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1. 发明授权

US09810646B2 Edge treatment system and method for evaluating a material 有权
公开(公告)号：US09810646B2
公开(公告)日：2017-11-07
申请号：US14695532
申请日：2015-04-24
申请人： PaneraTech, Inc.
发明人： Yakup Bayram , Alexander C. Ruege , Eric K. Walton
IPC分类号： G01R27/02 , G01N22/00
CPC分类号： G01N22/00
摘要： Disclosed is an improved system and method to treat an edge of a material for determining a property of such material through measurements of electromagnetic waves. The system and method are operative to mitigate the adverse effects caused by the interaction between an electromagnetic wave and an edge of a sample of a material under test. The system and method define a configuration to block and significantly attenuate the propagation of electromagnetic waves that may reach an edge of the sample being evaluated. This configuration reduces the undesired effects caused by edge-diffraction that may interfere with the measurement of desired electromagnetic waves for material evaluation. As a result, a property of a material under test can be measured more accurately, especially near the edges of such material. In addition, the system and method enable the evaluation of a small-size sample of a material.

2. 发明申请

US20170234808A1 MATERIAL EROSION MONITORING SYSTEM AND METHOD 有权
公开(公告)号：US20170234808A1
公开(公告)日：2017-08-17
申请号：US15346161
申请日：2016-11-08
申请人： PaneraTech, Inc.
发明人： Alexander C. Ruege , Yakup Bayram
IPC分类号： G01N22/02 , G01B15/02
CPC分类号： G01N22/02 , F27D21/0021 , G01B15/02 , G01N33/386 , G01N33/388
摘要： Disclosed is an improved system and method to evaluate the status of a material. The system and method are operative to identify flaws and measure the erosion profile and thickness of different materials, including refractory materials, using electromagnetic waves. The system is designed to reduce a plurality of reflections, associated with the propagation of electromagnetic waves launched into the material under evaluation, by a sufficient extent so as to enable detection of electromagnetic waves of interest reflected from remote discontinuities of the material. Furthermore, the system and method utilize a configuration and signal processing techniques that reduce clutter and enable the isolation of electromagnetic waves of interest. Moreover, the launcher is impedance matched to the material under evaluation, and the feeding mechanism is designed to mitigate multiple reflection effects to further suppress clutter.

3. 发明授权

US09880110B2 Material erosion monitoring system and method 有权
公开(公告)号：US09880110B2
公开(公告)日：2018-01-30
申请号：US15346161
申请日：2016-11-08
申请人： PaneraTech, Inc.
发明人： Alexander C. Ruege , Yakup Bayram
IPC分类号： G01N22/02 , G01B15/02 , F27D21/00 , G01N33/38
CPC分类号： G01N22/02 , F27D21/0021 , G01B15/02 , G01N33/386 , G01N33/388
摘要： Disclosed is an improved system and method to evaluate the status of a material. The system and method are operative to identify flaws and measure the erosion profile and thickness of different materials, including refractory materials, using electromagnetic waves. The system is designed to reduce a plurality of reflections, associated with the propagation of electromagnetic waves launched into the material under evaluation, by a sufficient extent so as to enable detection of electromagnetic waves of interest reflected from remote discontinuities of the material. Furthermore, the system and method utilize a configuration and signal processing techniques that reduce clutter and enable the isolation of electromagnetic waves of interest. Moreover, the launcher is impedance matched to the material under evaluation, and the feeding mechanism is designed to mitigate multiple reflection effects to further suppress clutter.

4. 发明授权

US09488601B2 Material erosion monitoring system and method 有权
标题翻译：材料侵蚀监测系统及方法
公开(公告)号：US09488601B2
公开(公告)日：2016-11-08
申请号：US14226102
申请日：2014-03-26
申请人： PaneraTech, Inc.
发明人： Alexander C. Ruege , Yakup Bayram , Eric K. Walton
IPC分类号： G01N17/02 , G01B7/06 , G01N27/61 , G01N22/02 , G01B15/02 , F27D21/00
CPC分类号： G01N22/02 , F27D21/0021 , G01B15/02 , G01N33/388
摘要： Disclosed is an improved system and method to evaluate the status of a material. The system and method are operative to identify flaws and measure the erosion profile and thickness of different materials, including refractory materials, using electromagnetic waves. The system is designed to reduce a plurality of reflections, associated with the propagation of electromagnetic waves launched into the material under evaluation, by a sufficient extent so as to enable detection of electromagnetic waves of interest reflected from remote discontinuities of the material. Furthermore, the system and method utilize a configuration and signal processing techniques that reduce clutter and enable the isolation of electromagnetic waves of interest. Moreover, the launcher is impedance matched to the material under evaluation, and the feeding mechanism is designed to mitigate multiple reflection effects to further suppress clutter.
摘要翻译：公开了一种用于评估材料状态的改进的系统和方法。该系统和方法可用于识别缺陷并使用电磁波测量不同材料（包括耐火材料）的侵蚀特征和厚度。该系统旨在减少与发射到被评估材料中的电磁波的传播相关联的多个反射足够的程度，以便能够检测从材料的远端不连续性反射的感兴趣的电磁波。此外，该系统和方法利用减少杂波并使得能够隔离感兴趣的电磁波的配置和信号处理技术。此外，发射器与正在评估的材料阻抗匹配，并且进给机构被设计为减轻多重反射效应以进一步抑制杂波。

