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    • 94. 发明授权
    • High power light-emitting diode package comprising substrate having beacon
    • 包括具有信标的基板的大功率发光二极管封装
    • US07612385B2
    • 2009-11-03
    • US11323487
    • 2005-12-30
    • Young-Woo KimTae-Hoon KimYoung-Moon Yu
    • Young-Woo KimTae-Hoon KimYoung-Moon Yu
    • H01L29/22H01L33/00H01L27/15H01L29/267H01L31/12H01L29/16H01L23/02
    • H01L33/642H01L25/0753H01L33/60H01L33/62H01L2224/48091H01L2924/00012H01L2924/00014
    • Disclosed herein is a package structure including at least one high power light-emitting diode to exhibit excellent heat release properties. In the package structure, a light-emitting diode chip which generates heat is directly attached to a beacon processed to protrude from part of a heat spreader having high heat conductivity, whereby an electrical wiring portion is separated from a heat release portion, thus maximizing heat release properties and realizing high luminance and reliability. The package structure is composed of a beacon formed on a metal or non-metal substrate having high heat conductivity to mount a high power light-emitting diode chip, to increase heat release properties; a wiring portion provided on the same line as the diode to input and output power and signals; and a reflection cup having a cavity, which may be inserted into or attached to the heat spreader or the wiring substrate, including a low temperature co-fired ceramic substrate, a high temperature co-fired ceramic substrate, or a printed circuit board.
    • 本文公开了包括至少一个高功率发光二极管以显示出优异的散热特性的封装结构。 在封装结构中,产生热量的发光二极管芯片直接附着在处理成从具有高导热性的散热器的一部分突出的信标处,由此将电线路部分与放热部分分开,从而使热量最大化 释放性能,实现高亮度和可靠性。 封装结构由形成在具有高导热性的金属或非金属基板上的信标构成,以安装大功率发光二极管芯片,以增加散热性能; 设置在与二极管相同的线路上的布线部分,用于输入和输出功率和信号; 以及具有空腔的反射杯,其可以插入或附着到散热器或布线基板,包括低温共烧陶瓷基板,高温共烧陶瓷基板或印刷电路板。
    • 95. 发明申请
    • High power light-emitting diode package comprising substrate having beacon
    • 包括具有信标的基板的大功率发光二极管封装
    • US20080019133A1
    • 2008-01-24
    • US11323487
    • 2005-12-30
    • Young-Woo KimTae-Hoon KimYoung-Moon Yu
    • Young-Woo KimTae-Hoon KimYoung-Moon Yu
    • F21V29/00
    • H01L33/642H01L25/0753H01L33/60H01L33/62H01L2224/48091H01L2924/00012H01L2924/00014
    • Disclosed herein is a package structure including at least one high power light-emitting diode to exhibit excellent heat release properties. In the package structure, a light-emitting diode chip which generates heat is directly attached to a beacon processed to protrude from part of a heat spreader having high heat conductivity, whereby an electrical wiring portion is separated from a heat release portion, thus maximizing heat release properties and realizing high luminance and reliability. The package structure is composed of a beacon formed on a metal or non-metal substrate having high heat conductivity to mount a high power light-emitting diode chip, to increase heat release properties; a wiring portion provided on the same line as the diode to input and output power and signals; and a reflection cup having a cavity, which may be inserted into or attached to the heat spreader or the wiring substrate, including a low temperature co-fired ceramic substrate, a high temperature co-fired ceramic substrate, or a printed circuit board.
    • 本文公开了包括至少一个高功率发光二极管以显示出优异的散热特性的封装结构。 在封装结构中,产生热量的发光二极管芯片直接附着在处理成从具有高导热性的散热器的一部分突出的信标处,由此将电线路部分与放热部分分开,从而使热量最大化 释放性能,实现高亮度和可靠性。 封装结构由形成在具有高导热性的金属或非金属基板上的信标构成,以安装大功率发光二极管芯片,以增加散热性能; 设置在与二极管相同的线路上的布线部分,用于输入和输出功率和信号; 以及具有空腔的反射杯,其可以插入或附着到散热器或布线基板,包括低温共烧陶瓷基板,高温共烧陶瓷基板或印刷电路板。
    • 97. 发明授权
    • Semiconductor wafer position detecting system, semiconductor device fabricating facility of using the same, and wafer position detecting method thereof
    • 半导体晶片位置检测系统,使用其的半导体器件制造设备及其晶片位置检测方法
    • US06710886B2
    • 2004-03-23
    • US10027641
    • 2001-12-19
    • In-Hak ParkChul ParkSang-Hee HanTae-Hoon Kim
    • In-Hak ParkChul ParkSang-Hee HanTae-Hoon Kim
    • G01B1114
    • H01L21/67259G01B11/028H01L21/681
    • It is disclosed a semiconductor wafer position detecting system, a semiconductor device fabricating facility of using the same, and a semiconductor wafer position detecting method to prevent process failure in advance prior to proceeding various processes. The structure includes a chuck plate formed with at least one or more holes at a portion thereof on which a wafer is normally and closely placed; a fluid line connected between a lower portion of each of the holes and a fluid flow device; at least one or more valves provided on the fluid line to control fluid flow in response to an opening/closing control signal; a sensor provided on the fluid line to detect a state of fluid; an output device for outputting signals in response to an output control signal; and a controller for selectively applying an opening/closing control signal and an output control signal to the valve and output device, and detecting the position state of wafer by a measurement signal applied from the sensor.
    • 公开了一种半导体晶片位置检测系统,使用该半导体器件的半导体器件制造设备,以及在进行各种处理之前预先防止处理故障的半导体晶片位置检测方法。该结构包括形成有至少一个 在其上正常且紧密放置晶片的部分处具有多个孔; 连接在每个孔的下部和流体流动装置之间的流体管线; 至少一个或多个阀,设置在流体管线上以响应于打开/关闭控制信号来控制流体流动; 设置在流体管线上以检测流体状态的传感器; 输出装置,用于响应于输出控制信号输出信号; 以及用于选择性地向阀和输出装置施加打开/关闭控制信号和输出控制信号的控制器,以及通过从传感器施加的测量信号来检测晶片的位置状态。