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    • 3. 发明授权
    • Address generation circuit and semiconductor memory device including the same
    • 地址生成电路和包括其的半导体存储器件
    • US09552857B1
    • 2017-01-24
    • US15210737
    • 2016-07-14
    • SK hynix Inc.
    • Kyeong-Min Chae
    • G11C29/00G11C8/18G11C8/04G11C8/20G11C8/06
    • G11C8/18G11C8/04G11C8/06G11C8/20G11C29/70
    • An address generation circuit includes: a first address control clock generation unit suitable for generating a first address control clock signal in response to an internal clock signal; a second address control clock generation unit suitable for generating a second address control clock signal in response to one of an address initialization signal and the first address control clock signal; an address counting unit suitable for counting the second address control clock signal and generating a counting address; and a repair control unit suitable for latching the counting address in response to the second address control clock signal, comparing the latched counting address with a repair address, and generating a redundancy address based on the comparison result.
    • 地址产生电路包括:第一地址控制时钟生成单元,适于响应于内部时钟信号产生第一地址控制时钟信号; 第二地址控制时钟生成单元,适于响应于地址初始化信号和第一地址控制时钟信号之一产生第二地址控制时钟信号; 地址计数单元,适于对第二地址控制时钟信号进行计数并产生计数地址; 以及修复控制单元,其适于响应于所述第二地址控制时钟信号来锁存所述计数地址,将所述锁存的计数地址与修复地址进行比较,以及基于所述比较结果生成冗余地址。
    • 5. 发明申请
    • METHODS, SYSTEMS, AND COMPUTER READABLE MEDIA FOR ADDRESS AND DATA INTEGRITY CHECKING IN FLASH MEMORY OPERATIONS
    • 闪存存储器操作中的地址和数据完整性检查的方法,系统和计算机可读介质
    • US20160077911A1
    • 2016-03-17
    • US14486704
    • 2014-09-15
    • SanDisk Technologies Inc.
    • Ashutosh MalsheKarthik Krishnamoorthy
    • G06F11/10G11C29/52
    • G06F11/1068G06F11/1016G11C8/20G11C16/08G11C29/52G11C2029/0411
    • Methods, systems, and computer readable media for address and data integrity checking in flash memory operations are disclosed. One method includes, at a storage controller, generating, for an address unit, an address parity unit. The method further includes generating a command sequence including the address unit, the address parity unit, and an operation command specifying an operation to be performed on a flash memory array. The method further includes providing the command sequence to a flash memory device that includes the non-volatile memory array. The method further includes performing, by the flash memory device, an address integrity check on the address unit using the address parity unit. The method further includes determining whether or not to perform an operation specified by the command sequence based at least in part on a result of the address integrity check.
    • 公开了用于闪速存储器操作中的地址和数据完整性检查的方法,系统和计算机可读介质。 一种方法包括在存储控制器处为地址单元生成地址奇偶校验单元。 该方法还包括产生包括地址单元,地址奇偶校验单元和指定要对闪存阵列执行的操作的操作命令的命令序列。 该方法还包括向包括非易失性存储器阵列的闪存器件提供命令序列。 该方法还包括使用地址奇偶校验单元,通过闪存设备执行对地址单元的地址完整性检查。 该方法还包括至少部分地基于地址完整性检查的结果来确定是否执行由命令序列指定的操作。