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    • 4. 发明申请
    • SEMICONDUCTOR LIGHT EMITTING DEVICE
    • 半导体发光器件
    • US20110198633A1
    • 2011-08-18
    • US12871285
    • 2010-08-30
    • Koichi TACHIBANAToshiki HikosakaShigeya KimuraHajime NagoShinya Nunoue
    • Koichi TACHIBANAToshiki HikosakaShigeya KimuraHajime NagoShinya Nunoue
    • H01L33/34
    • H01L33/06H01L33/32H01L33/325
    • According to one embodiment, a semiconductor light emitting device includes an n-type semiconductor layer, a p-type semiconductor layer, and a light emitting portion. The light emitting portion is provided between the semiconductor layers and includes barrier layers and well layers alternately stacked. An n-side end well layer which is closest to the n-type semiconductor layer contains InwnGa1-wnN and has a layer thickness twn. An n-side end barrier layer which is closest to the n-type semiconductor layer contains InbnGa1-bnN and has a layer thickness tbn. A p-side end well layer which is closest to the p-type semiconductor layer contains InwpGa1-wpN and has a layer thickness twp. A p-side end barrier layer which is closest to the p-type semiconductor contains InbpGa1-bpN and has a layer thickness tbp. A value of (wp×twp+bp×tbp)/(twp+tbp) is higher than (wn×twn+bn×tbn)/(twn+tbn) and is not higher than 5 times (wn×twn+bn×tbn)/(twn+tbn).
    • 根据一个实施例,半导体发光器件包括n型半导体层,p型半导体层和发光部分。 发光部分设置在半导体层之间,并且包括交替堆叠的势垒层和阱层。 最靠近n型半导体层的n侧端阱层包含InwnGa1-wnN并具有层厚度twn。 最靠近n型半导体层的n侧端势垒层包含InbnGa1-bnN并具有层厚度tbn。 最靠近p型半导体层的p侧端阱层包含InwpGa1-wpN,并具有层厚度twp。 最靠近p型半导体的p侧端势垒层包含InbpGa1-bpN,并具有层厚度tbp。 (wp×twp + bp×tbp)/(twp + tbp)的值高于(wn×twn + bn×tbn)/(twn + tbn),并且不高于5次(wn×twn + bn× tbn)/(twn + tbn)。
    • 5. 发明申请
    • SEMICONDUCTOR LIGHT EMITTING DEVICE
    • 半导体发光器件
    • US20120138889A1
    • 2012-06-07
    • US13198105
    • 2011-08-04
    • Koichi TACHIBANAHajime NagoToshiki HikosakaShigeya KimuraShinya Nunoue
    • Koichi TACHIBANAHajime NagoToshiki HikosakaShigeya KimuraShinya Nunoue
    • H01L33/04
    • H01L33/325H01L33/02H01L33/06H01L33/32H01L33/40H01S5/32341
    • According to one embodiment, a semiconductor light emitting device includes an n-type semiconductor layer, a p-type semiconductor layer, a light emitting part, and a p-side electrode. The light emitting part is provided between the n-type and the p-type semiconductor layers, and includes a plurality of barrier layers and a plurality of well layers. The p-side electrode contacts the p-type semiconductor layer. The p-type semiconductor layer includes first, second, third, and fourth p-type layers. The first p-type layer contacts the p-side electrode. The second p-type layer contacts the light emitting part. The third p-type layer is provided between the first p-type layer and the second p-type layer. The fourth p-type layer is provided between the second p-type layer and the third p-type layer. The second p-type layer contains Al and contains a p-type impurity in a lower concentration lower than that in the first concentration.
