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1. 发明申请

US20130043896A1 TEST DEVICE FOR PRINTED CIRCUIT BOARD 有权
标题翻译：印刷电路板测试装置
公开(公告)号：US20130043896A1
公开(公告)日：2013-02-21
申请号：US13271247
申请日：2011-10-12
申请人： JIAN-CHUN PAN , HAI-QING ZHOU , YI-XIN TU
发明人： JIAN-CHUN PAN , HAI-QING ZHOU , YI-XIN TU
IPC分类号： G01R31/00
CPC分类号： G01R31/2806
摘要： A test device for testing a printed circuit board (PCB) includes a base and a measuring device. The measuring device includes a testing pin and is capable of measuring any desired point of the PCB on condition that the pin makes contact with the point at an included angle between the pin and a back surface of the PCB which is larger than a predetermined angle. The distance between the base and the PCB satisfies: H>L tan θ, where H is the vertical distance between the PCB and the base, L is the maximum length of an orthogonal projection of the pin on the PCB when the pin is contacting the point, and θ is the predetermined angle.
摘要翻译：用于测试印刷电路板（PCB）的测试装置包括基座和测量装置。该测量装置包括测试销，并且能够测量PCB的任何所需点，条件是销以与销的大小成比大于预定角度的PCB与背面之间的夹角接触点。基座和PCB之间的距离满足：H> L tan＆Thetas;其中H是PCB和底座之间的垂直距离，L是当引脚接触时PCB上的销的正交投影的最大长度点，和＆thetas; 是预定角度。

2. 发明申请

US20120304018A1 APPARATUS FOR TESTING BASIC INPUT OUTPUT SYSTEM CHIP 审中-公开
标题翻译：用于测试基本输入输出系统芯片的设备
公开(公告)号：US20120304018A1
公开(公告)日：2012-11-29
申请号：US13278122
申请日：2011-10-20
申请人： JIAN-CHUN PAN , HAI-QING ZHOU , YI-XIN TU
发明人： JIAN-CHUN PAN , HAI-QING ZHOU , YI-XIN TU
IPC分类号： G06F11/273
CPC分类号： G06F11/2733 , G01R1/0466
摘要： An apparatus for testing a basic input output system (BIOS) chip includes a base and a connector. The base defines a receiving space for housing the BIOS chip. A number of signal pins are formed on sidewalls bounding the receiving space, to electrically connect the BIOS chip. The connector extends from a bottom of the base, and is electrically connected to the signal pins of the base to be connected to a diagnose card to debug the BIOS chip.
摘要翻译：用于测试基本输入输出系统（BIOS）芯片的装置包括基座和连接器。基座定义了用于容纳BIOS芯片的接收空间。多个信号引脚形成在限定接收空间的侧壁上，以电连接BIOS芯片。连接器从基座的底部延伸，并且电连接到要连接到诊断卡的基座的信号引脚以调试BIOS芯片。

3. 发明申请

US20120268887A1 FLASH DRIVE 审中-公开
标题翻译：闪光驱动
公开(公告)号：US20120268887A1
公开(公告)日：2012-10-25
申请号：US13097103
申请日：2011-04-29
申请人： JIAN-CHUN PAN , HAI-QING ZHOU , YI-XIN TU
发明人： JIAN-CHUN PAN , HAI-QING ZHOU , YI-XIN TU
IPC分类号： G06F1/16
CPC分类号： H05K5/0278 , H01R13/447 , H01R24/62
摘要： A flash drive includes a main body and a casing pivotably installed to a first end of the main body. A universal serial bus (USB) connector extends from a second end of the main body. The casing includes two plates and an end piece perpendicularly connected between ends of the plates. The casing is pivoted toward the USB connector to enclose the USB connector.
摘要翻译：闪存驱动器包括主体和可枢转地安装到主体的第一端的外壳。通用串行总线（USB）连接器从主体的第二端延伸。壳体包括两个板和垂直连接在板的端部之间的端部件。外壳朝向USB连接器枢转以封闭USB连接器。

4. 发明申请

US20130059464A1 AUDIO TEST CABLE 失效
标题翻译：音频测试电缆
公开(公告)号：US20130059464A1
公开(公告)日：2013-03-07
申请号：US13277223
申请日：2011-10-20
申请人： JIAN-CHUN PAN , HAI-QING ZHOU , YI-XIN TU
发明人： JIAN-CHUN PAN , HAI-QING ZHOU , YI-XIN TU
IPC分类号： H01R11/00
CPC分类号： H01R31/06 , H01R24/58 , H01R2201/20
摘要： An audio test cable includes three types of audio input and output (I/O) ports. The input port and the output port in each type of audio I/O ports form a short circuit for carrying a loopback test for a motherboard. The audio test cable also includes a test audio jack which connects to the output port of all types of audio I/O ports for carrying out an audio-quality test for the motherboard.
摘要翻译：音频测试电缆包括三种类型的音频输入和输出（I / O）端口。每种类型的音频I / O端口的输入端口和输出端口构成一个短路，用于对主板进行环回测试。音频测试电缆还包括连接到所有类型的音频I / O端口的输出端口的测试音频插孔，用于对主板进行音频质量测试。

