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    • 12. 发明授权
    • Method for testing a remnant batch of semiconductor devices
    • 用于测试残留批次的半导体器件的方法
    • US06922050B2
    • 2005-07-26
    • US10835143
    • 2004-04-28
    • Ae-yong ChungSung-ok KimJeong-ho BangKyeong-seon ShinDae-gab Chi
    • Ae-yong ChungSung-ok KimJeong-ho BangKyeong-seon ShinDae-gab Chi
    • G01R31/26G01R31/01H01L21/66G01R31/02
    • G01R31/01
    • A method for testing semiconductor devices includes loading a customer tray with semiconductor devices to be tested. Groups of devices are transferred from the customer tray to buffer trays for testing. The number of devices in the customer tray is checked after each transfer. If the customer tray is empty, the number of semiconductor devices in the buffer trays is counted and compared with the number of semiconductor devices that can be tested simultaneously, typically either 64 or 128. If the number of semiconductor devices in the buffer trays is greater than the tester capacity, the semiconductor devices in at least one buffer tray are tested. If the number of semiconductor devices in the buffer trays is smaller than the tester capacity, semiconductor devices that were determined to be low quality in a prior test are loaded into a buffer tray, thus testing both untested and low quality devices together.
    • 一种用于测试半导体器件的方法包括:将客户托盘加载到待测试的半导体器件上。 设备组从客户托盘传输到缓冲盘进行测试。 客户托盘中的设备数量在每次传输后都会被检查。 如果客户托盘为空,则对缓冲托盘中的半导体器件的数量进行计数,并与可同时测试的半导体器件的数量进行比较,通常为64或128.如果缓冲托盘中的半导体器件的数量较大 比测试器的容量,测试至少一个缓冲盘中的半导体器件。 如果缓冲盘中的半导体器件的数量小于测试器容量,则在先前测试中被确定为低质量的半导体器件被加载到缓冲托盘中,从而同时测试未测试的和低质量的器件。