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    • 111. 发明申请
    • SYSTEM AND METHODS FOR IN VIVO ADJUSTABLE BONE PLATE
    • 体内可调节骨板的系统和方法
    • US20130018425A1
    • 2013-01-17
    • US13635707
    • 2011-03-24
    • Edward SeldinAlexander H. Slocum
    • Edward SeldinAlexander H. Slocum
    • A61B17/80
    • A61B17/8085A61B17/8019
    • A bone plate and method in vivo deployment is designed to secure proximate portions of a bone together. The bone plate includes first and second anchoring regions extending in at least two direction to form a surface configured to extend coaxially with a bone and having formed therein a plurality of passages configured to receive fasteners to secure the first and second anchoring region to respective first and second portions of the bone. A deformation region extends to join the first and second anchoring regions along at least one plane extending substantially co-planar with the surface of the first anchoring region and the surface of the second anchoring region and having reduced structural integrity with respect to the first and second anchoring region to deform the deformation region and, thereby, adjust a relative orientation between the first and second anchoring regions in response to forces applied to the deformation region.
    • 骨板和体内展开方法被设计成将骨的近部分固定在一起。 所述骨板包括在至少两个方向上延伸的第一和第二锚定区域,以形成与骨骼同轴延伸的表面,并且其中形成有多个通道,所述多个通道构造成接收紧固件,以将第一和第二锚定区域固定到相应的第一和第二锚定区域 骨的第二部分。 变形区域延伸以沿着与第一锚定区域的表面和第二锚定区域的表面基本共面延伸的至少一个平面连接第一和第二锚定区域,并且具有相对于第一和第二锚定区域的结构完整性降低 锚固区域以使变形区域变形,从而响应于施加到变形区域的力来调整第一和第二锚定区域之间的相对取向。
    • 115. 发明授权
    • Adjustment mechanism
    • 调整机制
    • US07368930B2
    • 2008-05-06
    • US11464593
    • 2006-08-15
    • Eric D. HobbsChristopher D. McCoyJames M. Porter, Jr.Alexander H. Slocum
    • Eric D. HobbsChristopher D. McCoyJames M. Porter, Jr.Alexander H. Slocum
    • G01R31/02
    • G01R31/2891G01R31/31905
    • A probe card assembly can comprise a support structure to which a plurality of probes can be directly or indirectly attached. The probes can be disposed to contact an electronic device to be tested. The probe card assembly can further comprise actuators, which can be configured to change selectively an attitude of the support structure with respect to a reference structure. The probe card assembly can also comprise a plurality of lockable compliant structures. While unlocked, the lockable compliant structures can allow the support structure to move with respect to the reference structure. While locked, however, the compliant structures can provide mechanical resistance to movement of the support structure with respect to the reference structure.
    • 探针卡组件可以包括支撑结构,多个探针可以直接或间接附接到支撑结构。 可以将探针设置成接触要测试的电子设备。 探针卡组件还可以包括致动器,其可以被配置为相对于参考结构选择性地改变支撑结构的姿态。 探针卡组件还可以包括多个可锁定的柔顺结构。 当解锁时,可锁定的柔性结构可以允许支撑结构相对于参考结构移动。 然而,当锁定时,柔性结构可以提供对支撑结构相对于参考结构的移动的机械阻力。
    • 120. 发明授权
    • Integrated prober, handler and tester for semiconductor components
    • 用于半导体元件的集成探测器,处理器和测试仪
    • US6024526A
    • 2000-02-15
    • US546236
    • 1995-10-20
    • Alexander H. SlocumLuis A. Muller
    • Alexander H. SlocumLuis A. Muller
    • B25J17/02H01L21/00H01L21/683B25J15/06
    • H01L21/67271B25J17/0216H01L21/67242H01L21/6838
    • An integral unit for use in testing semiconductor components. The unit is designed to manipulate either packaged semiconductor components or semiconductor wafers and present them to a test head. It provides significant space savings because it replaces the need for separate prober, handler and tester units. The integrated unit includes a positioning mechanism with a tool plate that can be changed to grasp either a semiconductor wafer or a tray of semiconductor components. The tool plate uses a vacuum plate. To hold a tray of semiconductor parts, the vacuum plate has numerous independently operable holes. Each hole is positioned behind one semiconductor component and can be engaged or released separately so that the components can be sorted into separate output bins. To hold a wafer, the tool plate has an extendible tongue member that can be inserted into a stack of semiconductor wafers to pick up one wafer in the stack. One disclosed positioning mechanism is a hexapod unit, which, due to its light weight, allows fast and accurate positioning of the semiconductor devices. Multiple positioning mechanisms are used in some instances to increase throughput.
    • 用于测试半导体元件的整体单元。 该单元被设计为操纵封装的半导体元件或半导体晶片并将其呈现给测试头。 它提供了显着的空间节省,因为它代替了单独的探测器,处理器和测试仪单元的需要。 集成单元包括具有工具板的定位机构,其可以改变以掌握半导体晶片或半导体部件的托盘。 工具板使用真空板。 为了保持半导体部件的托盘,真空板具有许多可独立操作的孔。 每个孔定位在一个半导体部件的后面,并且可以单独地接合或释放,使得部件可以被分类到单独的输出箱中。 为了保持晶片,工具板具有可延伸的舌构件,其可以插入到堆叠的半导体晶片中以拾取堆叠中的一个晶片。 一种公开的定位机构是六足单元,其由于其重量轻,允许半导体器件的快速和精确的定位。 在一些情况下使用多个定位机制来增加吞吐量。