5. 发明申请

US20150355109A1 EDGE TREATMENT SYSTEM AND METHOD FOR EVALUATING A MATERIAL 有权
标题翻译：边缘处理系统和评估材料的方法
公开(公告)号：US20150355109A1
公开(公告)日：2015-12-10
申请号：US14695532
申请日：2015-04-24
申请人： PaneraTech, Inc.
发明人： Yakup Bayram , Alexander C. Ruege , Eric K. Walton
IPC分类号： G01N22/00 , G01N27/02
CPC分类号： G01N22/00
摘要： Disclosed is an improved system and method to treat an edge of a material for determining a property of such material through measurements of electromagnetic waves. The system and method are operative to mitigate the adverse effects caused by the interaction between an electromagnetic wave and an edge of a sample of a material under test. The system and method define a configuration to block and significantly attenuate the propagation of electromagnetic waves that may reach an edge of the sample being evaluated. This configuration reduces the undesired effects caused by edge-diffraction that may interfere with the measurement of desired electromagnetic waves for material evaluation. As a result, a property of a material under test can be measured more accurately, especially near the edges of such material. In addition, the system and method enable the evaluation of a small-size sample of a material.
摘要翻译：公开了一种改进的系统和方法，用于通过测量电磁波来处理材料的边缘以确定这种材料的性质。该系统和方法可用于减轻由电磁波与被测试材料的样品边缘之间的相互作用引起的不利影响。该系统和方法定义了一种配置，以阻止并显着地衰减可能到达被评估样品边缘的电磁波的传播。该配置减少了边缘衍射引起的不期望的影响，这些影响可能干扰用于材料评估的期望电磁波的测量。结果，可以更精确地测量被测材料的特性，特别是在这种材料的边缘附近。此外，该系统和方法能够评估材料的小尺寸样品。

6. 发明申请

US20150276577A1 MATERIAL EROSION MONITORING SYSTEM AND METHOD 有权
标题翻译：材料腐蚀监测系统及方法
公开(公告)号：US20150276577A1
公开(公告)日：2015-10-01
申请号：US14226102
申请日：2014-03-26
申请人： PaneraTech, Inc.
发明人： Alexander C. Ruege , Yakup Bayram , Eric K. Walton
IPC分类号： G01N17/02 , G01B7/06 , G01N27/61
CPC分类号： G01N22/02 , F27D21/0021 , G01B15/02 , G01N33/388
摘要： Disclosed is an improved system and method to evaluate the status of a material. The system and method are operative to identify flaws and measure the erosion profile and thickness of different materials, including refractory materials, using electromagnetic waves. The system is designed to reduce a plurality of reflections, associated with the propagation of electromagnetic waves launched into the material under evaluation, by a sufficient extent so as to enable detection of electromagnetic waves of interest reflected from remote discontinuities of the material. Furthermore, the system and method utilize a configuration and signal processing techniques that reduce clutter and enable the isolation of electromagnetic waves of interest. Moreover, the launcher is impedance matched to the material under evaluation, and the feeding mechanism is designed to mitigate multiple reflection effects to further suppress clutter.
摘要翻译：公开了一种用于评估材料状态的改进的系统和方法。该系统和方法可用于识别缺陷并使用电磁波测量不同材料（包括耐火材料）的侵蚀特征和厚度。该系统旨在减少与发射到被评估材料中的电磁波的传播相关联的多个反射足够的程度，以便能够检测从材料的远端不连续性反射的感兴趣的电磁波。此外，该系统和方法利用减少杂波并使得能够隔离感兴趣的电磁波的配置和信号处理技术。此外，发射器与正在评估的材料阻抗匹配，并且进给机构被设计为减轻多重反射效应以进一步抑制杂波。

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