会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 93. 发明申请
    • ULTRAVIOLET LIGHT-EMITTING DIODE EXPOSURE APPARATUS FOR MICROFABRICATION
    • 超紫外线发光二极管曝光装置
    • US20090002669A1
    • 2009-01-01
    • US12163645
    • 2008-06-27
    • Rong LiuEvan Palmer
    • Rong LiuEvan Palmer
    • G03B27/32G03B27/54
    • G03F7/70391G03F7/7005
    • An exposure apparatus for use in optical lithography can include a holder and a plurality of UV-LED modules carried by the holder and disposed in an array. A respective plurality of collimating lenses can be disposed in an array corresponding to the array of UV-LED modules. The plurality of UV-LED modules and the respective plurality of collimating lenses can provide a respective plurality of distinct beams of UV light. The plurality of collimating lenses may be spaced from the plurality of UV-LED modules and spaced from the exposure plane and have an optical configuration providing a composite beam of UV light formed from the plurality of distinct beams of UV light in which each beam inside the periphery of the array overlaps each adjacent beam by at least 70% at the exposure plane. A method for directing light onto an exposure plane in an optical lithography procedure is provided.
    • 用于光学光刻的曝光装置可以包括保持器和由保持器携带并且以阵列布置的多个UV-LED模块。 可以将相应的多个准直透镜设置成与UV-LED模块的阵列对应的阵列。 多个UV-LED模块和相应的多个准直透镜可以提供相应的多个不同的UV光束。 多个准直透镜可以与多个UV-LED模块间隔开并且与曝光平面间隔开并且具有提供由多个不同的UV光束形成的UV光的复合光束的光学配置,其中, 阵列的周边在曝光平面上与每个相邻的光束重叠至少70%。 提供了一种在光学光刻过程中将光引导到曝光平面上的方法。
    • 95. 发明申请
    • POSITION DETECTING METHOD AND DEVICE, PATTERNING DEVICE, AND SUBJECT TO BE DETECTED
    • 位置检测方法和装置,绘图装置,并且被检测
    • US20080112609A1
    • 2008-05-15
    • US11933490
    • 2007-11-01
    • Masao INOUE
    • Masao INOUE
    • G06K9/62
    • G03F7/70391G03F9/7046G03F9/7076G03F9/7088
    • A substrate to be processed by a patterning device has a group of a plurality of alignment marks formed within a predetermined area as an alignment area, each of the plurality of alignment marks being an information recording code that records its own location relative to a reference position on the substrate. In alignment of the substrate, an image of such an alignment area that includes a group of the plurality of alignment marks is captured. Thus, even if the area of image capturing is reduced with increasing image magnification, at least one of the plurality of alignment marks can be included in the image. One of the alignment marks whose images are included in this image is defined as a target mark, and the position of the substrate is derived based on the target mark in the image. Thus, the position of the substrate can be detected by a single image capturing operation.
    • 由图案形成装置处理的基板具有形成在预定区域内的多个对准标记的一组作为对准区域,多个对准标记中的每一个是信息记录代码,其相对于参考位置记录其自己的位置 在基板上。 在基板的对准中,捕获包括一组多个对准标记的这种对准区域的图像。 因此,即使图像拍摄的区域随着图像放大率的增加而减小,多个对准标记中的至少一个可以包括在图像中。 将图像包括在该图像中的对准标记中的一个被定义为目标标记,并且基于图像中的目标标记导出基板的位置。 因此,可以通过单次图像捕获操作来检测基板的位置。
    • 98. 发明申请
    • Optical wiring substrate fabrication process and optical wiring substrate device
    • 光布线基板制造工艺和光布线基板装置
    • US20040037487A1
    • 2004-02-26
    • US10456965
    • 2003-06-09
    • FUJI PHOTO FILM CO., LTD.
    • Daisuke NakayaTakeshi FujiiYoji OkazakiKazuhiko NaganoHiromi Ishikawa
    • G02B006/12
    • G03F7/7005G02B6/136G02B6/138G02B2006/12104G03F7/70291G03F7/70391
    • An optical wiring substrate fabrication method capable of simple formation, by maskless exposure, of an inclined face shape at an end portion of a core layer structuring an optical waveguide. Using an exposure apparatus, image exposure is carried out with a light beam which is modulated by a spatial modulation element in accordance with image information. A predetermined area of a photosensitive material (a photoresist), which is coated on the core layer which is a material of the optical wiring substrate, is exposed by a light beam (UV) and patterned to form an etching mask. A region corresponding to the inclined face, which is to be formed at the end portion of the core layer, is exposed and patterned by the light beam, exposure amounts of which are controlled in accordance with the inclined form of the inclined face, such that an end portion of the etching mask has an inclined face structure. When the core layer is worked by etching using this etching mask, working of the core layer at the end portion of the core layer progresses in proportion to film thickness of the etching mask, and the inclined face is formed.
    • 一种光学布线基板的制造方法,其能够通过无掩模地曝光在构成光波导的芯层的端部处形成倾斜的表面形状。 使用曝光装置,利用由空间调制元件根据图像信息调制的光束进行图像曝光。 通过光束(UV)对作为光布线基板的材料的芯层上涂布的感光材料(光致抗蚀剂)的预定区域进行曝光并图案化以形成蚀刻掩模。 对应于要形成在芯层的端部的倾斜面的区域通过光束曝光和图案化,其曝光量根据倾斜面的倾斜形式被控制,使得 蚀刻掩模的端部具有倾斜面结构。 当通过使用该蚀刻掩模的蚀刻加工芯层时,芯层的端部的芯层的加工与蚀刻掩模的膜厚度成比例地进行,并且形成倾斜面。