专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

91. 发明授权

US08121814B2 Three-dimensional processor and method for controlling display of three-dimensional data in the three-dimensional processor 有权
标题翻译：用于三维处理器中三维数据显示的三维处理器和方法
公开(公告)号：US08121814B2
公开(公告)日：2012-02-21
申请号：US12322963
申请日：2009-02-10
申请人： Yoshihisa Abe , Toshio Kawano
发明人： Yoshihisa Abe , Toshio Kawano
IPC分类号： G01B21/02 , G01B21/00 , G06F19/00 , G06F17/40
CPC分类号： G01B11/25
摘要： A method is provided for controlling display of three-dimensional data in a three-dimensional processor that processes three-dimensional data indicating three-dimensional position coordinates of each point on a surface of an object to be measured, the three-dimensional data being obtained by projecting measurement light onto the object and receiving measurement light reflected from the object. The method includes obtaining reliability data that are an index of reliability of three-dimensional data of said each point, enabling a user to adjust a threshold for defining a range of the reliability, and displaying, on a screen of a display, three-dimensional data corresponding to reliability falling within a range defined by the threshold adjusted by the user with the three-dimensional data displayed distinguishably from different three-dimensional data.
摘要翻译：提供了一种用于控制三维处理器中的三维数据的显示的方法，该三维处理器处理指示待测物体的表面上的每个点的三维位置坐标的三维数据，获得的三维数据通过将测量光投射到物体上并接收从物体反射的测量光。该方法包括获得作为所述每个点的三维数据的可靠性的索引的可靠性数据，使得用户能够调整用于定义可靠性的范围的阈值，并且在显示器的屏幕上显示三维与由用户调整的阈值所限定的范围内的可靠度相对应的数据与由不同的三维数据可区分地显示的三维数据相对应的数据。

92. 发明授权

US07724380B2 Method and system for three-dimensional measurement 有权
标题翻译：三维测量方法和系统
公开(公告)号：US07724380B2
公开(公告)日：2010-05-25
申请号：US11434310
申请日：2006-05-15
申请人： Shinichi Horita , Yoshihisa Abe
发明人： Shinichi Horita , Yoshihisa Abe
IPC分类号： G06K5/00
CPC分类号： G06T7/579 , G06T2200/08
摘要： A three-dimensional measurement method is provided for measuring an object shape in a non-contact manner by using a non-contact sensor and a sensor moving mechanism that changes a position and a posture of the sensor and can operate by numerical control, moving the non-contact sensor in accordance with measurement path information indicating plural positions and postures of the sensor at the respective positions. The measurement path information is set in advance by teaching. The method includes performing preliminary three-dimensional measurement of the object in accordance with preliminary measurement path information, using shape data obtained by the preliminary three-dimensional measurement and shape data of an imaginary object as a measurement target in the teaching to detect positioning error between the object and the imaginary object, modifying the measurement path information depending on the detected positioning error, and performing three-dimensional measurement of the object in accordance with the modified measurement path information.
摘要翻译：提供一种三维测量方法，用于通过使用改变传感器的位置和姿势并且可以通过数字控制操作的非接触传感器和传感器移动机构以非接触的方式测量物体形状，根据测量路径信息指示传感器在各个位置处的多个位置和姿势的非接触式传感器。通过教学预先设定测量路径信息。该方法包括根据初步测量路径信息，使用通过初步三维测量获得的形状数据和虚拟对象的形状数据作为测量对象来执行对象的初步三维测量，以检测教学中的定位误差物体和虚拟物体，根据检测出的定位误差来修正测量路径信息，并根据修改的测量路径信息进行物体的三维测量。

