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    • 96. 发明授权
    • System and method for detecting a network failure
    • 用于检测网络故障的系统和方法
    • US07983175B2
    • 2011-07-19
    • US12233724
    • 2008-09-19
    • Martin J. GaleClare OwensPeter JohnsonJason Edmeades
    • Martin J. GaleClare OwensPeter JohnsonJason Edmeades
    • H04L12/28
    • H04L41/0677H04L43/50
    • A method and system detect a failed communication transmission that fails to reach a recipient after attempting to be transmitted from a sender to the recipient over a communication path. Upon detection of the failed communication, the method initiates a first inquiry process from the sender. This first inquiry process tests how far a first test communication transmission can travel from the sender to the recipient along the communication path. Similarly, upon detection of the failed communication, the method initiates a second inquiry process from the recipient. The second inquiry process tests how far a second test communication transmission can travel from the recipient to the sender along the communication path. The method combines the results of the first inquiry process and the results of the second inquiry process to determine which of the nodes in the communication path are not successfully forwarding test communications to identify at least one possibly faulty node. The identification of the possibly faulty node is then output to the sender and the recipient.
    • 一种方法和系统检测在尝试通过通信路径从发送者发送到接收者之后,无法到达接收者的故障通信传输。 在检测到故障通信时,该方法从发送者发起第一询问处理。 该第一查询过程测试第一测试通信传输可以沿着通信路径从发送者到接收者的距离。 类似地,在检测到故障通信时,该方法从接收者发起第二个查询处理。 第二个查询过程测试第二个测试通信传输可以沿着通信路径从接收者到发送者的距离。 该方法将第一查询处理的结果和第二查询处理的结果相结合,以确定通信路径中的哪些节点不成功地转发测试通信以识别至少一个可能故障的节点。 然后将可能有故障的节点的识别输出到发送者和接收方。
    • 98. 发明申请
    • SYSTEM AND METHOD FOR DETECTING A NETWORK FAILURE
    • 用于检测网络故障的系统和方法
    • US20100074118A1
    • 2010-03-25
    • US12233724
    • 2008-09-19
    • Martin J. GaleClare OwensPeter JohnsonJason Edmeades
    • Martin J. GaleClare OwensPeter JohnsonJason Edmeades
    • H04L12/26
    • H04L41/0677H04L43/50
    • A method and system detect a failed communication transmission that fails to reach a recipient after attempting to be transmitted from a sender to the recipient over a communication path. Upon detection of the failed communication, the method initiates a first inquiry process from the sender. This first inquiry process tests how far a first test communication transmission can travel from the sender to the recipient along the communication path. Similarly, upon detection of the failed communication, the method initiates a second inquiry process from the recipient. The second inquiry process tests how far a second test communication transmission can travel from the recipient to the sender along the communication path. The method combines the results of the first inquiry process and the results of the second inquiry process to determine which of the nodes in the communication path are not successfully forwarding test communications to identify at least one possibly faulty node. The identification of the possibly faulty node is then output to the sender and the recipient.
    • 一种方法和系统检测在尝试通过通信路径从发送者发送到接收者之后,无法到达接收者的故障通信传输。 在检测到故障通信时,该方法从发送者发起第一询问处理。 该第一查询过程测试第一测试通信传输可以沿着通信路径从发送者到接收者的距离。 类似地,在检测到故障通信时,该方法从接收者发起第二个查询处理。 第二个查询过程测试第二个测试通信传输可以沿着通信路径从接收者到发送者的距离。 该方法将第一查询处理的结果和第二查询处理的结果相结合,以确定通信路径中的哪些节点不成功地转发测试通信以识别至少一个可能故障的节点。 然后将可能有故障的节点的识别输出到发送者和接收方。
    • 100. 发明授权
    • Method for forming heat sinks on silicon on insulator wafers
    • 在绝缘体硅片上形成散热片的方法
    • US07528012B1
    • 2009-05-05
    • US11508495
    • 2006-08-22
    • Peter J. HopperIouri MirgorodskiVladislav VashchenkoPeter Johnson
    • Peter J. HopperIouri MirgorodskiVladislav VashchenkoPeter Johnson
    • H01L21/00
    • H01L29/78606H01L23/3677H01L23/481H01L2924/0002H01L2924/00
    • An apparatus and method for a heat sink to dissipate the heat sourced by the encapsulated transistors in a SOI wafer. The apparatus includes a transistor formed in the active silicon layer of the wafer. The active surface is formed over an oxide layer and a bulk silicon layer. A heat sink is formed in the bulk silicon layer and configured to sink heat through the bulk silicon layer, to the back surface of the wafer. After the transistor is fabricated, the heat sink is formed by masking, patterning and etching the back surface of the wafer to form plugs in the bulk silicon layer. The plug extends through the thickness of the bulk layer to the oxide layer. Thereafter, the plug is filled with a thermally conductive material, such as a metal or DAG (thermally conductive paste). During operation, heat from the transistor is dissipated through the heat sink. In various embodiments of the invention, the plug hole is formed using either an anisotropic plasma or wet etch.
    • 散热器散热由SOI晶片中的封装晶体管产生的热量的装置和方法。 该装置包括形成在晶片的有源硅层中的晶体管。 活性表面形成在氧化物层和体硅层上。 在体硅层中形成散热器,并且构造成将热量通过体硅层吸收到晶片的背面。 在制造晶体管之后,通过掩模,图案化和蚀刻晶片的背面来形成散热器,以在体硅层中形成插塞。 塞子延伸穿过本体层的厚度到氧化物层。 此后,塞子填充有导热材料,例如金属或DAG(导热浆)。 在运行期间,来自晶体管的热量通过散热器消散。 在本发明的各种实施例中,插塞孔使用各向异性等离子体或湿蚀刻形成。