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    • 172. 发明授权
    • Microwave plasma etching and deposition method employing first and
second magnetic fields
    • 采用第一和第二磁场的微波等离子体蚀刻和沉积方法
    • US5203959A
    • 1993-04-20
    • US766283
    • 1991-09-27
    • Naoki HiroseTakashi InujimaToru Takayama
    • Naoki HiroseTakashi InujimaToru Takayama
    • C23C16/511H01J37/32
    • H01J37/32192C23C16/511H01J37/32623H01J37/32678
    • A plasma processing apparatus and method is equipped with a vacuum chamber, helmoltz coils, Ioffe bars, a microwave generator and gas feeding systems. An auxiliary magnet is further provided in order to strengthen the magnetic field in the vacuum chamber to produce centrifugal drifting force which confine the plasma gas about the center position of the vacuum chamber. Specifically, the method includes establishing a first magnetic field in the vacuum chamber substantially parallel to the direction of propagation of microwaves emitted in the chamber and establishing a second magnetic field substantially perpendicular to the first magnetic field. A substrate in the chamber for plasma processing is placed so that a surface of the substrate is substantially perpendicular to the direction of the first magnetic field and parallel to the direction of the second.
    • 等离子体处理装置和方法配备有真空室,赫尔兹兹线圈,Ioffe棒,微波发生器和气体供给系统。 进一步提供辅助磁体以加强真空室中的磁场,以产生围绕真空室的中心位置限制等离子体气体的离心漂移力。 具体地,该方法包括在真空室中建立基本上平行于在室中发射的微波的传播方向的第一磁场,并建立基本上垂直于第一磁场的第二磁场。 放置用于等离子体处理的室中的衬底,使得衬底的表面基本上垂直于第一磁场的方向并且平行于第二磁场的方向。
    • 174. 发明授权
    • Thin film transistor, electronic device having the same, and method for manufacturing the same
    • 薄膜晶体管,具有该薄膜晶体管的电子器件及其制造方法
    • US09362307B2
    • 2016-06-07
    • US13185931
    • 2011-07-19
    • Tetsuji YamaguchiKengo AkimotoHiroki KayoijiToru Takayama
    • Tetsuji YamaguchiKengo AkimotoHiroki KayoijiToru Takayama
    • H01L29/786H01L21/84H01L27/12
    • H01L27/12H01L27/1248
    • An object of the present invention is to provide a method for manufacturing a thin film transistor which enables heat treatment aimed at improving characteristics of a gate insulating film such as lowering of an interface level or reduction in a fixed charge without causing a problem of misalignment in patterning due to expansion or shrinkage of glass. A method for manufacturing a thin film transistor of the present invention comprises the steps of heat-treating in a state where at least a gate insulating film is formed over a semiconductor film on which element isolation is not performed, simultaneously isolating the gate insulating film and the semiconductor film into an element structure, forming an insulating film covering a side face of an exposed semiconductor film, thereby preventing a short-circuit between the semiconductor film and a gate electrode. Expansion or shrinkage of a glass substrate during the heat treatment can be prevented from affecting misalignment in patterning since the gate insulating film and the semiconductor film are simultaneously processed into element shapes after the heat treatment.
    • 本发明的目的是提供一种薄膜晶体管的制造方法,其能够进行旨在提高栅极绝缘膜的特性的热处理,例如降低界面电平或降低固定电荷,而不会引起不对准的问题 由于玻璃的膨胀或收缩造成图案化。 本发明的薄膜晶体管的制造方法包括以下步骤:在不进行元件隔离的半导体膜上形成至少栅极绝缘膜的状态下进行热处理,同时隔离栅极绝缘膜和 将半导体膜形成为元件结构,形成覆盖露出的半导体膜的侧面的绝缘膜,由此防止半导体膜与栅电极之间的短路。 由于栅极绝缘膜和半导体膜在热处理后同时被加工成元件形状,所以可以防止热处理期间的玻璃基板的膨胀或收缩,从而影响图案中的未对准。