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1. 发明申请

US20130015870A1 TEST SYSTEM WITH CONTACT TEST PROBES 审中-公开
标题翻译：具有接触测试探针的测试系统
公开(公告)号：US20130015870A1
公开(公告)日：2013-01-17
申请号：US13183393
申请日：2011-07-14
申请人： Joshua G. Nickel , Mattia Pascolini , Adil Syed
发明人： Joshua G. Nickel , Mattia Pascolini , Adil Syed
IPC分类号： G01R31/20
CPC分类号： G01R1/06772 , G01R31/2822
摘要： Electronic device structures such as structures containing antennas, cables, connectors, welds, electronic device components, conductive housing structures, and other structures can be tested for faults using a test system to perform conducted testing. The test system may include a vector network analyzer or other test unit that generates radio-frequency test signals in a range of frequencies. The radio-frequency test signals may be transmitted to electronic device structures under test using a contact test probe that has at least signal and ground pins. The test probe may receive corresponding radio-frequency signals. The transmitted and received radio-frequency test signals may be analyzed to determine whether the electronic device structures under test contain a fault.
摘要翻译：可以使用测试系统对包含天线，电缆，连接器，焊接，电子设备部件，导电壳体结构和其他结构的结构的电子设备结构进行故障测试，以执行进行的测试。测试系统可以包括矢量网络分析器或其它测试单元，其在一个频率范围内产生射频测试信号。射频测试信号可以使用至少具有信号和接地引脚的接触测试探头传输到被测电子设备结构。测试探头可以接收相应的射频信号。可以分析发送和接收的射频测试信号以确定被测电子设备结构是否包含故障。

2. 发明授权

US09310422B2 Methods and apparatus for testing small form factor antenna tuning elements 有权
标题翻译：用于测试小尺寸天线调谐元件的方法和装置
公开(公告)号：US09310422B2
公开(公告)日：2016-04-12
申请号：US13487149
申请日：2012-06-01
申请人： Jayesh Nath , Liang Han , Matthew A. Mow , Hagan O'Connor , Joshua G. Nickel , Peter Bevelacqua , Mattia Pascolini , Robert W. Schlub , Ruben Caballero
发明人： Jayesh Nath , Liang Han , Matthew A. Mow , Hagan O'Connor , Joshua G. Nickel , Peter Bevelacqua , Mattia Pascolini , Robert W. Schlub , Ruben Caballero
IPC分类号： G01R31/00 , G01R31/28 , G01R1/04
CPC分类号： G01R31/2808 , G01R1/0408 , G01R31/2822 , G01R31/2837
摘要： A test system for testing a device under test (DUT) is provided. The test system may include a DUT receiving structure configured to receive the DUT during testing and a DUT retention structure that is configured to press the DUT against the DUT receiving structure so that DUT cannot inadvertently shift around during testing. The DUT retention structure may include a pressure sensor operable to detect an amount of pressure that is applied to the DUT. The DUT retention structure may be raised and lowered vertically using a manually-controlled or a computer-controlled positioner. The positioner may be adjusted using a coarse tuning knob and a fine tuning knob. The positioner may be calibrated such that the DUT retention structure applies a sufficient amount of pressure on the DUT during production testing.
摘要翻译：提供了一种用于测试被测器件（DUT）的测试系统。测试系统可以包括被配置为在测试期间接收DUT的DUT接收结构和被配置成将DUT抵抗DUT接收结构按压的DUT保持结构，使得DUT在测试期间不会无意中移动。 DUT保持结构可以包括可操作以检测施加到DUT的压力量的压力传感器。 DUT保持结构可以使用手动控制或计算机控制的定位器垂直升高和降低。可以使用粗调节旋钮和微调旋钮调节定位器。可以对定位器进行校准，使得DUT保持结构在生产测试期间在DUT上施加足够的压力。