93. 发明授权

US07719687B2 Apparatus for measuring reflection characteristics of object surfaces 有权
标题翻译：用于测量物体表面反射特性的装置
公开(公告)号：US07719687B2
公开(公告)日：2010-05-18
申请号：US11805486
申请日：2007-05-23
申请人： Jun Matsumoto , Kenji Imura , Yoshihiro Okui
发明人： Jun Matsumoto , Kenji Imura , Yoshihiro Okui
IPC分类号： G01B9/02
CPC分类号： G01N21/57
摘要： A reflection characteristic measuring apparatus for measuring a characteristic, such as a gloss, of a sample surface. The apparatus includes at least one illuminator for illuminating a sample surface to be measured with light and a plurality of light receiving sections which are arranged axially symmetrically to each other with respect to a normal to an intended object surface and which output two-dimensional light receiving data. A deriving section derives a characteristic of the sample surface such as gloss based on a weighted average obtained by applying a weighting factor to each of the light receiving data outputted from the light receiving sections.
摘要翻译：一种用于测量样品表面的光泽等特性的反射特性测量装置。该装置包括至少一个照明器，用于用光照射被测量的样品表面和相对于预期物体表面的法线彼此轴向对称布置的多个光接收部分，并且输出二维光接收数据。导出部分基于通过对从光接收部分输出的每个光接收数据应用加权因子而获得的加权平均，导出样品表面的特性，例如光泽度。

94. 发明授权

US07715020B2 Three-dimensional shape measuring system 有权
标题翻译：三维形状测量系统
公开(公告)号：US07715020B2
公开(公告)日：2010-05-11
申请号：US11811781
申请日：2007-06-12
申请人： Wataru Yamaguchi , Shinichi Horita , Yoshihisa Abe
发明人： Wataru Yamaguchi , Shinichi Horita , Yoshihisa Abe
IPC分类号： G01B11/24 , G01B11/30
CPC分类号： G01B11/2518
摘要： A three-dimensional shape measuring system is provided with a measuring unit having a three-dimensional measurement range and adapted to measure the three-dimensional shape of a measurement object in a noncontact manner, a measurement range shifting unit for shifting the position of the measurement range of the measuring unit, a shape calculating unit for calculating the overall three-dimensional shape of the measurement object from a plurality of measurement data obtained by shifting the measurement range relative to the measurement object, and a judging unit for setting judgment areas in specified peripheral areas within the measurement range and judging the presence or absence of any unmeasured area of the measurement object outside the measurement range based on measurement data corresponding to the judgment areas. The measurement range shifting unit shifts the position of the measurement range in a direction toward the unmeasured area when the presence of the unmeasured area is judged by the judging unit.
摘要翻译：三维形状测量系统具有测量单元，该测量单元具有三维测量范围并适于以非接触方式测量测量对象的三维形状;测量范围移动单元，用于移动测量位置测量单元的范围，形状计算单元，用于根据通过相对于测量对象移动测量范围而获得的多个测量数据来计算测量对象的整体三维形状;以及判断单元，用于设置指定的测量对象的测量范围在测量范围内的外围区域，并且基于与判断区域相对应的测量数据，判断测量范围之外的测量对象的任何未测量区域的存在或不存在。当判断单元判断存在未测量区域时，测量范围移动单元将测量范围的位置朝向未测量区域的方向移动。

95. 发明申请

US20100091270A1 Optical property measurement apparatus 有权
标题翻译：光学性能测量仪器
公开(公告)号：US20100091270A1
公开(公告)日：2010-04-15
申请号：US12587518
申请日：2009-10-07
申请人： Takeshi Matsumoto , Shiniji Yamamoto , Kenji Imura , Kazuya Kiyoi , Yoshiyuki Nagashima , Yasushi Goto
发明人： Takeshi Matsumoto , Shiniji Yamamoto , Kenji Imura , Kazuya Kiyoi , Yoshiyuki Nagashima , Yasushi Goto
IPC分类号： G01J1/42
CPC分类号： G01J3/02 , G01J3/0291 , G01J3/506
摘要： An optical property measurement apparatus includes: a main body which includes a plane-shape surface that is so disposed as to face the display portion; an optical sensor which receives light directed from an opening that is formed through the plane-shape surface; and a support portion which is disposed on a side of the plane-shape surface and keeps a constant distance between the display portion and the plane-shape surface; wherein a light shield portion that is so disposed as to enclose a circumferential area of the opening of the plane-shape surface and shields entrance of light from a region other than a measurement target region of the display portion when the optical property is measured.
摘要翻译：光学特性测量装置包括：主体，其包括面对显示部分的平面形状表面; 接收从通过所述平面形状表面形成的开口指向的光的光学传感器; 以及支撑部，其设置在所述平面形状表面的一侧，并且在所述显示部和所述平面形状表面之间保持恒定的距离; 其特征在于，在测量所述光学特性时，所述遮光部被设置成包围所述平面形状面的开口的周向区域，并遮蔽来自所述显示部的测量对象区域以外的区域的光的入射。