    • 根据一个实施例,半导体发光器件包括n型半导体层,p型半导体层,发光部分和p侧电极。 发光部分设置在n型和p型半导体层之间,并且包括多个势垒层和多个阱层。 p侧电极与p型半导体层接触。 p型半导体层包括第一,第二,第三和第四p型层。 第一p型层与p侧电极接触。 第二p型层与发光部接触。 第三p型层设置在第一p型层和第二p型层之间。 第四p型层设置在第二p型层和第三p型层之间。 第二p型层含有Al并含有比第一浓度低的浓度的p型杂质。
    • 6. 发明申请
    • SEMICONDUCTOR LIGHT EMITTING DEVICE
    • 半导体发光器件
    • US20110198561A1
    • 2011-08-18
    • US12874510
    • 2010-09-02
    • Koichi TACHIBANAHajime NagoToshiki HikosakaShigeya KimuraShinya Nunoue
    • Koichi TACHIBANAHajime NagoToshiki HikosakaShigeya KimuraShinya Nunoue
    • H01L33/32
    • H01L33/145B82Y20/00H01L33/06H01L33/32H01S5/34333
    • According to one embodiment, a semiconductor light emitting device includes an n-type semiconductor layer, a p-type semiconductor layer, a light emitting portion, a first layer, a second layer, and an intermediate layer. The semiconductor layers include nitride semiconductor. The light emitting portion is provided between the n-type semiconductor layer and the p-type semiconductor layer and includes a quantum well layer. The first layer is provided between the light emitting portion and the p-type semiconductor layer and includes AlX1Ga1-x1N having first Al composition ratio x1. The second layer is provided between the first layer and the p-type semiconductor layer and includes Alx2Ga1-x2N having second Al composition ratio x2 higher than the first Al composition ratio x1. The intermediate layer is provided between the first layer and the light emitting portion and has a thickness not smaller than 3 nanometers and not larger than 8 nanometers and includes Inz1Ga1-z1N (0≦z1
    • 根据一个实施例,半导体发光器件包括n型半导体层,p型半导体层,发光部分,第一层,第二层和中间层。 半导体层包括氮化物半导体。 发光部分设置在n型半导体层和p型半导体层之间,并且包括量子阱层。 第一层设置在发光部和p型半导体层之间,并且包括具有第一Al组成比x1的AlX1Ga1-x1N。 第二层设置在第一层和p型半导体层之间,并且包括具有比第一Al组成比x1高的第二Al组成比x2的Al x2 Ga1-x2N。 中间层设置在第一层和发光部之间,并且具有不小于3纳米且不大于8纳米的厚度,并且包括Inz1Ga1-z1N(0&nlE; z1 <1)。
    • 7. 发明申请
    • NITRIDE SEMICONDUCTOR LIGHT-EMITTING DEVICE
    • 氮化物半导体发光器件
    • US20110037049A1
    • 2011-02-17
    • US12717653
    • 2010-03-04
    • Koichi TACHIBANAHajime NagoToshiki HikosakaShinya Nunoue
    • Koichi TACHIBANAHajime NagoToshiki HikosakaShinya Nunoue
    • H01L33/04H01L33/30
    • H01L33/32H01L33/06
    • Disclosed is a nitride semiconductor light-emitting device including a substrate, a pair of p-type and n-type clad layers formed on the substrate, and an active layer having a single quantum well structure or a multiple quantum well structure, which is sandwiched between the p-type clad layer and the n-type clad layer, and includes a quantum well layer and a pair of barrier layers each having a larger bandgap than that of the quantum well layer, the quantum well layer being sandwiched between the pair of barrier layers. Each of the pair of barrier layers has a multi-layer structure including, starting from the quantum well layer side, a first subbarrier layer having a composition of Iny1Ga1-y1N, a second subbarrier layer having a composition of Iny2Ga1-y2N and a third subbarrier layer having a composition of Iny3Ga1-y3N, in which y1, y2 and y3 satisfy the relationship of 0≦y1,y3
    • 公开了一种氮化物半导体发光器件,其包括衬底,形成在衬底上的一对p型和n型覆盖层以及具有单量子阱结构或多量子阱结构的有源层,其夹在 在p型覆盖层和n型覆盖层之间,包括量子阱层和一对阻挡层,每个阻挡层的带隙比量子阱层的带隙大,量子阱层夹在一对 阻挡层。 所述一对势垒层中的每一个具有多层结构,包括从量子阱层侧开始具有In y Ga 1-y N N的组成的第一子屏蔽层,具有In y Ga 1-y N N的组成的第二子隔离层和第三子阱 y1,y2和y3满足0&nlE; y1,y3