3. 发明授权

US09214718B2 Methods for characterizing tunable radio-frequency elements 有权
标题翻译：表征可调谐射频元件的方法
公开(公告)号：US09214718B2
公开(公告)日：2015-12-15
申请号：US13415195
申请日：2012-03-08
申请人： Matthew A. Mow , Thomas E. Biedka , Liang Han , Rocco V. Dragone, Jr. , Hongfei Hu , Dean F. Darnell , Joshua G. Nickel , Robert W. Schlub , Mattia Pascolini , Ruben Caballero
发明人： Matthew A. Mow , Thomas E. Biedka , Liang Han , Rocco V. Dragone, Jr. , Hongfei Hu , Dean F. Darnell , Joshua G. Nickel , Robert W. Schlub , Mattia Pascolini , Ruben Caballero
IPC分类号： G01R31/02 , H01Q1/24 , H01Q9/42 , H01Q5/328 , H04B17/12 , H04B17/16 , G01R31/28 , G01R27/32
CPC分类号： H01Q1/243 , G01R27/32 , G01R31/2822 , H01Q5/328 , H01Q9/42 , H04B17/12 , H04B17/16
摘要： A wireless electronic device may contain at least one antenna tuning element for use in tuning the operating frequency range of the device. The antenna tuning element may include radio-frequency switches, continuously/semi-continuously adjustable components such as tunable resistors, inductors, and capacitors, and other load circuits that provide desired impedance characteristics. A test station may be used to measure the radio-frequency characteristics associated with the tuning element. The test station may provide adjustable temperature, power, and impedance control to help emulate a true application environment for the tuning element without having to place the tuning element within an actual device during testing. The test system may include at least one signal generator and a tester for measuring harmonic distortion values and may include at least two signal generators and a tester for measuring intermodulation distortion values. During testing, the antenna tuning element may be placed in a series or shunt configuration.
摘要翻译：无线电子设备可以包含用于调整设备的工作频率范围的至少一个天线调谐元件。天线调谐元件可以包括射频开关，连续/半连续可调组件，例如可调电阻器，电感器和电容器，以及提供所需阻抗特性的其它负载电路。可以使用测试台来测量与调谐元件相关联的射频特性。测试台可以提供可调节的温度，功率和阻抗控制，以帮助模拟调谐元件的真实应用环境，而不必在测试期间将调谐元件放置在实际设备内。测试系统可以包括至少一个信号发生器和用于测量谐波失真值的测试器，并且可以包括用于测量互调失真值的至少两个信号发生器和测试器。在测试期间，天线调谐元件可以被放置成串联或分流配置。

4. 发明申请

US20130203364A1 Tunable Antenna System with Multiple Feeds 有权
标题翻译：具有多个馈源的可调谐天线系统
公开(公告)号：US20130203364A1
公开(公告)日：2013-08-08
申请号：US13368855
申请日：2012-02-08
申请人： Dean F. Darnell , Yuehui Ouyang , Hao Xu , Enrique Ayala Vazquez , Yijun Zhou , Peter Bevelacqua , Joshua G. Nickel , Nanbo Jin , Matthew A. Mow , Robert W. Schlub , Mattia Pascolini , Hongfei Hu
发明人： Dean F. Darnell , Yuehui Ouyang , Hao Xu , Enrique Ayala Vazquez , Yijun Zhou , Peter Bevelacqua , Joshua G. Nickel , Nanbo Jin , Matthew A. Mow , Robert W. Schlub , Mattia Pascolini , Hongfei Hu
IPC分类号： H04B1/18 , H04B1/40
CPC分类号： H01Q1/243 , H01Q5/35
摘要： Electronic devices may be provided that contain wireless communications circuitry. The wireless communications circuitry may include radio-frequency transceiver circuitry and antenna structures. The antenna structures may form an antenna having first and second feeds at different locations. The transceiver circuit may have a first circuit that handles communications using the first feed and may have a second circuit that handles communications using the second feed. A first filter may be interposed between the first feed and the first circuit and a second filter may be interposed between the second feed and the second circuit. The first and second filters and the antenna may be configured so that the first circuit can use the first feed without being adversely affected by the presence of the second feed and so that the second circuit can use the second feed without being adversely affected by the presence of the first feed.
摘要翻译：可以提供包含无线通信电路的电子设备。无线通信电路可以包括射频收发器电路和天线结构。天线结构可以形成在不同位置具有第一和第二馈送的天线。收发器电路可以具有处理使用第一馈送的通信的第一电路，并且可以具有处理使用第二馈送的通信的第二电路。第一过滤器可以插入在第一进料和第一回路之间，并且第二过滤器可以介于第二进料和第二回路之间。第一和第二滤波器和天线可以被配置成使得第一电路可以使用第一馈电而不受第二馈电的存在的不利影响，并且使得第二电路可以使用第二馈电而不受存在的不利影响的第一个饲料。