5. 发明申请

US20130017707A1 CONNECTOR ASSEMBLY 审中-公开
标题翻译：连接器总成
公开(公告)号：US20130017707A1
公开(公告)日：2013-01-17
申请号：US13280297
申请日：2011-10-24
申请人： JIAN-CHUN PAN , HAI-QING ZHOU , YI-XIN TU
发明人： JIAN-CHUN PAN , HAI-QING ZHOU , YI-XIN TU
IPC分类号： H01R13/627
CPC分类号： H01R13/6273
摘要： A connector assembly includes a first connector and a second connector. The first connector includes a main body, and a latching member extending out from the main body. The latching member includes a resilient extending portion extending from an outer surface of the main body, and a latching protrusion extending out from the extending portion. The second connector to be connected to the first connector, and includes a base, and a connecting member extending out from an outer surface of the base. The connecting member defining sliding groove and a receiving portion communicating with the sliding groove for latching the latching protrusion. Wherein when the first and second connectors are being connected, the latching member slides through the sliding groove, such that the latching protrusion is latched in the receiving portion.
摘要翻译：连接器组件包括第一连接器和第二连接器。第一连接器包括主体和从主体延伸出的闩锁构件。闩锁构件包括从主体的外表面延伸的弹性延伸部分和从延伸部分伸出的闩锁突起。要连接到第一连接器的第二连接器，并且包括基座，以及从基座的外表面延伸出的连接构件。所述连接构件限定滑动槽和与所述滑动槽连通以用于闩锁所述闩锁突起的接收部。其中当第一和第二连接器被连接时，闩锁构件滑动通过滑动槽，使得闩锁突起被锁定在接收部分中。

6. 发明申请

US20130054163A1 POWER MEASURING SYSTEM 审中-公开
标题翻译：功率测量系统
公开(公告)号：US20130054163A1
公开(公告)日：2013-02-28
申请号：US13305060
申请日：2011-11-28
申请人： QI-YAN LUO , SONG-LIN TONG , YI-XIN TU , HAI-QING ZHOU
发明人： QI-YAN LUO , SONG-LIN TONG , YI-XIN TU , HAI-QING ZHOU
IPC分类号： G01R21/00 , G06F19/00
CPC分类号： G01R21/00 , G01R31/2621
摘要： A power measuring system for measuring a turning-on power, a turning-off power, and a turned-on power of a first field-effect transistor includes a pulse driver, a first resistor, a processing unit, and an indication unit. The pulse driver generates square wave signals. The processing unit samples voltages at the source and the drain of the first field-effect transistor, and at the first and second terminals of the first resistor at the moment when the square wave signals changes from low to high or from high to low, and calculates the turning-on power, the turning-off power, and the turned-on power of the first field-effect transistor. The indication unit displays the turning-on power, the turning-off power, and the turned-on power of the first field-effect transistor.
摘要翻译：用于测量第一场效应晶体管的导通电力，断电功率和导通功率的功率测量系统包括脉冲驱动器，第一电阻器，处理单元和指示单元。脉冲驱动器产生方波信号。处理单元在方波信号从低变为高或从高变为低的时刻对第一场效应晶体管的源极和漏极以及第一电阻的第一和第二端的电压进行采样，以及计算第一场效应晶体管的导通功率，关断功率和导通功率。指示单元显示第一场效应晶体管的接通电源，截止电源和导通电源。

7. 发明申请

US20130038447A1 ELECTRONIC LOCKING ASSEMBLY 审中-公开
标题翻译：电子锁定装置
公开(公告)号：US20130038447A1
公开(公告)日：2013-02-14
申请号：US13339378
申请日：2011-12-29
申请人： ZHENG-QUAN PENG , HAI-QING ZHOU , YI-XIN TU
发明人： ZHENG-QUAN PENG , HAI-QING ZHOU , YI-XIN TU
IPC分类号： G08B21/00 , G08B29/00
CPC分类号： G07C9/00309 , G07C9/0069 , G07C2009/00388 , G07C2009/00603 , G07C2009/00793
摘要： An electronic locking assembly includes an electronic lock and an electronic key for unlocking the electronic lock. The electronic key includes a first memory for storing a first password, and a first signal transceiver for encoding the first password into a first wireless signal and transmitting the first wireless signal. The electronic lock includes a main body for physically locking or unlocking the device, a second memory for storing a second password, a second signal transceiver, a processor, and a comparator. The second signal transceiver receives the first wireless signal and decodes the first wireless signal into the first password. The processor sends the first password and the second password to the comparator. The comparator compares whether the first password second password match, and thus to control the main body to physically lock or unlock the device.
摘要翻译：电子锁定组件包括电子锁和用于解锁电子锁的电子钥匙。电子钥匙包括用于存储第一密码的第一存储器和用于将第一密码编码为第一无线信号并发送第一无线信号的第一信号收发器。电子锁包括用于物理地锁定或解锁设备的主体，用于存储第二密码的第二存储器，第二信号收发器，处理器和比较器。第二信号收发器接收第一无线信号并将第一无线信号解码为第一密码。处理器将第一个密码和第二个密码发送到比较器。比较器比较第一密码第二密码是否匹配，从而控制主体物理锁定或解锁设备。

