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91. 发明申请

US20220198791A1 IMAGE RECOGNITION DEVICE AND IMAGE RECOGNITION METHOD 有权
公开(公告)号：US20220198791A1
公开(公告)日：2022-06-23
申请号：US17604552
申请日：2020-05-29
申请人： Sony Semiconductor Solutions Corporation
发明人： Kazuyuki Okuike
IPC分类号： G06V10/88 , G06T7/90
摘要： Provided are an image recognition device and an image recognition method capable of improving subject recognition accuracy. The image recognition device (image sensor 1) according to the present disclosure includes an imaging unit (10) and a recognition unit (14). The imaging unit (10) generates image data by capturing a plurality of images in different wavelength bands using imaging pixels (R, G, B, IR) receiving light in four or more types of wavelength bands. The recognition unit (14) recognizes a subject from each of the plurality of pieces of image data for each of the wavelength bands.

92. 发明授权

US11341325B2 Data normalization and extraction system 有权
公开(公告)号：US11341325B2
公开(公告)日：2022-05-24
申请号：US16696977
申请日：2019-11-26
申请人： Palantir Technologies Inc.
发明人： Casey Patton , Paul Gribelyuk , Kayo Teramoto , Aaron Rubin , Ankit Shankar
IPC分类号： G06F40/186 , G06F16/93 , G06F3/0486 , G06V10/88 , G06V30/412 , G06V30/146 , G06V30/10
摘要： A data ingestion system normalizes ingested documents and extracts data based on a template that is applied to the documents. In an aspect, the system accesses a document of a document type and determines a template to apply to the document. The system normalizes the document, extracts data values from the document based at least in part on the template, and generates structured data based at least partly on the extracted data.

93. 发明申请

US20220092752A1 METHOD OF IMAGE EVALUATION FOR SIM MICROSCOPY AND SIM MICROSCOPY METHOD 有权
公开(公告)号：US20220092752A1
公开(公告)日：2022-03-24
申请号：US17467912
申请日：2021-09-07
申请人： Carl- Zeiss Microscopy GmbH
发明人： Ingo KLEPPE , Yauheni Novikau , Lutz Schaefer
IPC分类号： G06T5/20 , G06T5/50 , G06T5/00 , G06V10/145 , G06V20/69 , G06V10/88 , G02B21/06 , G02B21/36
摘要： A method of image evaluation when performing SIM microscopy on a sample includes: A) providing n raw images of the sample, which were each generated by illuminating the sample with an individually positioned SIM illumination pattern and imaging the sample in accordance with a point spread function, B) providing (S1) n illumination pattern functions, which each describe one of the individually positioned SIM illumination patterns, C) providing (S1) the point spread function and D) Carrying out an iteration method, which includes following iteration steps a) to e), as follows: a) providing an estimated image of the sample, b) generating simulated raw images, in each case by image processing of the estimated image using the point spread function and one of the n illumination pattern functions such that n simulated raw images are obtained, c) assigning each of the n simulated raw images to that of the n provided raw images which was generated by the illumination pattern that corresponds to the illumination pattern function used to generate the simulated raw image, and calculating n correction raw images by the comparison of each provided raw image with the simulated raw image assigned thereto, d) generating a correction image by combining image processing of the n correction raw images using the point spread function and the n illumination pattern functions, wherein a filtering step is carried out in each implementation of iteration step d), said filtering step suppressing a spatial fundamental frequency of the illumination pattern, and e) reconstructing the estimated image of the sample by means of the correction image and using the corrected estimated image of the sample as the estimated image of the sample in iteration step a) in the next run through the iteration.

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