5. 发明申请

US20130169490A1 Antenna With Switchable Inductor Low-Band Tuning 有权
标题翻译：天线可切换电感低频调谐
公开(公告)号：US20130169490A1
公开(公告)日：2013-07-04
申请号：US13343657
申请日：2012-01-04
申请人： Mattia Pascolini , Robert W. Schlub , Nanbo Jin , Matthew A. Mow , Hongfei Hu , Joshua G. Nickel
发明人： Mattia Pascolini , Robert W. Schlub , Nanbo Jin , Matthew A. Mow , Hongfei Hu , Joshua G. Nickel
IPC分类号： H01Q1/24 , H01Q1/48
CPC分类号： H01Q1/243 , H01Q5/357
摘要： Electronic devices may be provided that contain wireless communications circuitry. The wireless communications circuitry may include radio-frequency transceiver circuitry and antennas. An antenna may be formed from an antenna resonating element arm and an antenna ground. The antenna resonating element arm may have a shorter portion that resonates at higher communications band frequencies and a longer portion that resonates at lower communications band frequencies. A short circuit branch may be coupled between the shorter portion of the antenna resonating element arm and the antenna ground. A series-connected inductor and switch may be coupled between the longer portion of the antenna resonating element arm and the antenna ground. An antenna feed branch may be coupled between the antenna resonating element arm and the antenna ground at a location that is between the short circuit branch and the series-connected inductor and switch.
摘要翻译：可以提供包含无线通信电路的电子设备。无线通信电路可以包括射频收发器电路和天线。天线可以由天线谐振元件臂和天线接地形成。天线谐振元件臂可以具有在较高通信频带频率下谐振的较短部分和在较低通信频带频率下谐振的较长部分。短路支路可以耦合在天线谐振元件臂的较短部分和天线接地之间。串联的电感器和开关可以耦合在天线谐振元件臂的较长部分和天线接地之间。在天线谐振元件臂和天线接地之间的天线馈电支路可以在短路支路和串联连接的电感器和开关之间的位置耦合。

6. 发明授权

US09319908B2 Methods for reducing path loss while testing wireless electronic devices with multiple antennas 有权
标题翻译：在测试具有多个天线的无线电子设备的同时降低路径损耗的方法
公开(公告)号：US09319908B2
公开(公告)日：2016-04-19
申请号：US13272067
申请日：2011-10-12
申请人： Joshua G. Nickel , Mattia Pascolini , Jr-Yi Shen
发明人： Joshua G. Nickel , Mattia Pascolini , Jr-Yi Shen
IPC分类号： H04W24/06 , G01R29/10
CPC分类号： H04W24/06 , G01R29/10
摘要： A test station may include a test host, a test unit, and a test enclosure. A device under test (DUT) having at least first and second antennas may be placed in the test enclosure during production testing. Radio-frequency test signals may be conveyed from the test unit to the DUT using a test antenna in the test enclosure. In a first time period during which the performance of the first antenna is being tested, the DUT may be oriented in a first position such that path loss between the first antenna and the test antenna is minimized. In a second time period during which the performance of the second antenna is being tested, the DUT may be oriented in a second position such that path loss between the second antenna and the test antenna is minimized. The DUT is marked as a passing DUT if gathered test data is satisfactory.
摘要翻译：测试台可以包括测试主机，测试单元和测试机箱。具有至少第一和第二天线的被测设备（DUT）可以在生产测试期间被放置在测试外壳中。射频测试信号可以使用测试机箱中的测试天线从测试单元传送到DUT。在测试第一天线的性能的第一时间段期间，DUT可以被定向在第一位置，使得第一天线和测试天线之间的路径损耗最小化。在测试第二天线的性能的第二时间段期间，DUT可以定位在第二位置，使得第二天线和测试天线之间的路径损耗最小化。如果收集的测试数据令人满意，DUT被标记为通过的DUT。