96. 发明授权

US07587094B2 Phase measurement system 失效
标题翻译：相位测量系统
公开(公告)号：US07587094B2
公开(公告)日：2009-09-08
申请号：US11150061
申请日：2005-06-10
申请人： Koji Fujiwara , Takanobu Ojima
发明人： Koji Fujiwara , Takanobu Ojima
IPC分类号： G06K9/40
CPC分类号： G01B11/2536
摘要： A reference image of a pattern having a first pitch and projected on a sample 1 by a projector 6 is captured by a camera 5. Next, a measuring image of a pattern having a second pitch and projected on the sample 1 by the projector 6 is captured by the camera 5. Here, the second pitch of the pattern light is determined by a value calculated based on the phase resolution of the pattern light having the first pitch. Then, using the reference image thus obtained, phase coupling for the measuring image is performed. The three-dimensional shape of the sample is obtained in this manner.
摘要翻译：具有第一间距并由投影仪6投影在样品1上的图案的参考图像被照相机5拍摄。接下来，通过投影仪6将具有第二间距并在投影到样品1上的图案的测量图像是这里，图案光的第二间距由基于具有第一间距的图案光的相位分辨率计算的值确定。然后，使用如此获得的参考图像，执行用于测量图像的相位耦合。以这种方式获得样品的三维形状。

97. 发明授权

US07538870B2 Multi-channel colorimeter and method for measuring spectral intensity characteristics 有权
标题翻译：多通道色度计和光谱强度特性测量方法
公开(公告)号：US07538870B2
公开(公告)日：2009-05-26
申请号：US10984718
申请日：2004-11-09
申请人： Kenji Imura
发明人： Kenji Imura
IPC分类号： G01J3/28
CPC分类号： G01J3/2803 , G01J3/0232 , G01J3/28 , G01J3/465
摘要： A multi-channel colorimeter has a spectral means which separates light to be measured into components of different wavelengths, a photoelectric converter provided with multiple wavelength channels that receive the separated light to be measured according to the wavelengths to output the corresponding signals at the respective wavelengths, a calculating section that calculates spectral characteristics of the light to be measured based on a composite spectral sensitivity which approximates a predetermined spectral sensitivity by integrating the outputs from the respective wavelength channels multiplied by predetermined weighting factors; and a special weighting factor generator that correctively sets the weighting factors as special weighting factors depending on a spectral intensity of the light to be measured.
摘要翻译：多通道色度计具有将被测量的光分离成不同波长的分量的光谱装置，具有多个波长通道的光电转换器，该多个波长通道根据波长接收待测量的分离光以输出相应波长的对应信号，计算部，其基于通过对来自各波长信道的输出乘以预定加权因子进行积分而近似于预定的光谱灵敏度的复合光谱灵敏度来计算待测光的光谱特性; 以及特殊的加权因子发生器，其根据所测量的光的光谱强度将加权因子校正为特定加权因子。

98. 发明申请

US20080297791A1 Reflection characteristic measuring apparatus, and method for calibrating reflection characteristic measuring apparatus 有权
标题翻译：反射特性测量装置和校准反射特性测量装置的方法
公开(公告)号：US20080297791A1
公开(公告)日：2008-12-04
申请号：US12156003
申请日：2008-05-29
申请人： Kenji Imura
发明人： Kenji Imura
IPC分类号： G01J3/30
CPC分类号： G01J3/28 , G01J3/524 , G01N21/25 , G01N21/274
摘要： In a reflection characteristic measuring apparatus 10 and a method for calibrating the reflection characteristic measuring apparatus, multiple standard spectral characteristics, or multiple calibration data based on the multiple standard spectral characteristics are obtained in advance with corresponding reference values relating to an emission characteristic of a light source 21. An optimum standard spectral characteristic or an optimum calibration data is selected from the multiple standard spectral characteristics or the multiple calibration data obtained. A spectral reflection characteristic of a sample is calculated using the selected standard spectral characteristic or the selected calibration data.
摘要翻译：在反射特性测量装置10和用于校准反射特性测量装置的方法中，基于多个标准光谱特性的多个标准光谱特性或多个校准数据预先获得与光的发射特性相关的参考值源21。从多个标准光谱特征或所获得的多个校准数据中选择最佳标准光谱特性或最佳校准数据。使用所选择的标准光谱特性或所选择的校准数据来计算样品的光谱反射特性。

