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    • 5. 发明授权
    • Preparation method for lead-zirconium-titanium based thin film
    • 铅 - 锆 - 钛基薄膜的制备方法
    • US5641540A
    • 1997-06-24
    • US415837
    • 1995-04-03
    • Wan-in LeeJun-ki Lee
    • Wan-in LeeJun-ki Lee
    • H01G4/33C23C16/40H01B3/12
    • C23C16/409
    • An organometallic zirconium precursor, represented by following formula:L.sub.x.Zr(THD).sub.4 [I]wherein L is an electron donor ligand selected from the group consisting of NR.sub.3 (R.dbd.H, CH.sub.3) gas and Cl.sub.2 gas; THD denotes 2,2',6,6'-tetramethyl-3,5-heptanedione; and x is in the range of 0.3 to 1.5 with the proviso that L is NR.sub.3 or in the range of 0.5 to 2 with the proviso that L is Cl.sub.2, is prepared by flowing a gas phase electron donor into a bubbler containing bis (2,2',6,6'-tetramethyl-3,5-heptanedione)Zr at a predetermined temperature, to synthesize, in-situ, an adduct. The precursor exhibits a remarkable improvement in volatility, and in stability at the vaporization point.Lead-zirconium-titanium thin films prepared from the precursor, display superior reproducibility and reliability.
    • 由下式表示的有机金属锆前体:Lx.Zr(THD)4 [I]其中L是选自NR 3(R = H,CH 3)气体和Cl 2气体的电子供体配体; THD表示2,2',6,6'-四甲基-3,5-庚二酮; 并且x为0.3至1.5的范围,条件是L为NR 3或0.5至2的范围,条件是L为Cl 2,通过使气相电子给体流入含有双(2, 2',6,6'-四甲基-3,5-庚二酮)Zr在预定温度下,原位合成加合物。 该前体在挥发性方面表现出显着的改善,并且在蒸发点处具有稳定性。 由前体制备的铅锆钛薄膜显示出优异的再现性和可靠性。
    • 6. 发明授权
    • Method for manufacturing ferroelectric capacitor
    • 铁电电容器的制造方法
    • US5913117A
    • 1999-06-15
    • US618370
    • 1996-03-19
    • Wan-in Lee
    • Wan-in Lee
    • H01L27/04H01L21/02H01L21/822H01L21/8242H01L21/8246H01L27/10H01L27/105H01L27/108
    • H01L28/56H01L21/02H01L28/60
    • This invention is related to the manufacturing method of ferroelectric capacitor, which can be applied to the memory cell of FRAM (Ferroelectric Random Access Memory). Fabrication of ferroelectric capacitor comprising the steps of: coating a first PZT sol-gel solution on a RuO.sub.X electrode to form a first PZT layer; baking the first PZT layer; annealing the first PZT layer to produce a seed layer with a perovskite structure; coating a second PZT sol-gel solution on the seed layer to form a second PZT layer; baking the second PZT layer; and annealing the second PZT layer to form a PZT film with a perovskite structure. The ferroelectric capacitor not only has a lower leakage current level and a higher degree of remanent polarization than the conventional capacitor, but also has almost the same leakage current level as an existing Pt/PZT/Pt capacitor.
    • 本发明涉及可应用于FRAM(铁电随机存取存储器)的存储单元的铁电电容器的制造方法。 铁电电容器的制造包括以下步骤:在RuOX电极上涂覆第一PZT溶胶 - 凝胶溶液以形成第一PZT层; 烘烤第一个PZT层; 退火第一PZT层以产生具有钙钛矿结构的种子层; 在种子层上涂覆第二PZT溶胶 - 凝胶溶液以形成第二PZT层; 烘烤第二PZT层; 并退火第二PZT层以形成具有钙钛矿结构的PZT膜。 铁电电容器不仅具有比常规电容器更低的漏电流水平和更高的剩余极化程度,而且与现有的Pt / PZT / Pt电容器具有几乎相同的漏电流水平。