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    • 94. 发明授权
    • Method and apparatus for electrical test of CMOS pixel sensor arrays
    • CMOS像素传感器阵列的电气测试方法和装置
    • US6118482A
    • 2000-09-12
    • US986499
    • 1997-12-08
    • Lawrence T. ClarkMark A. BeileyEric J. Hoffman
    • Lawrence T. ClarkMark A. BeileyEric J. Hoffman
    • H04N5/367H04N17/00H04N5/335
    • H04N5/367H04N17/002
    • CMOS pixel sensors have been of interest as replacements for CCD's in imaging applications. Such devices promise lower power and simpler system level design through fewer power supply voltages and higher functional integration. It is difficult and cost ineffective to utilize images to test active pixel sensors. Here, a method and apparatus for electrical testing of CMOS pixel sensors is described which involves electrically writing a pattern into the CMOS pixel sensors for the detection of adjacent cell shorts or stuck at faults as well as verification of read-channel circuit functionality and performance. The invention provides for an electrical testing of CMOS pixel array that is simple, time efficient and cost effective for use in, for example, production.
    • 作为CCD成像应用中的替代品,CMOS像素传感器已经成为关注的焦点。 这样的器件通过更少的电源电压和更高的功能集成来承诺更低的功率和更简单的系统级设计。 利用图像测试有源像素传感器是困难和成本无效的。 这里描述了用于CMOS像素传感器的电测试的方法和装置,其涉及将图案电学写入CMOS像素传感器,用于检测相邻单元短路或卡在故障以及读通道电路功能和性能的验证。 本发明提供了CMOS像素阵列的电气测试,其简单,时间高效并且在例如生产中使用成本有效。
    • 96. 发明授权
    • Phase detector circuit
    • 相位检测电路
    • US5271040A
    • 1993-12-14
    • US811092
    • 1991-12-20
    • Lawrence T. Clark
    • Lawrence T. Clark
    • H03D13/00H03L7/089H03D3/18
    • H03L7/0891H03D13/002
    • A digital phase detector circuit is designed for particular application with a phase-locked loop voltage controlled oscillator system for synchronizing the MFM synchronization pulses on a floppy disk with the operation of the computer in which the disk is used. A classical Type 4 digital phase detector is employed, to which a bistable latch is added. The latch is set upon coincidence of reference and data pulses applied to the phase detector within a pre-established time interval or window. The output of the phase detector then is utilized only when the output of the latch indicates such coincidence; so that erroneous control signals are not supplied through the loop whenever data pulses fail to occur in adjacent time frames or windows.
    • 数字相位检测器电路设计用于具有用于使软盘上的MFM同步脉冲与其中使用盘的计算机的操作同步的锁相环压控振荡器系统的特定应用。 采用经典的4型数字相位检测器,加入双稳态锁存器。 在预先建立的时间间隔或窗口内,基准和数据脉冲一同被施加到相位检测器上设置锁存器。 然后相位检测器的输出仅在锁存器的输出指示这样的重合时才被使用; 使得当相邻时间帧或窗口中的数据脉冲不能发生时,不通过循环提供错误的控制信号。
    • 97. 发明授权
    • Radiation hardened digital circuit
    • 辐射硬化数字电路
    • US09467144B2
    • 2016-10-11
    • US14808348
    • 2015-07-24
    • Lawrence T. Clark
    • Lawrence T. Clark
    • H03K3/00H03K19/003H03K19/007
    • H03K19/0033H03K19/0075
    • This disclosure relates generally to radiation hardened digital circuits. In one embodiment, a radiation hardened digital circuit includes a delay network and a first Muller C element. The delay network is configured to generate a first delayed clock signal from a global clock signal such that that the first delayed clock signal is delayed with respect to the global clock signal. The first Muller C element is configured to generate a first clock input signal and set the first clock input signal to one of a set of clock states in response to the first delayed clock signal and the global clock signal each being provided in a same one of the set of clock states and is configured to hold the first clock input signal otherwise. Thus, a radiation strike is prevented from causing a soft error in the first clock input signal.
    • 本公开一般涉及辐射硬化的数字电路。 在一个实施例中,辐射硬化的数字电路包括延迟网络和第一Muller C元件。 延迟网络被配置为从全局时钟信号产生第一延迟时钟信号,使得第一延迟时钟信号相对于全局时钟信号被延迟。 第一Muller C元件被配置为产生第一时钟输入信号,并且响应于第一延迟时钟信号和全局时钟信号将第一时钟输入信号设置为一组时钟状态中的一个,每个时钟信号分别以 一组时钟状态,并被配置为保持第一个时钟输入信号。 因此,防止辐射打击在第一时钟输入信号中引起软错误。
    • 99. 发明申请
    • SEQUENTIAL STATE ELEMENTS IN TRIPLE-MODE REDUNDANT (TMR) STATE MACHINES
    • 三态冗余(TMR)状态机中的顺序状态元素
    • US20140331197A1
    • 2014-11-06
    • US14304155
    • 2014-06-13
    • Lawrence T. ClarkNathan D. HindmanDan Wheeler Patterson
    • Lawrence T. ClarkNathan D. HindmanDan Wheeler Patterson
    • G06F17/50
    • G06F17/5072G06F17/505H03K19/00315
    • The disclosure relates generally to triple-redundant sequential state (TRSS) machines formed as integrated circuits on a semiconductor substrate, such as CMOS, and computerized methods and systems of designing the triple-redundant sequential state machines. Of particular focus in this disclosure are sequential state elements (SSEs) used to sample and hold bit states. The sampling and holding of bits states are synchronized by a clock signal thereby allowing for pipelining in the TRSS machines. In particular, the clock signal may oscillate between a first clock state and a second clock state to synchronize the operation of the SSE according to the timing provided by the clock states. The SSEs has a self-correcting mechanism to protect against radiation induced soft errors. The SSE may be provided in a pipeline circuit of a TRSS machine to receive and store a bit state of bit signal generated by combinational circuits within the pipeline circuit.
    • 本公开一般涉及形成为诸如CMOS的半导体衬底上的集成电路的三冗余顺序状态(TRSS)机器,以及设计三重冗余顺序状态机的计算机化方法和系统。 本公开中特别关注的是用于采样和保持位状态的顺序状态元素(SSE)。 位状态的采样和保持由时钟信号同步,从而允许在TRSS机器中流水线化。 具体地,时钟信号可以在第一时钟状态和第二时钟状态之间振荡,以根据由时钟状态提供的定时使SSE的操作同步。 SSEs具有自我纠正机制,可防止辐射诱发的软错误。 SSE可以设置在TRSS机器的管线电路中,以接收和存储由管线电路内的组合电路产生的位信号的位状态。