99. 发明申请

US20080243393A1 Biometric information measuring apparatus and biometric information measuring system 有权
标题翻译：生物特征信息测量仪器和生物识别信息测量系统
公开(公告)号：US20080243393A1
公开(公告)日：2008-10-02
申请号：US12006400
申请日：2008-01-02
申请人： Koji YAMAMOTO , Satoshi YOKOTA , Yoshiroh NAGAI , Kazumi KITAJIMA , Norihiro TATEDA
发明人： Koji YAMAMOTO , Satoshi YOKOTA , Yoshiroh NAGAI , Kazumi KITAJIMA , Norihiro TATEDA
IPC分类号： G01N33/48
CPC分类号： A61B5/681 , A61B5/02055 , A61B5/02416 , A61B5/02438 , A61B5/1112 , A61B5/1455 , A61B5/4818 , A61B5/6823
摘要： A biometric information measuring apparatus has a storage device for storing data concerning a biometric signal or biometric information derived from the biometric signal in association with position information indicating the current location of a sensor unit of the apparatus. Since the biometric information measuring apparatus provides the position information acquired when the data on the biometric signal or the biometric information was obtained, one can know the location and behavior of a subject at the time of measurement and exactly analyze the biometric information on the subject.
摘要翻译：生物体信息测量装置具有存储装置，用于存储与生物信息有关的数据或与生物信息相关的生物信息，该位置信息指示装置的传感器单元的当前位置。由于生物体信息测量装置提供当获得了关于生物信息或生物特征信息的数据时获取的位置信息，所以可以在测量时知道被摄体的位置和行为，并精确地分析关于对象的生物信息。

100. 发明申请

US20080024795A1 Three-dimensional shape measuring system, and three-dimensional shape measuring method 有权
标题翻译：三维形状测量系统，三维形状测量方法
公开(公告)号：US20080024795A1
公开(公告)日：2008-01-31
申请号：US11879686
申请日：2007-07-18
申请人： Shinji Yamamoto , Yoshihisa Abe
发明人： Shinji Yamamoto , Yoshihisa Abe
IPC分类号： G01B11/24
CPC分类号： G01B11/2527 , G06T7/521
摘要： A three-dimensional shape measuring system includes: a light projecting/receiving apparatus which causes a light receiver to receive light reflected on a surface of a measurement object onto a light receiving surface thereof at a predetermined cycle multiple times, while changing a projecting direction of the light; and a measuring apparatus for measuring a three-dimensional shape of the measurement object, utilizing light receiving data. The measuring apparatus includes: a light receiving time setter for setting a light receiving time in each cycle with respect to each of light receiving areas constituting the light receiving surface; a data converter for converting an output value representing the light receiving data obtained in each cycle into an output value standardized with respect to the light receiving time in each cycle, if the light receiving times are different in the cycles; a projection timing acquirer for acquiring a projection timing at which the light receiving amount of each light receiving area is maximum; and a position acquirer for acquiring a position of a measurement point on the surface of the measurement object corresponding to each light receiving area.
摘要翻译：三维形状测量系统包括：光投射/接收装置，其使得光接收器以预定周期多次将测量对象的表面上反射的光接收到其受光面上，同时改变投影方向光; 以及利用光接收数据测量测量对象的三维形状的测量装置。测量装置包括：光接收时间设定器，用于相对于构成光接收表面的每个光接收区域设定每个周期中的光接收时间; 数据转换器，用于将每个周期中获得的光接收数据的输出值转换为相对于每个周期中的光接收时间标准化的输出值，如果光接收时间在周期不同; 投影定时获取器，用于获取每个光接收区域的光接收量最大的投影定时; 以及位置获取器，用于获取与每个光接收区域对应的测量对象表面上的测量点的位置。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式