7. 发明授权

US08798554B2 Tunable antenna system with multiple feeds 有权
标题翻译：可调式天线系统，具有多路馈电
公开(公告)号：US08798554B2
公开(公告)日：2014-08-05
申请号：US13368855
申请日：2012-02-08
申请人： Dean F. Darnell , Yuehui Ouyang , Hao Xu , Enrique Ayala Vazquez , Yijun Zhou , Peter Bevelacqua , Joshua G. Nickel , Nanbo Jin , Matthew A. Mow , Robert W. Schlub , Mattia Pascolini , Hongfei Hu
发明人： Dean F. Darnell , Yuehui Ouyang , Hao Xu , Enrique Ayala Vazquez , Yijun Zhou , Peter Bevelacqua , Joshua G. Nickel , Nanbo Jin , Matthew A. Mow , Robert W. Schlub , Mattia Pascolini , Hongfei Hu
IPC分类号： H04B1/40
CPC分类号： H01Q1/243 , H01Q5/35
摘要： Electronic devices may be provided that contain wireless communications circuitry. The wireless communications circuitry may include radio-frequency transceiver circuitry and antenna structures. The antenna structures may form an antenna having first and second feeds at different locations. The transceiver circuit may have a first circuit that handles communications using the first feed and may have a second circuit that handles communications using the second feed. A first filter may be interposed between the first feed and the first circuit and a second filter may be interposed between the second feed and the second circuit. The first and second filters and the antenna may be configured so that the first circuit can use the first feed without being adversely affected by the presence of the second feed and so that the second circuit can use the second feed without being adversely affected by the presence of the first feed.
摘要翻译：可以提供包含无线通信电路的电子设备。无线通信电路可以包括射频收发器电路和天线结构。天线结构可以形成在不同位置具有第一和第二馈送的天线。收发器电路可以具有处理使用第一馈送的通信的第一电路，并且可以具有处理使用第二馈送的通信的第二电路。第一过滤器可以插入在第一进料和第一回路之间，并且第二过滤器可以介于第二进料和第二回路之间。第一和第二滤波器和天线可以被配置成使得第一电路可以使用第一馈电而不受第二馈电的存在的不利影响，并且使得第二电路可以使用第二馈电而不受存在的不利影响的第一个饲料。

8. 发明申请

US20130093447A1 Methods for Reducing Path Loss While Testing Wireless Electronic Devices with Multiple Antennas 有权
标题翻译：使用多个天线测试无线电子设备时减少路径损耗的方法
公开(公告)号：US20130093447A1
公开(公告)日：2013-04-18
申请号：US13272067
申请日：2011-10-12
申请人： Joshua G. Nickel , Mattia Pascolini , Jr-Yi Shen
发明人： Joshua G. Nickel , Mattia Pascolini , Jr-Yi Shen
IPC分类号： G01R31/00
CPC分类号： H04W24/06 , G01R29/10
摘要： A test station may include a test host, a test unit, and a test enclosure. A device under test (DUT) having at least first and second antennas may be placed in the test enclosure during production testing. Radio-frequency test signals may be conveyed from the test unit to the DUT using a test antenna in the test enclosure. In a first time period during which the performance of the first antenna is being tested, the DUT may be oriented in a first position such that path loss between the first antenna and the test antenna is minimized. In a second time period during which the performance of the second antenna is being tested, the DUT may be oriented in a second position such that path loss between the second antenna and the test antenna is minimized. The DUT is marked as a passing DUT if gathered test data is satisfactory.
摘要翻译：测试台可以包括测试主机，测试单元和测试机箱。具有至少第一和第二天线的被测设备（DUT）可以在生产测试期间被放置在测试外壳中。射频测试信号可以使用测试机箱中的测试天线从测试单元传送到DUT。在测试第一天线的性能的第一时间段期间，DUT可以被定向在第一位置，使得第一天线和测试天线之间的路径损耗最小化。在测试第二天线的性能的第二时间段期间，DUT可以定位在第二位置，使得第二天线和测试天线之间的路径损耗最小化。如果收集的测试数据令人满意，DUT被标记为通过的DUT。

