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    • 93. 发明授权
    • Method of removing work-affected layer
    • 删除受影响层的方法
    • US09481934B2
    • 2016-11-01
    • US13796150
    • 2013-03-12
    • MITSUBISHI HEAVY INDUSTRIES, LTD.
    • Taisuke Kamioka
    • C25F3/00C23F1/20C23F1/16C23F1/26C23F3/06C23G1/10
    • C23F1/20C23F1/16C23F1/26C23F3/06C23G1/106
    • A method of removing a work-affected layer formed on the worked surface of a TiAl-based alloy (base material) by machining work, without exerting any adverse effect on the base material. The method of removing the work-affected layer includes a step of dipping a TiAl-based alloy, having a work-affected layer formed on the surface thereof by machining, in an etchant containing predetermined concentrations of hydrofluoric acid and nitric acid. Within the etchant, the concentration of the hydrofluoric acid is not less than 5 g/L and not more than 56 g/L, and the concentration of the nitric acid is selected from within a range from not less than 50 g/L to not more than 260 g/L in accordance with a combination of the concentration of the hydrofluoric acid within the etchant and the etching treatment temperature.
    • 通过机械加工除去形成在TiAl基合金(基材)的加工面上的受影响层的方法,而不会对基材产生不利影响。 去除受影响层的方法包括在含有预定浓度的氢氟酸和硝酸的蚀刻剂中浸渍具有通过机械加工形成在其表面上的受影响层的TiAl基合金的步骤。 在蚀刻剂中,氢氟酸的浓度不小于5g / L且不超过56g / L,硝酸的浓度选自不小于50g / L至不超过50g / L 根据蚀刻剂内的氢氟酸的浓度和蚀刻处理温度的组合,超过260g / L。