8. 发明申请

US20130038343A1 TEST CIRCUIT FOR TESTING SHORT-CIRCUIT 审中-公开
标题翻译：用于测试短路的测试电路
公开(公告)号：US20130038343A1
公开(公告)日：2013-02-14
申请号：US13275374
申请日：2011-10-18
申请人： YI-XIN TU , JIN-LIANG XIONG , HAI-QING ZHOU
发明人： YI-XIN TU , JIN-LIANG XIONG , HAI-QING ZHOU
IPC分类号： G01R31/20 , G01R31/02
CPC分类号： G01R31/028 , G01R31/025 , G01R31/40
摘要： A test circuit includes two probes, a comparison circuit, a switch circuit, and an indication circuit. The probes are connected to an electronic component to be tested, and a low level signal is output if the electronic component is short-circuited. The comparison circuit outputs a comparison signal based on the shorting signal from the probes. The switch circuit outputs a switch signal based on the comparison signal from the comparison circuit. The indication circuit indicates that the electronic component is short-circuited or not short-circuited based on the switch signal fro m the switch circuit.
摘要翻译：测试电路包括两个探针，比较电路，开关电路和指示电路。探针连接到要测试的电子部件，并且如果电子部件短路，则输出低电平信号。比较电路基于来自探针的短路信号输出比较信号。开关电路基于来自比较电路的比较信号输出开关信号。指示电路表示电子部件基于开关电路的开关信号而短路或不短路。

9. 发明申请

US20130141021A1 MOTOR CONTROL CIRCUIT AND KEYBOARD ASSEMBLY HAVING SAME 审中-公开
标题翻译：电机控制电路和键盘组件
公开(公告)号：US20130141021A1
公开(公告)日：2013-06-06
申请号：US13600208
申请日：2012-08-30
申请人： YI-XIN TU , SONG-LIN TONG , QI-YAN LUO , HAI-QING ZHOU
发明人： YI-XIN TU , SONG-LIN TONG , QI-YAN LUO , HAI-QING ZHOU
IPC分类号： H02P3/00
CPC分类号： G06F3/0202 , E05F15/73 , E05Y2900/606
摘要： An exemplary motor control circuit for controlling a motor includes a motor driving chip, a sensing unit, and a controller. The motor driving chip motor driving chip is electronically connected to the motor. The sensing unit includes a proximity sensor, the proximity sensor detects whether an external object is proximate to the proximity sensor. The controller is electronically connected to the motor driving chip and the sensing unit, the controller controls the motor driving chip to drive the motor to rotate in a first direction when an external object is detected, and controls the motor driving chip to drive the motor to rotate in a second direction reverse to the first direction when no external object is detected for a predetermined period of time.
摘要翻译：用于控制电动机的示例性电动机控制电路包括电动机驱动芯片，感测单元和控制器。马达驱动芯片马达驱动芯片电连接到马达。感测单元包括接近传感器，接近传感器检测外部物体是否靠近接近传感器。控制器电连接到电动机驱动芯片和感测单元，当检测到外部物体时，控制器控制电动机驱动芯片驱动电动机沿第一方向旋转，并且控制电动机驱动芯片以驱动电动机当在预定时间段内没有检测到外部物体时，沿与第一方向相反的第二方向旋转。

10. 发明申请

US20130057324A1 CIRCUIT FOR CLEARING COMPLEMENTARY METAL OXIDE SEMICONDUCTOR INFORMATION 审中-公开
标题翻译：用于清除补充金属氧化物半导体信息的电路
公开(公告)号：US20130057324A1
公开(公告)日：2013-03-07
申请号：US13305127
申请日：2011-11-28
申请人： YI-XIN TU , JIN-LIANG XIONG , HAI-QING ZHOU
发明人： YI-XIN TU , JIN-LIANG XIONG , HAI-QING ZHOU
IPC分类号： H03L7/00
CPC分类号： G11C7/20
摘要： A circuit for clearing complementary metal oxide semiconductor (CMOS) information of a CMOS chip includes a battery, first to fifth resistors, first and second electronic switches, a switching unit, and first and second diodes. The circuit can clear information of the CMOS chip when one or more switches are activated.
摘要翻译：用于清除CMOS芯片的互补金属氧化物半导体（CMOS）信息的电路包括电池，第一至第五电阻器，第一和第二电子开关，开关单元以及第一和第二二极管。当激活一个或多个开关时，电路可以清除CMOS芯片的信息。

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