9. 发明申请

US20130050046A1 CUSTOMIZABLE ANTENNA FEED STRUCTURE 有权
标题翻译：可定制的天线进料结构
公开(公告)号：US20130050046A1
公开(公告)日：2013-02-28
申请号：US13223102
申请日：2011-08-31
申请人： Daniel W. Jarvis , Mattia Pascolini , Joshua G. Nickel
发明人： Daniel W. Jarvis , Mattia Pascolini , Joshua G. Nickel
IPC分类号： H01Q1/50 , G01R31/28
CPC分类号： H01Q9/0421 , H01Q1/243 , H01Q9/145 , Y10T29/49004
摘要： Custom antenna structures may be used to compensate for manufacturing variations in electronic device antennas. An antenna may have an antenna feed and conductive structures such as portions of a peripheral conductive electronic device housing member. The custom antenna structures compensate for manufacturing variations that could potentially lead to undesired variations in antenna performance. The custom antenna structures may make customized alterations to antenna feed structures or conductive paths within an antenna. An antenna may be formed from a conductive housing member that surrounds an electronic device. The custom antenna structures may be formed from a printed circuit board with a customizable trace. The customizable trace may have a contact pad portion on the printed circuit board. The customizable trace may be customized to connect the pad to a desired one of a plurality of contacts associated with the conductive housing member to form a customized antenna feed terminal.
摘要翻译：定制天线结构可用于补偿电子设备天线的制造变化。天线可以具有天线馈电和导电结构，例如外围导电电子器件壳体部件的部分。定制天线结构补偿可能导致天线性能不期望的变化的制造变化。定制的天线结构可以对天线馈送结构或天线内的导电路径进行定制的改变。天线可以由围绕电子设备的导电外壳构件形成。定制天线结构可以由具有可定制轨迹的印刷电路板形成。可定制的迹线可以在印刷电路板上具有接触焊盘部分。可定制的迹线可以被定制以将焊盘连接到与导电外壳构件相关联的多个触点中期望的一个触点，以形成定制的天线馈电端子。

10. 发明授权

US09270012B2 Electronic device with calibrated tunable antenna 有权
标题翻译：具有校准可调谐天线的电子设备
公开(公告)号：US09270012B2
公开(公告)日：2016-02-23
申请号：US13363743
申请日：2012-02-01
申请人： Joshua G. Nickel , Mattia Pascolini
发明人： Joshua G. Nickel , Mattia Pascolini
IPC分类号： H01Q9/00 , H01Q1/24 , H01Q9/42 , H01Q5/328
CPC分类号： H01Q1/243 , H01Q5/328 , H01Q9/42
摘要： An electronic device may have tunable antenna structures. A tunable antenna may have an antenna resonating element and an antenna ground. An adjustable electronic component such as an adjustable capacitor, adjustable inductor, or adjustable phase-shift element may be used in tuning the antenna. An impedance matching circuit may be coupled between the tunable antenna and a radio-frequency transceiver. The adjustable electronic component may be coupled to the antenna resonating element or other structures in the antenna or may form part of the impedance matching circuit, a transmission line, a parasitic antenna element, or other antenna structures. During manufacturing, manufacturing variations may cause the performance of the tunable antenna to deviate from desired specifications. Calibration operations may be performed to identify compensating adjustments to be made with the adjustable electronic component. Calibration data for the adjustable component may be stored in control circuitry in the electronic device.
摘要翻译：电子设备可以具有可调谐的天线结构。可调谐天线可以具有天线谐振元件和天线接地。可调电子部件，例如可调电容器，可调电感器或可调相移元件可用于调谐天线。阻抗匹配电路可以耦合在可调谐天线和射频收发器之间。可调电子部件可以耦合到天线谐振元件或天线中的其他结构，或者可以形成阻抗匹配电路，传输线，寄生天线元件或其他天线结构的一部分。在制造过程中，制造变化可能导致可调谐天线的性能偏离所需规格。可以执行校准操作以识别要用可调电子部件进行的补偿调整。可调组件的校准数据可以存储在电子设备中的控制电路中。

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