）上的辐射源。光谱可以在检测器上进行空间或时间分离。

12. 发明授权

US06717670B2 High-resolution littrow spectrometer and method for the quasi-simultaneous determination of a wavelength and a line profile 有权
标题翻译：高分辨率立体光谱仪和准同时测定波长和线轮廓的方法
公开(公告)号：US06717670B2
公开(公告)日：2004-04-06
申请号：US10168314
申请日：2002-06-20
申请人： Helmut Becker-Ross , Stefan Florek , Michael Okruss
发明人： Helmut Becker-Ross , Stefan Florek , Michael Okruss
IPC分类号： G01J318
CPC分类号： G01J3/22 , G01J3/18
摘要： The invention relates to a spectrometer (10) with a dispersive element (16) that can be displaced between at least two positions. In the first position, the simply dispersed radiation (44) of a selected wavelength is reflected directly back in the incident beam path (42), while in the second position the dispersed radiation (32) of the selected wavelength can be directed to a reflective element (30) that is positioned such that the radiation (34) can be directed at least one more time across the dispersive element (16) and then back to the incident beam path (38). The spectrometer is provided with a device, for example, a mirror, an echelle grating or a prism that deflects the beam from the plane of dispersion, which is arranged in such a manner that the simply dispersed beam (34) runs in another plane than the multiply dispersed beam (36). The mirror (30) is inclined by an axis (54) that extends parallel to the plane of dispersion and perpendicular to the incident beam (32).
摘要翻译：本发明涉及一种具有分散元件（16）的分光计（10），其可在至少两个位置之间移位。在第一位置，所选择的波长的简单分散的辐射（44）被直接反射入入射光束路径（42），而在第二位置，所选波长的分散辐射（32）可以被引导到反射定位成使得辐射（34）可以穿过色散元件（16）至少一次以上并且然后返回到入射光束路径（38）的元件（30）。光谱仪设置有例如镜子，梯形光栅或棱镜，其将光束从分散体平面偏转，该棱镜以这样的方式布置，使得简单分散的光束（34）在另一个平面中延伸，多分散光束（36）。反射镜（30）由垂直于入射光束（32）平行延伸的轴（54）倾斜。

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